Electrostatic Lens Systems, 2nd edition PDF Download
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Author: D.W.O. Heddle
Publisher: CRC Press
ISBN: 1420034391
Category : Technology & Engineering
Languages : en
Pages : 264
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Book Description
Electrostatic Lens Systems: Second Edition enables readers to design lens systems for focusing beams of charged particles that have useful characteristics. The book covers the basic theory of the motion of charged particles in electrostatic fields and describes several methods for the calculation of the potential and field distribution for various electrode geometries. It emphasizes the Bessel function expansion method, developed by the author and his students, and the nine-point implementation of the finite difference method. Demonstration programs of other methods can be found via the websites provided. A chapter on aberrations presents formulae that enable the coefficients to be determined by an extension to the ray tracing procedures, demonstrating optimum conditions for lens operation. The book is accompanied by a disk that provides a suite of computer programs (LENSYS for MS-DOS) intended for practical use in the design and analysis of systems using round lenses with apertures or cylindrical elements. These programs are of value even to experienced workers in the field who may be quite familiar with much of the material in the text.
Author: D.W.O. Heddle
Publisher: CRC Press
ISBN: 1420034391
Category : Technology & Engineering
Languages : en
Pages : 264
Get Book Here
Book Description
Electrostatic Lens Systems: Second Edition enables readers to design lens systems for focusing beams of charged particles that have useful characteristics. The book covers the basic theory of the motion of charged particles in electrostatic fields and describes several methods for the calculation of the potential and field distribution for various electrode geometries. It emphasizes the Bessel function expansion method, developed by the author and his students, and the nine-point implementation of the finite difference method. Demonstration programs of other methods can be found via the websites provided. A chapter on aberrations presents formulae that enable the coefficients to be determined by an extension to the ray tracing procedures, demonstrating optimum conditions for lens operation. The book is accompanied by a disk that provides a suite of computer programs (LENSYS for MS-DOS) intended for practical use in the design and analysis of systems using round lenses with apertures or cylindrical elements. These programs are of value even to experienced workers in the field who may be quite familiar with much of the material in the text.
Author: D.W.O. Heddle
Publisher:
ISBN:
Category : Science
Languages : en
Pages : 120
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Book Description
The use of electrostatic lenses for the control of ion and electron beams has grown considerably in recent years. In addition, innovations in the production of low energy positrons have opened a whole new field of research for which electrostatic lenses are required. Electrostatic Lens Systems is therefore a timely treatise on the practical aspects of lens system design. The text gives a clear and concise treatment of the motion of charged particles in electrostatic fields and describes several methods of calculating the potential and field distributions for various electrode geometries. Electrostatic Lens Systems is also intended to be an interactive tutor on the practical design and analysis of systems using round lenses (both apertures and cylinders) through a unique suite of programs (provided on IBM compatible disc). Combined with an emphasis on the Bessel function expansion method and a thorough description of the well known relaxation methods, this volume will be a significant reference work and learning tool for experienced workers and new researchers alike. If you need to use electrostatic lenses then you need to read Electrostatic Lens Systems.
Author: Helmut Liebl
Publisher: Springer Science & Business Media
ISBN: 3540719253
Category : Science
Languages : en
Pages : 131
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Book Description
Written by a pioneer in the field, this overview of charged particle optics provides a solid introduction to the subject area for all physicists wishing to design their own apparatus or better understand the instruments with which they work. It begins by introducing electrostatic lenses and fields used for acceleration, focusing and deflection of ions or electrons. Subsequent chapters give detailed descriptions of electrostatic deflection elements, uniform and non-uniform magnetic sector fields, image aberrations, and, finally, fringe field confinement.
Author: Albert Septier
Publisher: Elsevier
ISBN: 0323148468
Category : Science
Languages : en
Pages : 487
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Book Description
Focusing of Charged Particles, Volume II presents the aspects of particle optics, including the electron, the ion optical domains, and the accelerator field. This book provides a detailed analysis of the principles of the laws of propagation of beams. Comprised of three parts encompassing three chapters, this volume starts with an overview of how a beam of charged particles traverses a region that is at a uniform, constant, electrostatic potential. This book then discusses the principle of charge repulsion effect by which the space charge of the beam modifies the potential in the region that it traverses. Other chapters examine the general design techniques and performances obtainable for electron guns applicable for use in initiating a beam for linear beam tubes that is given in a condensed form. The last chapter deals with the two stable charged particles that can be accelerated, namely, protons and electrons. This book is a valuable resource to physicists, accelerator experts, and experimenters in search of interactions in the detector target.
Author: Peter W. Hawkes
Publisher: Academic Press
ISBN: 0080984169
Category : Science
Languages : en
Pages : 755
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Book Description
The three volumes in the PRINCIPLES OF ELECTRON OPTICS Series constitute the first comprehensive treatment of electron optics in over forty years. While Volumes 1 and 2 are devoted to geometrical optics, Volume 3 is concerned with wave optics and effects due to wave length. Subjects covered include:Derivation of the laws of electron propagation from SchrUdinger's equationImage formation and the notion of resolutionThe interaction between specimens and electronsImage processingElectron holography and interferenceCoherence, brightness, and the spectral functionTogether, these works comprise a unique and informative treatment of the subject. Volume 3, like its predecessors, will provide readers with both a textbook and an invaluable reference source.
