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Author: Nobuo Tanaka
Publisher: Springer
ISBN: 4431565027
Category : Technology & Engineering
Languages : en
Pages : 340
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Book Description
In this book, the bases of imaging and diffraction in transmission electron microscopy (TEM) and scanning transmission electron microscopy (STEM) are explained in the style of a textbook. The book focuses on the explanation of electron microscopic imaging of TEM and STEM without including in the main text distracting information on basic knowledge of crystal diffraction, wave optics, electron lens, and scattering and diffraction theories, which are explained separately in the appendices. A comprehensive explanation is provided on the basis of Fourier transform theory, and this approach is unique in comparison with other advanced resources on high-resolution electron microscopy. With the present textbook, readers are led to understand the essence of the imaging theories of TEM and STEM without being diverted by other knowledge of electron microscopy. The up-to-date information in this book, particularly on imaging details of STEM and aberration corrections, is valuable worldwide for today’s graduate students and professionals just starting their careers.
Author: Nobuo Tanaka
Publisher: Springer
ISBN: 4431565027
Category : Technology & Engineering
Languages : en
Pages : 340
Get Book Here
Book Description
In this book, the bases of imaging and diffraction in transmission electron microscopy (TEM) and scanning transmission electron microscopy (STEM) are explained in the style of a textbook. The book focuses on the explanation of electron microscopic imaging of TEM and STEM without including in the main text distracting information on basic knowledge of crystal diffraction, wave optics, electron lens, and scattering and diffraction theories, which are explained separately in the appendices. A comprehensive explanation is provided on the basis of Fourier transform theory, and this approach is unique in comparison with other advanced resources on high-resolution electron microscopy. With the present textbook, readers are led to understand the essence of the imaging theories of TEM and STEM without being diverted by other knowledge of electron microscopy. The up-to-date information in this book, particularly on imaging details of STEM and aberration corrections, is valuable worldwide for today’s graduate students and professionals just starting their careers.
Author: Alioscka A. Sousa
Publisher: Humana Press
ISBN: 9781627031363
Category : Medical
Languages : en
Pages : 0
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Book Description
For more than a century, microscopy has been a centerpiece of extraordinary discoveries in biology. Along the way, remarkable imaging tools have been developed allowing scientists to dissect the complexity of cellular processes at the nano length molecular scales. Nanoimaging: Methods and Protocols presents a diverse collection of microscopy techniques and methodologies that provides guidance to successfully image cellular molecular complexes at nanometer spatial resolution. The book's four parts cover: (1) light microscopy techniques with a special emphasis on methods that go beyond the classic diffraction-limited imaging; (2) electron microscopy techniques for high-resolution imaging of molecules, cells and tissues, in both two and three dimensions; (3) scanning probe microscopy techniques for imaging and probing macromolecular complexes and membrane surface topography; and (4) complementary techniques on correlative microscopy, soft x-ray tomography and secondary ion mass spectrometry imaging. Written in the successful format of the Methods in Molecular BiologyTM series, chapters include introductions to their respective topics, lists of the necessary materials and reagents, step-by-step protocols, and notes on troubleshooting and avoiding known pitfalls. Authoritative and accessible, Nanoimaging: Methods and Protocols highlights many of the most exciting possibilities in microscopy for the investigation of biological structures at the nano length molecular scales.
Author: Frances M. Ross
Publisher: Cambridge University Press
ISBN: 1107116570
Category : Science
Languages : en
Pages : 529
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Book Description
2.6.2 Electrodes for Electrochemistry
Author: Weilie Zhou
Publisher: Springer Science & Business Media
ISBN: 0387396209
Category : Technology & Engineering
Languages : en
Pages : 533
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Book Description
This book presents scanning electron microscopy (SEM) fundamentals and applications for nanotechnology. It includes integrated fabrication techniques using the SEM, such as e-beam and FIB, and it covers in-situ nanomanipulation of materials. The book is written by international experts from the top nano-research groups that specialize in nanomaterials characterization. The book will appeal to nanomaterials researchers, and to SEM development specialists.
