Digital Systems Validation Handbook, Volume 3. Design, Test, and Certification Issues for Complex Integrated Circuits - PDF Download
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Author:
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ISBN:
Category :
Languages : en
Pages : 65
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Book Description
This chapter provides an overview of complex integrated circuit technology, focusing particularly upon application specific integrated circuits. This report is intended to assist FAA certification engineers in making safety assessments of new technologies. It examines complex integrated circuit technology, focusing on three fields: design, test, and certification. It provides the reader with the background and a basic understanding of the fundamentals of these fields. Also included is material on the development environment, including languages and tools. Application specific integrated circuits are widely used in Boeing 777 fly-by-wire aircraft. Safety issues abound for these integrated circuits when they are used in safety-critical applications. Since control laws are now executed in silicon and transmitted from one integrated circuit to another, reliability issues for these integrated circuits take on a new importance. This report identifies certification risks relating to the use of complex integrated circuits in fly-by-wire applications.
Author:
Publisher:
ISBN:
Category :
Languages : en
Pages : 65
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Book Description
This chapter provides an overview of complex integrated circuit technology, focusing particularly upon application specific integrated circuits. This report is intended to assist FAA certification engineers in making safety assessments of new technologies. It examines complex integrated circuit technology, focusing on three fields: design, test, and certification. It provides the reader with the background and a basic understanding of the fundamentals of these fields. Also included is material on the development environment, including languages and tools. Application specific integrated circuits are widely used in Boeing 777 fly-by-wire aircraft. Safety issues abound for these integrated circuits when they are used in safety-critical applications. Since control laws are now executed in silicon and transmitted from one integrated circuit to another, reliability issues for these integrated circuits take on a new importance. This report identifies certification risks relating to the use of complex integrated circuits in fly-by-wire applications.
Author: L. Harrison
Publisher:
ISBN:
Category : Air traffic control
Languages : en
Pages : 70
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Book Description
Author: L. Harrison
Publisher:
ISBN:
Category : Airplanes
Languages : en
Pages : 200
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Book Description
Author: Joan Janowitz
Publisher:
ISBN:
Category : Air traffic control
Languages : en
Pages : 20
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Book Description
Author: Vasilis F. Pavlidis
Publisher: Newnes
ISBN: 0124104843
Category : Technology & Engineering
Languages : en
Pages : 770
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Book Description
Three-Dimensional Integrated Circuit Design, Second Eition, expands the original with more than twice as much new content, adding the latest developments in circuit models, temperature considerations, power management, memory issues, and heterogeneous integration. 3-D IC experts Pavlidis, Savidis, and Friedman cover the full product development cycle throughout the book, emphasizing not only physical design, but also algorithms and system-level considerations to increase speed while conserving energy. A handy, comprehensive reference or a practical design guide, this book provides effective solutions to specific challenging problems concerning the design of three-dimensional integrated circuits. Expanded with new chapters and updates throughout based on the latest research in 3-D integration: - Manufacturing techniques for 3-D ICs with TSVs - Electrical modeling and closed-form expressions of through silicon vias - Substrate noise coupling in heterogeneous 3-D ICs - Design of 3-D ICs with inductive links - Synchronization in 3-D ICs - Variation effects on 3-D ICs - Correlation of WID variations for intra-tier buffers and wires - Offers practical guidance on designing 3-D heterogeneous systems - Provides power delivery of 3-D ICs - Demonstrates the use of 3-D ICs within heterogeneous systems that include a variety of materials, devices, processors, GPU-CPU integration, and more - Provides experimental case studies in power delivery, synchronization, and thermal characterization
Author: Jose Luis Huertas Díaz
Publisher: Springer Science & Business Media
ISBN: 0387235213
Category : Technology & Engineering
Languages : en
Pages : 310
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Book Description
Test and Design-for-Testability in Mixed-Signal Integrated Circuits deals with test and design for test of analog and mixed-signal integrated circuits. Especially in System-on-Chip (SoC), where different technologies are intertwined (analog, digital, sensors, RF); test is becoming a true bottleneck of present and future IC projects. Linking design and test in these heterogeneous systems will have a tremendous impact in terms of test time, cost and proficiency. Although it is recognized as a key issue for developing complex ICs, there is still a lack of structured references presenting the major topics in this area. The aim of this book is to present basic concepts and new ideas in a manner understandable for both professionals and students. Since this is an active research field, a comprehensive state-of-the-art overview is very valuable, introducing the main problems as well as the ways of solution that seem promising, emphasizing their basis, strengths and weaknesses. In essence, several topics are presented in detail. First of all, techniques for the efficient use of DSP-based test and CAD test tools. Standardization is another topic considered in the book, with focus on the IEEE 1149.4. Also addressed in depth is the connecting design and test by means of using high-level (behavioural) description techniques, specific examples are given. Another issue is related to test techniques for well-defined classes of integrated blocks, like data converters and phase-locked-loops. Besides these specification-driven testing techniques, fault-driven approaches are described as they offer potential solutions which are more similar to digital test methods. Finally, in Design-for-Testability and Built-In-Self-Test, two other concepts that were taken from digital design, are introduced in an analog context and illustrated for the case of integrated filters. In summary, the purpose of this book is to provide a glimpse on recent research results in the area of testing mixed-signal integrated circuits, specifically in the topics mentioned above. Much of the work reported herein has been performed within cooperative European Research Projects, in which the authors of the different chapters have actively collaborated. It is a representative snapshot of the current state-of-the-art in this emergent field.