Author: Jon Orloff
Publisher: CRC Press
ISBN: 1420045555
Category : Science
Languages : en
Pages : 666
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Book Description
With the growing proliferation of nanotechnologies, powerful imaging technologies are being developed to operate at the sub-nanometer scale. The newest edition of a bestseller, the Handbook of Charged Particle Optics, Second Edition provides essential background information for the design and operation of high resolution focused probe instruments. The book’s unique approach covers both the theoretical and practical knowledge of high resolution probe forming instruments. The second edition features new chapters on aberration correction and applications of gas phase field ionization sources. With the inclusion of additional references to past and present work in the field, this second edition offers perfectly calibrated coverage of the field’s cutting-edge technologies with added insight into how they work. Written by the leading research scientists, the second edition of the Handbook of Charged Particle Optics is a complete guide to understanding, designing, and using high resolution probe instrumentation.
Author: Pierre Grivet
Publisher:
ISBN:
Category : Electron optics
Languages : en
Pages : 870
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Book Description
Author: Jon Orloff
Publisher: CRC Press
ISBN: 1351835777
Category : Science
Languages : en
Pages : 938
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Book Description
With the growing proliferation of nanotechnologies, powerful imaging technologies are being developed to operate at the sub-nanometer scale. The newest edition of a bestseller, the Handbook of Charged Particle Optics, Second Edition provides essential background information for the design and operation of high resolution focused probe instruments. The book’s unique approach covers both the theoretical and practical knowledge of high resolution probe forming instruments. The second edition features new chapters on aberration correction and applications of gas phase field ionization sources. With the inclusion of additional references to past and present work in the field, this second edition offers perfectly calibrated coverage of the field’s cutting-edge technologies with added insight into how they work. Written by the leading research scientists, the second edition of the Handbook of Charged Particle Optics is a complete guide to understanding, designing, and using high resolution probe instrumentation.
Author: Miklos Szilagyi
Publisher: Springer Science & Business Media
ISBN: 1461309239
Category : Technology & Engineering
Languages : en
Pages : 550
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Book Description
The field of electron and ion optics is based on the analogy between geometrical light optics and the motion of charged particles in electromagnetic fields. The spectacular development of the electron microscope clearly shows the possibilities of image formation by charged particles of wavelength much shorter than that of visible light. As new applications such as particle accelerators, cathode ray tubes, mass and energy spectrometers, microwave tubes, scanning-type analytical instruments, heavy beam technologies, etc. emerged, the scope of particle beam optics has been exten ded to the formation of fine probes. The goal is to concentrate as many particles as possible in as small a volume as possible. Fabrication of microcircuits is a good example of the growing importance of this field. The current trend is towards increased circuit complexity and pattern density. Because of the diffraction limitation of processes using optical photons and the technological difficulties connected with x-ray processes, charged particle beams are becoming popular. With them it is possible to write directly on a wafer under computer control, without using a mask. Focused ion beams offer especially great possibilities in the submicron region. Therefore, electron and ion beam technologies will most probably playa very important role in the next twenty years or so.
Author: Hermann Wollnik
Publisher: Academic Press
ISBN: 012821466X
Category : Science
Languages : en
Pages : 319
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Book Description
Optics of Charged Particles, 2nd edition, describes how charged particles move in the fields of magnetic and electrostatic dipoles, quadrupoles, higher order multipoles, and field-free regions. Since the first edition, published over 30 years ago, new technologies have emerged and have been used for new ion optical instruments like, for instance, time-of-flight mass analyzers, which are described now. Fully updated and revised, this new edition provides ways to design mass separators, spectrographs, and spectrometers, which are the key tools in organic chemistry and for drug developments, in environmental trace analyses and for investigations in nuclear physics like the search for super heavy elements as well as molecules in space science. The book discusses individual particle trajectories as well as particle beams in space and in phase-space, and it provides guidelines for the design of particle optical instruments. For experienced researchers, working in the field, it highlights the latest developments in new ion optical instruments and provides guidelines and examples for the design of new instruments for the transport of beams of charged particles and the mass/charge or energy/charge analyses of ions. Furthermore, it provides background knowledge required to accurately understand and analyze results, when developing ion-optical instruments. By providing a comprehensive overview of the field of charged particle optics, this edition of the book supports all those working, directly or indirectly, with charged-particle research or the development of ion- and electron-analyzing instruments. Provides enhanced, clear descriptions, and derivations making complex aspects of the general motion of charged particles understandable as well as features of charged particle analyzing instruments Assists the reader in applying insights obtained from the principles of charged particle optics to the design of new transporting and mass- or energy-analyzing instruments for ions Discusses new applications and newly occurring issues, which have arisen since the first edition