Author: V Stolojan
Publisher: Myprint
ISBN: 9781681748115
Category :
Languages : en
Pages : 70
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Book Description
Author: Nan Yao
Publisher: Springer Science & Business Media
ISBN: 1402080069
Category : Technology & Engineering
Languages : en
Pages : 745
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Book Description
Nanostructured materials take on an enormously rich variety of properties and promise exciting new advances in micromechanical, electronic, and magnetic devices as well as in molecular fabrications. The structure-composition-processing-property relationships for these sub 100 nm-sized materials can only be understood by employing an array of modern microscopy and microanalysis tools. Handbook of Microscopy for Nanotechnology aims to provide an overview of the basics and applications of various microscopy techniques for nanotechnology. This handbook highlights various key microcopic techniques and their applications in this fast-growing field. Topics to be covered include the following: scanning near field optical microscopy, confocal optical microscopy, atomic force microscopy, magnetic force microscopy, scanning turning microscopy, high-resolution scanning electron microscopy, orientational imaging microscopy, high-resolution transmission electron microscopy, scanning transmission electron microscopy, environmental transmission electron microscopy, quantitative electron diffraction, Lorentz microscopy, electron holography, 3-D transmission electron microscopy, high-spatial resolution quantitative microanalysis, electron-energy-loss spectroscopy and spectral imaging, focused ion beam, secondary ion microscopy, and field ion microscopy.
Author: Beth A. Goins
Publisher: CRC Press
ISBN: 9814267090
Category : Science
Languages : en
Pages : 308
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Book Description
The first resource of its kind, this book covers cutting-edge research on the use of nanoparticles for in vivo diagnostic medical imaging and therapy. It discusses a variety of nanoparticles, including quantum dots, carbon nanotubes, dendrimers, gold nanoshells, metal nanorods, micelles, liposomes, polymers, MRI iron oxide particles, and microbubbles. Examples in the book include multifunctional nanoparticles that designed for multimodality imaging and simultaneous diagnostic and therapy (theranostic) applications.
Author: Thomas Muller-Reichert
Publisher: Academic Press
ISBN: 0124160263
Category : Science
Languages : en
Pages : 466
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Book Description
The combination of electron microscopy with transmitted light microscopy (termed correlative light and electron microscopy; CLEM) has been employed for decades to generate molecular identification that can be visualized by a dark, electron-dense precipitate. This new volume of Methods in Cell Biology covers many areas of CLEM, including a brief history and overview on CLEM methods, imaging of intermediate stages of meiotic spindle assembly in C. elegans embryos using CLEM, and capturing endocytic segregation events with HPF-CLEM. Covers many areas of CLEM by the best international scientists in the field Includes a brief history and overview on CLEM methods
Author: Florian Banhart
Publisher: World Scientific
ISBN: 9812797335
Category : Science
Languages : en
Pages : 318
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Book Description
In-situ high-resolution electron microscopy is a modern and powerful technique in materials research, physics, and chemistry. In-situ techniques are hardly treated in textbooks of electron microscopy. Thus, there is a need to collect the present knowledge about the techniques and achievements of in-situ electron microscopy in one book. Since high-resolution electron microscopes are available in most modern laboratories of materials science, more and more scientists or students are starting to work on this subject.In this comprehensive volume, the most important techniques and achievements of in-situ high-resolution electron microscopy will be reviewed by renowned experts. Applications in several fields of materials science will also be demonstrated.
Author: Ahmed H. Zewail
Publisher: World Scientific
ISBN: 1848163908
Category : Science
Languages : en
Pages : 359
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Book Description
Structural phase transitions, mechanical deformations, and the embryonic stages of melting and crystallization are examples of phenomena that can now be imaged in unprecedented structural detail with high spatial resolution, and ten orders of magnitude as fast as hitherto. No monograph in existence attempts to cover the revolutionary dimensions that EM in its various modes of operation nowadays makes possible. The authors of this book chart these developments, and also compare the merits of coherent electron waves with those of synchrotron radiation. They judge it prudent to recall some important basic procedural and theoretical aspects of imaging and diffraction so that the reader may better comprehend the significance of the new vistas and applications now afoot. This book is not a vade mecum - numerous other texts are available for the practitioner for that purpose.
