Distribution Theory for Tests Based on the Sample Distribution Function PDF Download
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Author: J. Durbin
Publisher: SIAM
ISBN: 9781611970586
Category : Mathematics
Languages : en
Pages : 70
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Book Description
Presents a coherent body of theory for the derivation of the sampling distributions of a wide range of test statistics. Emphasis is on the development of practical techniques. A unified treatment of the theory was attempted, e.g., the author sought to relate the derivations for tests on the circle and the two-sample problem to the basic theory for the one-sample problem on the line. The Markovian nature of the sample distribution function is stressed, as it accounts for the elegance of many of the results achieved, as well as the close relation with parts of the theory of stochastic processes.
Author: J. Durbin
Publisher: SIAM
ISBN: 9781611970586
Category : Mathematics
Languages : en
Pages : 70
Get Book Here
Book Description
Presents a coherent body of theory for the derivation of the sampling distributions of a wide range of test statistics. Emphasis is on the development of practical techniques. A unified treatment of the theory was attempted, e.g., the author sought to relate the derivations for tests on the circle and the two-sample problem to the basic theory for the one-sample problem on the line. The Markovian nature of the sample distribution function is stressed, as it accounts for the elegance of many of the results achieved, as well as the close relation with parts of the theory of stochastic processes.
Author: R. R. Bahadur
Publisher: SIAM
ISBN: 0898711754
Category : Mathematics
Languages : en
Pages : 48
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Book Description
A discussion of topics in the theory of large deviations and of aspects of estimation and testing in large samples.
Author: Alexander Holmes
Publisher:
ISBN:
Category : Business & Economics
Languages : en
Pages : 1801
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Book Description
Introductory Business Statistics 2e aligns with the topics and objectives of the typical one-semester statistics course for business, economics, and related majors. The text provides detailed and supportive explanations and extensive step-by-step walkthroughs. The author places a significant emphasis on the development and practical application of formulas so that students have a deeper understanding of their interpretation and application of data. Problems and exercises are largely centered on business topics, though other applications are provided in order to increase relevance and showcase the critical role of statistics in a number of fields and real-world contexts. The second edition retains the organization of the original text. Based on extensive feedback from adopters and students, the revision focused on improving currency and relevance, particularly in examples and problems. This is an adaptation of Introductory Business Statistics 2e by OpenStax. You can access the textbook as pdf for free at openstax.org. Minor editorial changes were made to ensure a better ebook reading experience. Textbook content produced by OpenStax is licensed under a Creative Commons Attribution 4.0 International License.
Author: Ibrahim (Abe) M. Elfadel
Publisher: Springer
ISBN: 3030046664
Category : Technology & Engineering
Languages : en
Pages : 697
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Book Description
This book provides readers with an up-to-date account of the use of machine learning frameworks, methodologies, algorithms and techniques in the context of computer-aided design (CAD) for very-large-scale integrated circuits (VLSI). Coverage includes the various machine learning methods used in lithography, physical design, yield prediction, post-silicon performance analysis, reliability and failure analysis, power and thermal analysis, analog design, logic synthesis, verification, and neuromorphic design. Provides up-to-date information on machine learning in VLSI CAD for device modeling, layout verifications, yield prediction, post-silicon validation, and reliability; Discusses the use of machine learning techniques in the context of analog and digital synthesis; Demonstrates how to formulate VLSI CAD objectives as machine learning problems and provides a comprehensive treatment of their efficient solutions; Discusses the tradeoff between the cost of collecting data and prediction accuracy and provides a methodology for using prior data to reduce cost of data collection in the design, testing and validation of both analog and digital VLSI designs. From the Foreword As the semiconductor industry embraces the rising swell of cognitive systems and edge intelligence, this book could serve as a harbinger and example of the osmosis that will exist between our cognitive structures and methods, on the one hand, and the hardware architectures and technologies that will support them, on the other....As we transition from the computing era to the cognitive one, it behooves us to remember the success story of VLSI CAD and to earnestly seek the help of the invisible hand so that our future cognitive systems are used to design more powerful cognitive systems. This book is very much aligned with this on-going transition from computing to cognition, and it is with deep pleasure that I recommend it to all those who are actively engaged in this exciting transformation. Dr. Ruchir Puri, IBM Fellow, IBM Watson CTO & Chief Architect, IBM T. J. Watson Research Center
Author: Vincent Couallier
Publisher: John Wiley & Sons
ISBN: 184821619X
Category : Mathematics
Languages : en
Pages : 437
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Book Description
Statistical Models and Methods for Reliability and Survival Analysis brings together contributions by specialists in statistical theory as they discuss their applications providing up-to-date developments in methods used in survival analysis, statistical goodness of fit, stochastic processes for system reliability, amongst others. Many of these are related to the work of Professor M. Nikulin in statistics over the past 30 years. The authors gather together various contributions with a broad array of techniques and results, divided into three parts - Statistical Models and Methods, Statistical Models and Methods in Survival Analysis, and Reliability and Maintenance. The book is intended for researchers interested in statistical methodology and models useful in survival analysis, system reliability and statistical testing for censored and non-censored data.
Author:
Publisher: John Wiley & Sons
ISBN: 0471743844
Category : Mathematics
Languages : en
Pages : 706
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Book Description
ENCYCLOPEDIA OF STATISTICAL SCIENCES
Author: Miklos Csorgo
Publisher: SIAM
ISBN: 0898711851
Category : Mathematics
Languages : en
Pages : 164
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Book Description
Provides a comprehensive theory of the approximations of quantile processes as well as some of their statistical applications.
Author: P. Gänssler
Publisher: Springer
ISBN: 3540375155
Category : Mathematics
Languages : en
Pages : 156
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Book Description
Author: Charles Taillie
Publisher: Springer Science & Business Media
ISBN: 9400985525
Category : Mathematics
Languages : en
Pages : 450
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Book Description
Proceedings of the NATO Advanced Study Institute, Trieste, Italy, July 10-August 1, 1980
Author: D. V. Lindley
Publisher: Cambridge University Press
ISBN: 9780521484855
Category : Mathematics
Languages : en
Pages : 100
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Book Description
This second edition has all the tables required for elementary statistical methods in the social, business and natural sciences.
