Development of Pixel Super-resolution Scanning Transmission X-ray Microscopy for Material Science PDF Download
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Author: Talgat Mamyrbayev
Publisher:
ISBN:
Category : Materials science
Languages : en
Pages :
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Book Description
Author: Talgat Mamyrbayev
Publisher:
ISBN:
Category : Materials science
Languages : en
Pages :
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Book Description
Author: Nicolas Brodusch
Publisher: Springer
ISBN: 9811044333
Category : Technology & Engineering
Languages : en
Pages : 143
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Book Description
This book highlights what is now achievable in terms of materials characterization with the new generation of cold-field emission scanning electron microscopes applied to real materials at high spatial resolution. It discusses advanced scanning electron microscopes/scanning- transmission electron microscopes (SEM/STEM), simulation and post-processing techniques at high spatial resolution in the fields of nanomaterials, metallurgy, geology, and more. These microscopes now offer improved performance at very low landing voltage and high -beam probe current stability, combined with a routine transmission mode capability that can compete with the (scanning-) transmission electron microscopes (STEM/-TEM) historically run at higher beam accelerating voltage
Author: Lorenzo Albertazzi
Publisher: CRC Press
ISBN: 1003858902
Category : Science
Languages : en
Pages : 249
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Book Description
Optical microscopy is one of the most frequently used tools in chemistry and the life sciences. However, its limited resolution hampers the use of optical imaging to many other relevant problems in different disciplines. Super-Resolution Microscopy (SRM) is a new technique that allows the resolution of objects down to a few billionth of meters (nanometers), ten times better than classical microscopes, opening up opportunities to use this tool in new fields. This book describes the theory, principles, and practice of super-resolution microscopy in the field of materials science and nanotechnology. There is a growing interest in the applications of SRM beyond biology as new synthetic materials, such as nanoscale sensors and catalysts, nanostructured materials, functional polymers, and nanoparticles, have nanoscopic features that are challenging to visualize with traditional imaging methods. SRM has the potential to be used to image and understand these cutting-edge man-made objects and guide the design of materials for novel applications. This book is an ideal guide for researchers in the fields of microscopy and materials science and chemistry as well as graduate students studying physics, materials science, biomedical engineering, and chemistry. Key Features: Contains practical guidance on Super-Resolution Microscopy (SRM), an exciting and growing tool that was awarded the Nobel Prize for chemistry in 2014 Provides a new perspective targeting materials science, unlike existing books which target readers in chemistry, life science, and biology Targets students in its core chapters, while offering more advanced material for professionals and researchers in later chapters
Author: Joseph Goldstein
Publisher: Springer Science & Business Media
ISBN: 1461304911
Category : Science
Languages : en
Pages : 830
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Book Description
In the last decade, since the publication of the first edition of Scanning Electron Microscopy and X-ray Microanalysis, there has been a great expansion in the capabilities of the basic SEM and EPMA. High resolution imaging has been developed with the aid of an extensive range of field emission gun (FEG) microscopes. The magnification ranges of these instruments now overlap those of the transmission electron microscope. Low-voltage microscopy using the FEG now allows for the observation of noncoated samples. In addition, advances in the develop ment of x-ray wavelength and energy dispersive spectrometers allow for the measurement of low-energy x-rays, particularly from the light elements (B, C, N, 0). In the area of x-ray microanalysis, great advances have been made, particularly with the "phi rho z" [Ij)(pz)] technique for solid samples, and with other quantitation methods for thin films, particles, rough surfaces, and the light elements. In addition, x-ray imaging has advanced from the conventional technique of "dot mapping" to the method of quantitative compositional imaging. Beyond this, new software has allowed the development of much more meaningful displays for both imaging and quantitative analysis results and the capability for integrating the data to obtain specific information such as precipitate size, chemical analysis in designated areas or along specific directions, and local chemical inhomogeneities.
