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Author: Dimitris Gizopoulos
Publisher: Springer Science & Business Media
ISBN: 1402028016
Category : Computers
Languages : en
Pages : 226
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Book Description
Embedded Processor-Based Self-Test is a guide to self-testing strategies for embedded processors. Embedded processors are regularly used today in most System-on-Chips (SoCs). Testing of microprocessors and embedded processors has always been a challenge because most traditional testing techniques fail when applied to them. This is due to the complex sequential structure of processor architectures, which consists of high performance datapath units and sophisticated control logic for performance optimization. Structured Design-for-Testability (DfT) and hardware-based self-testing techniques, which usually have a non-trivial impact on a circuit’s performance, size and power, can not be applied without serious consideration and careful incorporation into the processor design. Embedded Processor-Based Self-Test shows how the powerful embedded functionality that processors offer can be utilized as a self-testing resource. Through a discussion of different strategies the book emphasizes on the emerging area of Software-Based Self-Testing (SBST). SBST is based on the idea of execution of embedded software programs to perform self-testing of the processor itself and its surrounding blocks in the SoC. SBST is a low-cost strategy in terms of overhead (area, speed, power), development effort and test application cost, as it is applied using low-cost, low-speed test equipment. Embedded Processor-Based Self-Test can be used by designers, DfT engineers, test practitioners, researchers and students working on digital testing, and in particular processor and SoC test. This book sets the framework for comparisons among different SBST methodologies by discussing key requirements. It presents successful applications of SBST to a number of embedded processors of different complexities and instruction set architectures.
Author: Dimitris Gizopoulos
Publisher: Springer Science & Business Media
ISBN: 1402028016
Category : Computers
Languages : en
Pages : 226
Get Book Here
Book Description
Embedded Processor-Based Self-Test is a guide to self-testing strategies for embedded processors. Embedded processors are regularly used today in most System-on-Chips (SoCs). Testing of microprocessors and embedded processors has always been a challenge because most traditional testing techniques fail when applied to them. This is due to the complex sequential structure of processor architectures, which consists of high performance datapath units and sophisticated control logic for performance optimization. Structured Design-for-Testability (DfT) and hardware-based self-testing techniques, which usually have a non-trivial impact on a circuit’s performance, size and power, can not be applied without serious consideration and careful incorporation into the processor design. Embedded Processor-Based Self-Test shows how the powerful embedded functionality that processors offer can be utilized as a self-testing resource. Through a discussion of different strategies the book emphasizes on the emerging area of Software-Based Self-Testing (SBST). SBST is based on the idea of execution of embedded software programs to perform self-testing of the processor itself and its surrounding blocks in the SoC. SBST is a low-cost strategy in terms of overhead (area, speed, power), development effort and test application cost, as it is applied using low-cost, low-speed test equipment. Embedded Processor-Based Self-Test can be used by designers, DfT engineers, test practitioners, researchers and students working on digital testing, and in particular processor and SoC test. This book sets the framework for comparisons among different SBST methodologies by discussing key requirements. It presents successful applications of SBST to a number of embedded processors of different complexities and instruction set architectures.
Author: Jari Nurmi
Publisher: Springer Science & Business Media
ISBN: 1402055307
Category : Technology & Engineering
Languages : en
Pages : 534
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Book Description
Here is an extremely useful book that provides insight into a number of different flavors of processor architectures and their design, software tool generation, implementation, and verification. After a brief introduction to processor architectures and how processor designers have sometimes failed to deliver what was expected, the authors introduce a generic flow for embedded on-chip processor design and start to explore the vast design space of on-chip processing. The authors cover a number of different types of processor core.
Author: Flammini, Francesco
Publisher: IGI Global
ISBN: 146661644X
Category : Technology & Engineering
Languages : en
Pages : 487
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Book Description
Human errors, as well as deliberate sabotage, pose a considerable danger to passengers riding on the modern railways and have created disastrous consequences. To protect civilians against both intentional and unintentional threats, rail transportation has become increasingly automated. Railway Safety, Reliability, and Security: Technologies and Systems Engineering provides engineering students and professionals with a collection of state-of-the-art methodological and technological notions to support the development and certification of real-time safety-critical railway control systems, as well as the protection of rail transportation infrastructures.
Author: Krishnendu Chakrabarty
Publisher: Springer Science & Business Media
ISBN: 1475765274
Category : Technology & Engineering
Languages : en
Pages : 202
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Book Description
System-on-a-Chip (SOC) integrated circuits composed of embedded cores are now commonplace. Nevertheless, there remain several roadblocks to rapid and efficient system integration. Test development is seen as a major bottleneck in SOC design and manufacturing capabilities. Testing SOCs is especially challenging in the absence of standardized test structures, test automation tools, and test protocols. In addition, long interconnects, high density, and high-speed designs lead to new types of faults involving crosstalk and signal integrity. SOC (System-on-a-Chip) Testing for Plug and Play Test Automation is an edited work containing thirteen contributions that address various aspects of SOC testing. SOC (System-on-a-Chip) Testing for Plug and Play Test Automation is a valuable reference for researchers and students interested in various aspects of SOC testing.
