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Author: Kiyofumi Tanaka
Publisher: BoD – Books on Demand
ISBN: 9535101676
Category : Computers
Languages : en
Pages : 444
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Book Description
Nowadays, embedded systems - the computer systems that are embedded in various kinds of devices and play an important role of specific control functions, have permitted various aspects of industry. Therefore, we can hardly discuss our life and society from now onwards without referring to embedded systems. For wide-ranging embedded systems to continue their growth, a number of high-quality fundamental and applied researches are indispensable. This book contains 19 excellent chapters and addresses a wide spectrum of research topics on embedded systems, including basic researches, theoretical studies, and practical work. Embedded systems can be made only after fusing miscellaneous technologies together. Various technologies condensed in this book will be helpful to researchers and engineers around the world.
Author: Kiyofumi Tanaka
Publisher: BoD – Books on Demand
ISBN: 9535101676
Category : Computers
Languages : en
Pages : 444
Get Book Here
Book Description
Nowadays, embedded systems - the computer systems that are embedded in various kinds of devices and play an important role of specific control functions, have permitted various aspects of industry. Therefore, we can hardly discuss our life and society from now onwards without referring to embedded systems. For wide-ranging embedded systems to continue their growth, a number of high-quality fundamental and applied researches are indispensable. This book contains 19 excellent chapters and addresses a wide spectrum of research topics on embedded systems, including basic researches, theoretical studies, and practical work. Embedded systems can be made only after fusing miscellaneous technologies together. Various technologies condensed in this book will be helpful to researchers and engineers around the world.
Author: Zheng Wang
Publisher: Springer
ISBN: 9811010730
Category : Technology & Engineering
Languages : en
Pages : 210
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Book Description
This book introduces a novel framework for accurately modeling the errors in nanoscale CMOS technology and developing a smooth tool flow at high-level design abstractions to estimate and mitigate the effects of errors. The book presents novel techniques for high-level fault simulation and reliability estimation as well as architecture-level and system-level fault tolerant designs. It also presents a survey of state-of-the-art problems and solutions, offering insights into reliability issues in digital design and their cross-layer countermeasures.
Author: Srivathsan Krishnamohan
Publisher:
ISBN:
Category : Logic circuits
Languages : en
Pages : 282
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Book Description
Author: Zahir Tari
Publisher: Springer Nature
ISBN: 9819708621
Category :
Languages : en
Pages : 375
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Book Description
Author: Eishi H. Ibe
Publisher: John Wiley & Sons
ISBN: 1118479297
Category : Technology & Engineering
Languages : en
Pages : 292
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Book Description
This book provides the reader with knowledge on a wide variety of radiation fields and their effects on the electronic devices and systems. The author covers faults and failures in ULSI devices induced by a wide variety of radiation fields, including electrons, alpha-rays, muons, gamma rays, neutrons and heavy ions. Readers will learn how to make numerical models from physical insights, to determine the kind of mathematical approaches that should be implemented to analyze radiation effects. A wide variety of prediction, detection, characterization and mitigation techniques against soft-errors are reviewed and discussed. The author shows how to model sophisticated radiation effects in condensed matter in order to quantify and control them, and explains how electronic systems including servers and routers are shut down due to environmental radiation. Provides an understanding of how electronic systems are shut down due to environmental radiation by constructing physical models and numerical algorithms Covers both terrestrial and avionic-level conditions Logically presented with each chapter explaining the background physics to the topic followed by various modelling techniques, and chapter summary Written by a widely-recognized authority in soft-errors in electronic devices Code samples available for download from the Companion Website This book is targeted at researchers and graduate students in nuclear and space radiation, semiconductor physics and electron devices, as well as other areas of applied physics modelling. Researchers and students interested in how a variety of physical phenomena can be modelled and numerically treated will also find this book to present helpful methods.
Author: Geancarlo Abich
Publisher: Springer Nature
ISBN: 3031185994
Category : Technology & Engineering
Languages : en
Pages : 143
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Book Description
This book describes an extensive and consistent soft error assessment of convolutional neural network (CNN) models from different domains through more than 14.8 million fault injections, considering different precision bit-width configurations, optimization parameters, and processor models. The authors also evaluate the relative performance, memory utilization, and soft error reliability trade-offs analysis of different CNN models considering a compiler-based technique w.r.t. traditional redundancy approaches.
Author: Christian Hochberger
Publisher: Springer Nature
ISBN: 3030816826
Category : Computers
Languages : en
Pages : 229
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Book Description
This book constitutes the proceedings of the 34th International Conference on Architecture of Computing Systems, ARCS 2021, held virtually in July 2021. The 12 full papers in this volume were carefully reviewed and selected from 24 submissions. 2 workshop papers (VEFRE) are also included. ARCS has always been a conference attracting leading-edge research outcomes in Computer Architecture and Operating Systems, including a wide spectrum of topics ranging from fully integrated, self-powered embedded systems up to high-performance computing systems. It also provides a platform covering newly emerging and cross-cutting topics, such as autonomous and ubiquitous systems, reconfigurable computing and acceleration, neural networks and artificial intelligence. The selected papers cover a variety of topics from the ARCS core domains, including heterogeneous computing, memory optimizations, and organic computing.
Author: Jörg Henkel
Publisher: Springer Nature
ISBN: 303052017X
Category : Technology & Engineering
Languages : en
Pages : 606
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Book Description
This Open Access book introduces readers to many new techniques for enhancing and optimizing reliability in embedded systems, which have emerged particularly within the last five years. This book introduces the most prominent reliability concerns from today’s points of view and roughly recapitulates the progress in the community so far. Unlike other books that focus on a single abstraction level such circuit level or system level alone, the focus of this book is to deal with the different reliability challenges across different levels starting from the physical level all the way to the system level (cross-layer approaches). The book aims at demonstrating how new hardware/software co-design solution can be proposed to ef-fectively mitigate reliability degradation such as transistor aging, processor variation, temperature effects, soft errors, etc. Provides readers with latest insights into novel, cross-layer methods and models with respect to dependability of embedded systems; Describes cross-layer approaches that can leverage reliability through techniques that are pro-actively designed with respect to techniques at other layers; Explains run-time adaptation and concepts/means of self-organization, in order to achieve error resiliency in complex, future many core systems.
Author: IEEE Staff
Publisher:
ISBN:
Category : Electronic data processing
Languages : en
Pages : 704
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Book Description
Author: Roman Wyrzykowski
Publisher: Springer
ISBN: 3319321498
Category : Computers
Languages : en
Pages : 622
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Book Description
This two-volume set LNCS 9573 and LNCS 9574 constitutes the refereed proceedings of the 11th International Conference of Parallel Processing and Applied Mathematics, PPAM 2015, held in Krakow, Poland, in September 2015.The 111 revised full papers presented in both volumes were carefully reviewed and selected from 196 submissions. The focus of PPAM 2015 was on models, algorithms, and software tools which facilitate efficient and convenient utilization of modern parallel and distributed computing architectures, as well as on large-scale applications, including big data problems.
