Author: István Hargittai
Publisher: Elsevier Science & Technology
ISBN:
Category : Science
Languages : en
Pages : 904

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Book Description

Author: Eötvös Loránd Fizikai Társulat
Publisher:
ISBN:
Category :
Languages : en
Pages :

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Author:
Publisher:
ISBN:
Category : Diffraction
Languages : en
Pages : 69

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Book Description

Author: Myeongkyu Lee
Publisher: CRC Press
ISBN: 1315361973
Category : Science
Languages : en
Pages : 302

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Book Description
X-ray diffraction is a useful and powerful analysis technique for characterizing crystalline materials commonly employed in MSE, physics, and chemistry. This informative new book describes the principles of X-ray diffraction and its applications to materials characterization. It consists of three parts. The first deals with elementary crystallography and optics, which is essential for understanding the theory of X-ray diffraction discussed in the second section of the book. Part 2 describes how the X-ray diffraction can be applied for characterizing such various forms of materials as thin films, single crystals, and powders. The third section of the book covers applications of X-ray diffraction. The book presents a number of examples to help readers better comprehend the subject. X-Ray Diffraction for Materials Research: From Fundamentals to Applications also • provides background knowledge of diffraction to enable nonspecialists to become familiar with the topics • covers the practical applications as well as the underlying principle of X-ray diffraction • presents appropriate examples with answers to help readers understand the contents more easily • includes thin film characterization by X-ray diffraction with relevant experimental techniques • presents a huge number of elaborately drawn graphics to help illustrate the content The book will help readers (students and researchers in materials science, physics, and chemistry) understand crystallography and crystal structures, interference and diffraction, structural analysis of bulk materials, characterization of thin films, and nondestructive measurement of internal stress and phase transition. Diffraction is an optical phenomenon and thus can be better understood when it is explained with an optical approach, which has been neglected in other books. This book helps to fill that gap, providing information to convey the concept of X-ray diffraction and how it can be applied to the materials analysis. This book will be a valuable reference book for researchers in the field and will work well as a good introductory book of X-ray diffraction for students in materials science, physics, and chemistry.

Author: Leroy Elbert Alexander
Publisher: Krieger Publishing Company
ISBN:
Category : Science
Languages : en
Pages : 614

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Author: L. B. H. S. Virdhee
Publisher:
ISBN:
Category :
Languages : en
Pages :

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Author: Harold P. Klug
Publisher: Wiley-Interscience
ISBN:
Category : Science
Languages : en
Pages : 1000

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Book Description
Elementary crystallography. The production and properties of X-rays. Fundamental principles of X-ray diffraction. Photographic powder techniques. Diffractometric powder technique. The interpretation of powder diffraction data. Qualitative and quantitative analysis of crystalline powders. The precision determination of lattice constants. Crystallite size and lattice strains from line broadening. Investigation of preferred orientation and texture. Stress measurements in metals. Radial-distribution studies of noncrystalline materials. Layout for a diffraction laboratory. The handling and processing of X-ray film. Miscellaneous constants and numerical data. International atomic weights. Mass absorption coefficients u/p of the elements (Z=1 to 83) for a selection of wavelenghts. Quadratic forms for the cubic system. Atomic and ionic scattering factors. Lorentz and polarization factors. Temperature factor table. Warren's powder pattern power theorem.

Author: Eric J. Mittemeijer
Publisher: Springer Science & Business Media
ISBN: 3662067234
Category : Science
Languages : en
Pages : 557

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Book Description
Overview of diffraction methods applied to the analysis of the microstructure of materials. Since crystallite size and the presence of lattice defects have a decisive influence on the properties of many engineering materials, information about this microstructure is of vital importance in developing and assessing materials for practical applications. The most powerful and usually non-destructive evaluation techniques available are X-ray and neutron diffraction. The book details, among other things, diffraction-line broadening methods for determining crystallite size and atomic-scale strain due, e.g. to dislocations, and methods for the analysis of residual (macroscale) stress. The book assumes only a basic knowledge of solid-state physics and supplies readers sufficient information to apply the methods themselves.

Author: Lyle H. Schwartz
Publisher: Springer Science & Business Media
ISBN: 3642829279
Category : Technology & Engineering
Languages : en
Pages : 603

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Book Description
The atomic arrangements in condensed matter play an ever increasing role in many areas of science and technology - Materials Science and Engineering, Chemistry, Physics, Geology, Biology and Electrical, Civil, Mechanidtl and Chemical Engineering. Exciting discoveries in these fields in this century often stemmed from studies of these arrangements using diffraction: the structure and functions of DNA and other biological molecules, the configuration of polymer chains, the crystalline nature of metals and their imperfections, semiconductors and insulators, and -the links between their structures, their defects and material properties, and the interaction between materials and the environment. The broad, interdisciplinary character of diffraction studies makes them particularly exciting. With new tools such as the high-resolution electron microscope, new detectors, new techniques (such as EXAFS and glancing angle diffraction) and the new sources, the horizons of this field greatly expanded in the 1950's and 60's. Pulsed neutron sources and high intensity storage rings that came on the scene in the late 70's have opened up possibilities for new study to such vast horizons that it is hard to sit here writing this - there's so much to be done! Within the walls bounding each field of science or engineering, diffraction and structure is only one specialty. It is too easy for this topic to be developed in such a narrow way that sight is lost of the basic principles and broad possibilities.

Author: A. Andriesh
Publisher: Springer Science & Business Media
ISBN: 9401154961
Category : Science
Languages : en
Pages : 476

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Book Description
The Workshop on Physics and Application of Non-crystalline Semiconductors in Optoelectronics was held from 15 to 17 October 1996 in Chisinau. republic of Moldova and was devoted to the problems of non-crystalline semiconducting materials. The reports covered two mjlin topics: theoretical basis of physics of non -crystalline materials and experimental results. In the framework of these major topics there were treated many subjects. concerning the physics of non-crystalline semiconductors and their specific application: -optical properties of non-crystalline semiconductors; -doping of glassy semiconductors and photoinduced effects in chalcogenide glasses and their application for practical purposes; -methods for investigation of the structure in non-crystalline semiconductors -new glassy materials for IR trasmittance and optoelectronics. Reports and communications were presented on various aspects of the theory. new physical principles. studies of the atomic structure. search and development of optoelectronics devices. Special attention was paid to the actual subject of photoinduced transformations and its applications. Experimental investigations covered a rather wide spectrum of materials and physical phenomena. As a novel item it is worth to mention the study of nonlinear optical effects in amorphous semiconducting films. The third order optical non linearities. fast photoinduced optical absorption and refraction. acusto-optic effects recently discovered in non-crystalline semiconductors could potentially be utilised for optical signal processing. The important problems of photoinduced structural transformations and related phenomena. which are very attractive and actual both from the scientific and practical points of view. received much attention in discussions at the conference.