Ellipsometric Characterization of Roll-to-roll Vacuum Deposited Thin Films for Flexible Electronics PDF Download
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Author: Elizabeth M. Tiberio
Publisher:
ISBN:
Category : Coatings
Languages : en
Pages : 162
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Book Description
Author: Elizabeth M. Tiberio
Publisher:
ISBN:
Category : Coatings
Languages : en
Pages : 162
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Book Description
Author: James C. Switzer
Publisher:
ISBN: 9781303747441
Category : Electronic apparatus and appliances
Languages : en
Pages : 456
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Book Description
Author: Karsten Hinrichs
Publisher: Springer
ISBN: 3319758950
Category : Science
Languages : en
Pages : 549
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Book Description
This new edition provides a state-of-the-art survey of ellipsometric methods used to study organic films and surfaces, from laboratory to synchrotron applications, with a special focus on in-situ use in processing environments and at solid-liquid interfaces. Thanks to the development of functional organic, meta- and hybrid materials for new optical, electronic, sensing and biotechnological devices, the ellipsometric analysis of optical and material properties has made tremendous strides over the past few years. The second edition has been updated to reflect the latest advances in ellipsometric methods. The new content focuses on the study of anisotropic materials, conjugated polymers, polarons, self-assembled monolayers, industrial membranes, adsorption of proteins, enzymes and RGD-peptides, as well as the correlation of ellipsometric spectra to structure and molecular interactions.
Author: P. Joshi
Publisher: The Electrochemical Society
ISBN: 1566777259
Category : Science
Languages : en
Pages : 63
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Book Description
The papers included in this issue of ECS Transactions were originally presented in the symposium ¿Novel Plasma Techniques for Low Temperature Processing of Thin Films for Flexible Electronics¿, held during the 215th meeting of The Electrochemical Society, in San Francisco, California from May 24 to 29, 2009.
Author: Elio Passaglia
Publisher:
ISBN:
Category : Ellipsometry
Languages : en
Pages : 366
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Book Description
Author: L. Holland
Publisher:
ISBN:
Category : Thin films
Languages : en
Pages : 600
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Book Description
Author: Kangil Seo
Publisher:
ISBN:
Category :
Languages : en
Pages : 114
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Book Description
Author: Maria Losurdo
Publisher: Springer Science & Business Media
ISBN: 3642339565
Category : Technology & Engineering
Languages : en
Pages : 740
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Book Description
This book presents and introduces ellipsometry in nanoscience and nanotechnology making a bridge between the classical and nanoscale optical behaviour of materials. It delineates the role of the non-destructive and non-invasive optical diagnostics of ellipsometry in improving science and technology of nanomaterials and related processes by illustrating its exploitation, ranging from fundamental studies of the physics and chemistry of nanostructures to the ultimate goal of turnkey manufacturing control. This book is written for a broad readership: materials scientists, researchers, engineers, as well as students and nanotechnology operators who want to deepen their knowledge about both basics and applications of ellipsometry to nanoscale phenomena. It starts as a general introduction for people curious to enter the fields of ellipsometry and polarimetry applied to nanomaterials and progresses to articles by experts on specific fields that span from plasmonics, optics, to semiconductors and flexible electronics. The core belief reflected in this book is that ellipsometry applied at the nanoscale offers new ways of addressing many current needs. The book also explores forward-looking potential applications.
Author: Yuh-Juh Juang
Publisher:
ISBN:
Category : Indium compounds
Languages : en
Pages : 160
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Book Description
Author: James Paul Gospodyn
Publisher:
ISBN:
Category : Ellipsometry
Languages : en
Pages : 330
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Book Description