Author:
Publisher:
ISBN:
Category :
Languages : en
Pages : 5
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Book Description
The brightness of the Advanced Light Source will be exploited by several new instruments for materials science spectromicroscopy over the next year or so. The first of these to become operational is a scanning transmission x-ray microscope with which near edge x-ray absorption spectra (NEXAFS) can be measured on spatial features of sub-micron size. Here the authors describe the instrument as it is presently implemented, its capabilities, some studies made to date and the developments to come. The Scanning Transmission X-ray Microscope makes use of a zone plate lens to produce a small x-ray spot with which to perform absorption spectroscopy through thin samples. The x-ray beam from ALS undulator beamline 7.0 emerges into the microscope vessel through a silicon nitride vacuum window 160nm thick and 300[mu]m square. The vessel is filled with helium at atmospheric pressure. The zone plate lens is illuminated 1mm downstream from the vacuum window and forms an image in first order of a pinhole which is 3m upstream in the beamline. An order sorting aperture passes the first order converging light and blocks the unfocused zero order. The sample is at the focus a few mm downstream of the zone plate and mounted from a scanning piezo stage which rasters in x and y so that an image is formed, pixel by pixel, by an intensity detector behind the sample. Absorption spectra are measured point-by-point as the photon energy is scanned by rotating the diffraction grating in the monochromator and changing the undulator gap.
Author:
Publisher:
ISBN:
Category :
Languages : en
Pages : 20
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Third generation synchrotron sources of soft x-rays provide an excellent opportunity to apply established x-ray spectroscopic materials analysis techniques to surface imaging on a sub-micron scale. This paper describes an effort underway at the Advanced Light Source (ALS) to pursue this development using Fresnel zone plate lenses. These are used to produce a sub-micron spot of x-rays for use in scanning microscopy. Several groups have developed microscopes using this technique. A specimen is rastered in the focused x-ray spot and a detector signal is acquired as a function of position to generate an image. Spectroscopic capability is added by holding the small spot on a feature of interest and scanning through the spectrum. The authors are pursuing two spectroscopic techniques: Near Edge X-ray Absorption Spectroscopy (NEXAFS), X-ray Photoelectron Spectroscopy (XPS) which together provide a powerful capability for light element analysis in materials science.
Author: David Keith Bowen
Publisher: John Wiley & Sons
ISBN:
Category : Science
Languages : en
Pages : 330
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Book Description
Author: Jürgen Thieme
Publisher: Springer Science & Business Media
ISBN: 3642721060
Category : Science
Languages : en
Pages : 382
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Book Description
This book is based on presentations to the International Conference of X-Ray Micro scopy and Spectromicroscopy, XRM 96, which took place in Wiirzburg, August 19- 23, 1996. The conference also celebrated the lOOth anniversary of the discovery of X rays by Wilhelm Conrad Rontgen on November 8, 1895, in Wiirzburg. This book contains state-of-the-art reviews and up-to-date progress reports in the field of X-ray microscopy and spectromicroscopy, including related new X-ray optics and X-ray sources. It reflects the lively activities within a relatively new field of science which combines the development of new instruments and methods with their applications to numerous topical scientific questions. The applications range from biological and medical topics, colloid physics, and soil sciences to solid-state physics, material sciences, and surface sciences. Their variety demonstrates the interdisci plinary and cooperative character of this field and the growing demand for micro scopic and spectromicroscopic information on the nanometer scale and under specific sample conditions, for example in wet (natural) surroundings or on a solid surface.
Author: William Krakow
Publisher:
ISBN:
Category : Technology & Engineering
Languages : en
Pages : 426
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Book Description
The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.
Author: Benedikt Sebastian Günther
Publisher: Springer Nature
ISBN: 3031177428
Category : Science
Languages : en
Pages : 356
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Book Description
This thesis presents research on novel laboratory-scale synchrotron X-ray sources based on inverse Compton scattering and applications of their X-ray radiation using the Munich Compact Light Source (MuCLS) as an example. It provides an introduction to the theory of this laser-electron interaction, laser resonators and X-ray interactions with matter. On this basis, upgrades to the laser system including the development of a new laser optic, X-ray beam stabilisation and two techniques for fast X-ray energy switching of inverse Compton sources are presented. On the application side, the beamline, designed and developed for the inverse Compton X-ray source at the MuCLS, is described before various techniques and applications are demonstrated at this laboratory-scale synchrotron X-ray facility. Among them are K-edge subtraction imaging, X-ray phase contrast imaging and X-ray absorption spectroscopy. Additionally, a new X-ray microscopy technique, called full-field structured-illumination super-resolution X-ray transmission microscopy, is presented. Apart from research conducted at the MuCLS, this thesis contains an in-depth overview on the state of the art of the various types of inverse Compton X-ray sources that have been realised so far. Accordingly, this thesis may serve as a guide and reference work for researchers working with inverse Compton X-ray sources as well as future users of such devices.
