Electron Diffraction Studies of the Structure of Grain Boundaries PDF Download
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Author: Philip A. Lamarre
Publisher:
ISBN:
Category : Diffraction
Languages : en
Pages : 314
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Book Description
Author: Philip A. Lamarre
Publisher:
ISBN:
Category : Diffraction
Languages : en
Pages : 314
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Author: John David Budai
Publisher:
ISBN:
Category : Grain boundaries
Languages : en
Pages : 460
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Author:
Publisher:
ISBN:
Category :
Languages : en
Pages :
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The diffraction effects expected from the periodic structure of twist boundaries in Si were determined by an examination of the reciprocal lattice of these boundaries. Methods of analysis were developed to distinguish between the real diffraction spots due to the periodic boundary structure and those due to double diffraction effects. The electron microscope images for the boundaries studied in Si bicrystals frequently were complex and contained Moire fringes which provided no information on the actual boundary structure. By analyzing the electron diffraction patterns from these boundaries for the presence of new diffraction spots it was possible to show that all the .sigma.1 (001), .sigma.1 (111), and .sigma.3 (111) twist boundaries examined have a periodic structure.
Author: Mohamed Hassan Ibrahim El-Eraki
Publisher:
ISBN:
Category :
Languages : en
Pages :
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Author: Der-yang Guan
Publisher:
ISBN:
Category : Dislocations in crystals
Languages : en
Pages : 250
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Author:
Publisher:
ISBN:
Category :
Languages : en
Pages :
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Electron diffraction and microscopy studies supplemented by electron spectroscopic techniques such as Auger electron spectroscopy and energy dispersive x-ray spectroscopy were used to characterize the nature of grain boundary segregation in commercial grade (Mn, Zn)Fe2O4 samples containing small quantities of CaO. Chemical analyses by AES and EDAX show an enrichment of Ca near the grain boundary region. Convergent beam electron diffraction experiments show that the crystal symmetry of the spinel structure is distorted in the vicinity of the grain boundary. In-situ heating experiments in HVEM show the existence of a disordered phase at the sintering temperature. Lorentz microscopy in TEM shows the interaction of magnetic domain wall motion with grain boundaries. These chemical and structural features are correlated with electrical resistivity and magnetic permeability of the ferrites. 4 figures.
Author: Keith Raymond Milkove
Publisher:
ISBN:
Category : Grain boundaries
Languages : en
Pages : 934
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Author: Adrian P. Sutton
Publisher:
ISBN:
Category : Grain boundaries
Languages : en
Pages : 234
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Author: P. E. J. Flewitt
Publisher: Wiley
ISBN: 9780471979517
Category : Technology & Engineering
Languages : en
Pages : 0
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Book Description
Over recent years the understanding of grain boundaries, interphase boundaries and free surfaces has advanced greatly, leading to a clear recognition that these discontinuities make a significant contribution to the physical and mechanical properties of materials from multiphase metals and alloys to electronic materials. Grain Boundaries -Their Microstructure and Chemistry discusses the interrelationship between microstructure and chemistry of the grain boundary, with particular emphasis on the influence of the environment (air, liquid and liquid metal) and composition (bulk and impurity). This highly practical volume presents a brief background to interphase and grain boundaries, before considering in detail grain boundary composition and composition changes, and how grain boundary composition affects material properties. Very recent advances in techniques such as electron energy loss spectroscopy, high-resolution transmission electron microscopy and atom probe, and the facinating new insights into grain boundary, microstructure that they have revealed, are also discussed. Grain Boundaries - Their Microstructure and Chemistry is an indispensable text for design and safety engineers in many industries, including power and aerospace, as well as for materials scientists and engineers in academia and research institutes.
Author: Adam J. Schwartz
Publisher: Springer Science & Business Media
ISBN: 1475732058
Category : Technology & Engineering
Languages : en
Pages : 352
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Book Description
Crystallographic texture or preferred orientation has long been known to strongly influence material properties. Historically, the means of obtaining such texture data has been though the use of x-ray or neutron diffraction for bulk texture measurements, or transmission electron microscopy or electron channeling for local crystallographic information. In recent years, we have seen the emergence of a new characterization technique for probing the microtexture of materials. This advance has come about primarily through the automated indexing of electron backscatter diffraction (EBSD) patterns. The first commercially available system was introduced in 1994, and since then of sales worldwide has been dramatic. This has accompanied widening the growth applicability in materials scienceproblems such as microtexture, phase identification, grain boundary character distribution, deformation microstructures, etc. and is evidence that this technique can, in some cases, replace more time-consuming transmission electron microscope (TEM) or x-ray diffraction investigations. The benefits lie in the fact that the spatial resolution on new field emission scanning electron microscopes (SEM) can approach 50 nm, but spatial extent can be as large a centimeter or greater with a computer controlled stage and montagingofthe images. Additional benefits include the relative ease and low costofattaching EBSD hardware to new or existing SEMs. Electron backscatter diffraction is also known as backscatter Kikuchi diffraction (BKD), or electron backscatter pattern technique (EBSP). Commercial names for the automation include Orientation Imaging Microscopy (OIMTM) and Automated Crystal Orientation Mapping (ACOM).