Author: Prabhat Mishra
Publisher: Elsevier
ISBN: 0080558372
Category : Computers
Languages : en
Pages : 433
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Book Description
Efficient design of embedded processors plays a critical role in embedded systems design. Processor description languages and their associated specification, exploration and rapid prototyping methodologies are used to find the best possible design for a given set of applications under various design constraints, such as area, power and performance. This book is the first, comprehensive survey of modern architecture description languages and will be an invaluable reference for embedded system architects, designers, developers, and validation engineers. Readers will see that the use of particular architecture description languages will lead to productivity gains in designing particular (application-specific) types of embedded processors.* Comprehensive coverage of all modern architecture description languages... use the right ADL to design your processor to fit your application;* Most up-to-date information available about each architecture description language from the developers...save time chasing down reliable documentation;* Describes how each architecture desccription language enables key design automation tasks, such as simulation, synthesis and testing...fit the ADL to your design cycle;
Author: Peng Zhang
Publisher: William Andrew
ISBN: 1437778089
Category : Science
Languages : en
Pages : 866
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Book Description
Control engineering seeks to understand physical systems, using mathematical modeling, in terms of inputs, outputs and various components with different behaviors. It has an essential role in a wide range of control systems, from household appliances to space flight. This book provides an in-depth view of the technologies that are implemented in most varieties of modern industrial control engineering. A solid grounding is provided in traditional control techniques, followed by detailed examination of modern control techniques such as real-time, distributed, robotic, embedded, computer and wireless control technologies. For each technology, the book discusses its full profile, from the field layer and the control layer to the operator layer. It also includes all the interfaces in industrial control systems: between controllers and systems; between different layers; and between operators and systems. It not only describes the details of both real-time operating systems and distributed operating systems, but also provides coverage of the microprocessor boot code, which other books lack. In addition to working principles and operation mechanisms, this book emphasizes the practical issues of components, devices and hardware circuits, giving the specification parameters, install procedures, calibration and configuration methodologies needed for engineers to put the theory into practice. - Documents all the key technologies of a wide range of industrial control systems - Emphasizes practical application and methods alongside theory and principles - An ideal reference for practicing engineers needing to further their understanding of the latest industrial control concepts and techniques
Author: Raimund Ubar
Publisher: IGI Global
ISBN: 1609602145
Category : Computers
Languages : en
Pages : 580
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Book Description
"This book covers aspects of system design and efficient modelling, and also introduces various fault models and fault mechanisms associated with digital circuits integrated into System on Chip (SoC), Multi-Processor System-on Chip (MPSoC) or Network on Chip (NoC)"--
Author: Alex Orailoglu
Publisher: Springer
ISBN: 3319237993
Category : Computers
Languages : en
Pages : 279
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Book Description
This book contains extended and revised versions of the best papers presented at the 21st IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2013, held in Istanbul, Turkey, in October 2013. The 11 papers included in the book were carefully reviewed and selected from the 48 full papers presented at the conference. An extended version of a previously unpublished high-quality paper from VLSI-SoC 2012 is also included. The papers cover a wide range of topics in VLSI technology and advanced research. They address the current trend toward increasing chip integration and technology process advancements bringing about stimulating new challenges both at the physical and system-design levels, as well as in the test of these systems.
Author: Laung-Terng Wang
Publisher: Morgan Kaufmann
ISBN: 0080556809
Category : Technology & Engineering
Languages : en
Pages : 893
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Book Description
Modern electronics testing has a legacy of more than 40 years. The introduction of new technologies, especially nanometer technologies with 90nm or smaller geometry, has allowed the semiconductor industry to keep pace with the increased performance-capacity demands from consumers. As a result, semiconductor test costs have been growing steadily and typically amount to 40% of today's overall product cost. This book is a comprehensive guide to new VLSI Testing and Design-for-Testability techniques that will allow students, researchers, DFT practitioners, and VLSI designers to master quickly System-on-Chip Test architectures, for test debug and diagnosis of digital, memory, and analog/mixed-signal designs. - Emphasizes VLSI Test principles and Design for Testability architectures, with numerous illustrations/examples. - Most up-to-date coverage available, including Fault Tolerance, Low-Power Testing, Defect and Error Tolerance, Network-on-Chip (NOC) Testing, Software-Based Self-Testing, FPGA Testing, MEMS Testing, and System-In-Package (SIP) Testing, which are not yet available in any testing book. - Covers the entire spectrum of VLSI testing and DFT architectures, from digital and analog, to memory circuits, and fault diagnosis and self-repair from digital to memory circuits. - Discusses future nanotechnology test trends and challenges facing the nanometer design era; promising nanotechnology test techniques, including Quantum-Dots, Cellular Automata, Carbon-Nanotubes, and Hybrid Semiconductor/Nanowire/Molecular Computing. - Practical problems at the end of each chapter for students.
Author: Li Chen
Publisher:
ISBN:
Category :
Languages : en
Pages : 376
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Book Description
