Diffraction Methods in Materials Science. [With Illustrations.]. PDF Download
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Author: Jerome Bernard COHEN (Professor of Materials Science, Northwestern University.)
Publisher:
ISBN:
Category :
Languages : en
Pages : 357
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Book Description
![Diffraction Methods in Materials Science. [With Illustrations.]. PDF](https://books.google.com/books/content/images/frontcover/mllRMwEACAAJ?fife=w80-h100)
Author: Jerome Bernard COHEN (Professor of Materials Science, Northwestern University.)
Publisher:
ISBN:
Category :
Languages : en
Pages : 357
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Book Description
Author: Jindřich Hašek
Publisher:
ISBN:
Category : Science
Languages : en
Pages : 490
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Book Description
Author: E. J. Mittemeijer
Publisher: John Wiley & Sons
ISBN: 3527649905
Category : Science
Languages : en
Pages : 563
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Book Description
The role of diffraction methods for the solid-state sciences has been pivotal to determining the (micro)structure of a material. Particularly, the expanding activities in materials science have led to the development of new methods for analysis by diffraction. This book offers an authoritative overview of the new developments in the field of analysis of matter by (in particular X-ray, electron and neutron) diffraction. It is composed of chapters written by leading experts on 'modern diffraction methods'. The focus in the various chapters of this book is on the current forefront of research on and applications for diffraction methods. This unique book provides descriptions of the 'state of the art' and, at the same time, identifies avenues for future research. The book assumes only a basic knowledge of solid-state physics and allows the application of the described methods by the readers of the book (either graduate students or mature scientists).
Author: Jerome Bernard Cohen
Publisher:
ISBN:
Category : Science
Languages : en
Pages : 376
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Book Description
Author: Severin Amelinckx
Publisher:
ISBN:
Category : Electron microscopy
Languages : en
Pages : 422
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Book Description
Author: Aaron D. Krawitz
Publisher: Wiley-Interscience
ISBN: 9780471247241
Category : Science
Languages : en
Pages : 0
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Book Description
Fundamentals and practical applications of diffraction for researchers, engineers, and students Materials science relies heavily on diffraction for the analysis of materials. Introduction to Diffraction in Materials Science and Engineering is a survey of the practical aspects of this valuable tool. Though it contains basic discussion of the theory and physics of diffraction, this book emphasizes understanding and the practical application of diffraction in materials science-making it a valuable text and resource for students, professionals, and researchers. Designed as a teaching and self-study text, this resource begins with a treatment of the fundamentals of crystallography and crystal structure and its importance in diffraction before moving on to cover important aspects of diffraction applications. Numerous examples and problems at the end of each chapter, including critical thinking questions, make this an excellent tool for learning and understanding. The book includes treatments of: * Basics of crystallography * Geometrical representation of crystals and reciprocal space * X-rays and neutrons * Structure factors and intensity * Powder diffraction * Qualitative (Powder Diffraction File) and quantitative phase analysis * Use of the International Tables for more complex structures and the Reitveld method * Residual stress * Introductions to texture, small diffracting units, and long-range order Aaron Krawitz provides both a practical introduction to diffraction that suits the needs of students and a resource for professionals already at work in materials science or engineering who want to utilize the power of diffraction in the study of materials.
Author: Herbert Herman
Publisher: Elsevier
ISBN: 1483218260
Category : Technology & Engineering
Languages : en
Pages : 277
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Book Description
Treatise on Materials Science and Technology, Volume 19: Experimental Methods, Part A covers the methods of materials experimentation and testing. The book discusses the measurement of residual stresses by x-ray diffraction techniques; the investigation of composition variations by diffraction; and the use of Mössbauer spectroscopy in materials science. The text also describes photoluminescence techniques for studies of composition and defects in semiconductors; and materials production by high-rate sputter deposition. Graduate students in the field of materials science, laboratory scientists, and materials engineers will find the book invaluable.
Author: Adam J. Schwartz
Publisher: Springer Science & Business Media
ISBN: 1475732058
Category : Technology & Engineering
Languages : en
Pages : 352
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Book Description
Crystallographic texture or preferred orientation has long been known to strongly influence material properties. Historically, the means of obtaining such texture data has been though the use of x-ray or neutron diffraction for bulk texture measurements, or transmission electron microscopy or electron channeling for local crystallographic information. In recent years, we have seen the emergence of a new characterization technique for probing the microtexture of materials. This advance has come about primarily through the automated indexing of electron backscatter diffraction (EBSD) patterns. The first commercially available system was introduced in 1994, and since then of sales worldwide has been dramatic. This has accompanied widening the growth applicability in materials scienceproblems such as microtexture, phase identification, grain boundary character distribution, deformation microstructures, etc. and is evidence that this technique can, in some cases, replace more time-consuming transmission electron microscope (TEM) or x-ray diffraction investigations. The benefits lie in the fact that the spatial resolution on new field emission scanning electron microscopes (SEM) can approach 50 nm, but spatial extent can be as large a centimeter or greater with a computer controlled stage and montagingofthe images. Additional benefits include the relative ease and low costofattaching EBSD hardware to new or existing SEMs. Electron backscatter diffraction is also known as backscatter Kikuchi diffraction (BKD), or electron backscatter pattern technique (EBSP). Commercial names for the automation include Orientation Imaging Microscopy (OIMTM) and Automated Crystal Orientation Mapping (ACOM).
Author: Vitalij Pecharsky
Publisher: Springer Science & Business Media
ISBN: 0387095799
Category : Science
Languages : en
Pages : 751
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Book Description
A little over ?ve years have passed since the ?rst edition of this book appeared in print. Seems like an instant but also eternity, especially considering numerous developments in the hardware and software that have made it from the laboratory test beds into the real world of powder diffraction. This prompted a revision, which had to be beyond cosmetic limits. The book was, and remains focused on standard laboratory powder diffractometry. It is still meant to be used as a text for teaching students about the capabilities and limitations of the powder diffraction method. We also hope that it goes beyond a simple text, and therefore, is useful as a reference to practitioners of the technique. The original book had seven long chapters that may have made its use as a text - convenient. So the second edition is broken down into 25 shorter chapters. The ?rst ?fteen are concerned with the fundamentals of powder diffraction, which makes it much more logical, considering a typical 16-week long semester. The last ten ch- ters are concerned with practical examples of structure solution and re?nement, which were preserved from the ?rst edition and expanded by another example – R solving the crystal structure of Tylenol .
Author: Ute Kolb
Publisher: Springer
ISBN: 9400755805
Category : Science
Languages : en
Pages : 427
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Book Description
The polycrystalline and nanocrystalline states play an increasingly important role in exploiting the properties of materials, encompassing applications as diverse as pharmaceuticals, catalysts, solar cells and energy storage. A knowledge of the three-dimensional atomic and molecular structure of materials is essential for understanding and controlling their properties, yet traditional single-crystal X-ray diffraction methods lose their power when only polycrystalline and nanocrystalline samples are available. It is here that powder diffraction and single-crystal electron diffraction techniques take over, substantially extending the range of applicability of the crystallographic principles of structure determination. This volume, a collection of teaching contributions presented at the Crystallographic Course in Erice in 2011, clearly describes the fundamentals and the state-of-the-art of powder diffraction and electron diffraction methods in materials characterisation, encompassing a diverse range of disciplines and materials stretching from archeometry to zeolites. As such, it is a comprehensive and valuable resource for those wishing to gain an understanding of the broad applicability of these two rapidly developing fields.