Author: Lun Li
Publisher: Springer Nature
ISBN: 3031798155
Category : Technology & Engineering
Languages : en
Pages : 79
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Book Description
Integrated circuit capacity follows Moore's law, and chips are commonly produced at the time of this writing with over 70 million gates per device. Ensuring correct functional behavior of such large designs before fabrication poses an extremely challenging problem. Formal verification validates the correctness of the implementation of a design with respect to its specification through mathematical proof techniques. Formal techniques have been emerging as commercialized EDA tools in the past decade. Simulation remains a predominantly used tool to validate a design in industry. After more than 50 years of development, simulation methods have reached a degree of maturity, however, new advances continue to be developed in the area. A simulation approach for functional verification can theoretically validate all possible behaviors of a design but requires excessive computational resources. Rapidly evolving markets demand short design cycles while the increasing complexity of a design causes simulation approaches to provide less and less coverage. Formal verification is an attractive alternative since 100% coverage can be achieved; however, large designs impose unrealistic computational requirements. Combining formal verification and simulation into a single integrated circuit validation framework is an attractive alternative. This book focuses on an Integrated Design Validation (IDV) system that provides a framework for design validation and takes advantage of current technology in the areas of simulation and formal verification resulting in a practical validation engine with reasonable runtime. After surveying the basic principles of formal verification and simulation, this book describes the IDV approach to integrated circuit functional validation. Table of Contents: Introduction / Formal Methods Background / Simulation Approaches / Integrated Design Validation System / Conclusion and Summary
Author: Jeffrey O. Grady
Publisher: CRC Press
ISBN: 9780849378386
Category : Technology & Engineering
Languages : en
Pages : 356
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Book Description
Historically, the terms validation and verification have been very loosely defined in the system engineering world, with predictable confusion. Few hardware or software testing texts even touch upon validation and verification, despite the fact that, properly employed, these test tools offer system and test engineers powerful techniques for identifying and solving problems early in the design process. Together, validation and verification encompass testing, analysis, demonstration, and examination methods used to determine whether a proposed design will satisfy system requirements. System Validation and Verification clear definitions of the terms and detailed information on using these fundamental tools for problem solving. It smoothes the transition between requirements and design by providing methods for evaluating the ability of a given approach to satisfy demanding technical requirements. With this book, system and test engineers and project managers gain confidence in their designs and lessen the likelihood of serious problems cropping up late in the program. In addition to explanations of the theories behind the concepts, the book includes practical methods for each step of the process, examples from the author's considerable experience, and illustrations and tables to support the ideas. Although not primarily a textbook, System Validation and Verification is based in part on validation and verification courses taught by the author and is an excellent supplemental reference for engineering students. In addition to its usefulness to system engineers, the book will be valuable to a wider audience including manufacturing, design, software , and risk management project engineers - anyone involved in large systems design projects.
Author: N. K. Jha
Publisher: Cambridge University Press
ISBN: 9781139437431
Category : Computers
Languages : en
Pages : 1022
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Book Description
Device testing represents the single largest manufacturing expense in the semiconductor industry, costing over $40 billion a year. The most comprehensive and wide ranging book of its kind, Testing of Digital Systems covers everything you need to know about this vitally important subject. Starting right from the basics, the authors take the reader through automatic test pattern generation, design for testability and built-in self-test of digital circuits before moving on to more advanced topics such as IDDQ testing, functional testing, delay fault testing, memory testing, and fault diagnosis. The book includes detailed treatment of the latest techniques including test generation for various fault models, discussion of testing techniques at different levels of integrated circuit hierarchy and a chapter on system-on-a-chip test synthesis. Written for students and engineers, it is both an excellent senior/graduate level textbook and a valuable reference.
Author:
Publisher:
ISBN:
Category : Air traffic control
Languages : en
Pages : 562
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Book Description
