A Practitioner's Guide to Software Test Design PDF Download
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Author: Lee Copeland
Publisher: Artech House
ISBN: 9781580537322
Category : Computers
Languages : en
Pages : 328
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Book Description
Written by a leading expert in the field, this unique volume contains current test design approaches and focuses only on software test design. Copeland illustrates each test design through detailed examples and step-by-step instructions.
Author: Lee Copeland
Publisher: Artech House
ISBN: 9781580537322
Category : Computers
Languages : en
Pages : 328
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Book Description
Written by a leading expert in the field, this unique volume contains current test design approaches and focuses only on software test design. Copeland illustrates each test design through detailed examples and step-by-step instructions.
Author: John Turino
Publisher: Springer Science & Business Media
ISBN: 9401160449
Category : Science
Languages : en
Pages : 334
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Book Description
This book is the second edition of Design to Test. The first edition, written by myself and H. Frank Binnendyk and first published in 1982, has undergone several printings and become a standard in many companies, even in some countries. Both Frank and I are very proud of the success that our customers have had in utilizing the information, all of it still applicable to today's electronic designs. But six years is a long time in any technology field. I therefore felt it was time to write a new edition. This new edition, while retaining the basic testability prin ciples first documented six years ago, contains the latest material on state-of-the-art testability techniques for electronic devices, boards, and systems and has been completely rewritten and up dated. Chapter 15 from the first edition has been converted to an appendix. Chapter 6 has been expanded to cover the latest tech nology devices. Chapter 1 has been revised, and several examples throughout the book have been revised and updated. But some times the more things change, the more they stay the same. All of the guidelines and information presented in this book deal with the three basic testability principles-partitioning, control, and visibility. They have not changed in years. But many people have gotten smarter about how to implement those three basic test ability principles, and it is the aim of this text to enlighten the reader regarding those new (and old) testability implementation techniques.
Author: Matt Stephens
Publisher: Apress
ISBN: 1430229446
Category : Computers
Languages : en
Pages : 359
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Book Description
The groundbreaking book Design Driven Testing brings sanity back to the software development process by flipping around the concept of Test Driven Development (TDD)—restoring the concept of using testing to verify a design instead of pretending that unit tests are a replacement for design. Anyone who feels that TDD is “Too Damn Difficult” will appreciate this book. Design Driven Testing shows that, by combining a forward-thinking development process with cutting-edge automation, testing can be a finely targeted, business-driven, rewarding effort. In other words, you’ll learn how to test smarter, not harder. Applies a feedback-driven approach to each stage of the project lifecycle. Illustrates a lightweight and effective approach using a core subset of UML. Follows a real-life example project using Java and Flex/ActionScript. Presents bonus chapters for advanced DDTers covering unit-test antipatterns (and their opposite, “test-conscious” design patterns), and showing how to create your own test transformation templates in Enterprise Architect.
Author: Istvan Forgacs
Publisher: BCS, The Chartered Institute for IT
ISBN: 9781780174723
Category :
Languages : en
Pages : 336
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Book Description
This book presents the key test design techniques, in line with ISTQB, and explains the why and when of using them, with practical examples and code snippets. How and why the techniques can be combined is covered, as are automated test design methods. Tips and exercises are included throughout the book.
Author: Wim J. van der Linden
Publisher: Springer Science & Business Media
ISBN: 0387290540
Category : Social Science
Languages : en
Pages : 421
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Book Description
Wim van der Linden was just given a lifetime achievement award by the National Council on Measurement in Education. There is no one more prominent in the area of educational testing. There are hundreds of computer-based credentialing exams in areas such as accounting, real estate, nursing, and securities, as well as the well-known admissions exams for college, graduate school, medical school, and law school - there is great need on the theory of testing. This book presents the statistical theory and practice behind constructing good tests e.g., how is the first test item selected, how are the next items selected, and when do you have enough items.
Author: Laung-Terng Wang
Publisher: Elsevier
ISBN: 9780080474793
Category : Technology & Engineering
Languages : en
Pages : 808
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Book Description
This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume. Most up-to-date coverage of design for testability. Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books. Numerous, practical examples in each chapter illustrating basic VLSI test principles and DFT architectures.
Author: National Research Council
Publisher: National Academies Press
ISBN: 0309084539
Category : Education
Languages : en
Pages : 132
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Book Description
In the United States, the nomenclature of adult education includes adult literacy, adult secondary education, and English for speakers of other languages (ESOL) services provided to undereducated and limited English proficient adults. Those receiving adult education services have diverse reasons for seeking additional education. With the passage of the WIA, the assessment of adult education students became mandatory-regardless of their reasons for seeking services. The law does allow the states and local programs flexibility in selecting the most appropriate assessment for the student. The purpose of the NRC's workshop was to explore issues related to efforts to measure learning gains in adult basic education programs, with a focus on performance-based assessments.
Author: Erik Larsson
Publisher: Springer Science & Business Media
ISBN: 0387256245
Category : Technology & Engineering
Languages : en
Pages : 397
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Book Description
SOC test design and its optimization is the topic of Introduction to Advanced System-on-Chip Test Design and Optimization. It gives an introduction to testing, describes the problems related to SOC testing, discusses the modeling granularity and the implementation into EDA (electronic design automation) tools. The book is divided into three sections: i) test concepts, ii) SOC design for test, and iii) SOC test applications. The first part covers an introduction into test problems including faults, fault types, design-flow, design-for-test techniques such as scan-testing and Boundary Scan. The second part of the book discusses SOC related problems such as system modeling, test conflicts, power consumption, test access mechanism design, test scheduling and defect-oriented scheduling. Finally, the third part focuses on SOC applications, such as integrated test scheduling and TAM design, defect-oriented scheduling, and integrating test design with the core selection process.
Author: Zainalabedin Navabi
Publisher: Springer Science & Business Media
ISBN: 1441975489
Category : Technology & Engineering
Languages : en
Pages : 452
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Book Description
This book is about digital system testing and testable design. The concepts of testing and testability are treated together with digital design practices and methodologies. The book uses Verilog models and testbenches for implementing and explaining fault simulation and test generation algorithms. Extensive use of Verilog and Verilog PLI for test applications is what distinguishes this book from other test and testability books. Verilog eliminates ambiguities in test algorithms and BIST and DFT hardware architectures, and it clearly describes the architecture of the testability hardware and its test sessions. Describing many of the on-chip decompression algorithms in Verilog helps to evaluate these algorithms in terms of hardware overhead and timing, and thus feasibility of using them for System-on-Chip designs. Extensive use of testbenches and testbench development techniques is another unique feature of this book. Using PLI in developing testbenches and virtual testers provides a powerful programming tool, interfaced with hardware described in Verilog. This mixed hardware/software environment facilitates description of complex test programs and test strategies.
Author: Brandon Noia
Publisher: Springer Science & Business Media
ISBN: 3319023780
Category : Technology & Engineering
Languages : en
Pages : 260
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Book Description
This book describes innovative techniques to address the testing needs of 3D stacked integrated circuits (ICs) that utilize through-silicon-vias (TSVs) as vertical interconnects. The authors identify the key challenges facing 3D IC testing and present results that have emerged from cutting-edge research in this domain. Coverage includes topics ranging from die-level wrappers, self-test circuits, and TSV probing to test-architecture design, test scheduling, and optimization. Readers will benefit from an in-depth look at test-technology solutions that are needed to make 3D ICs a reality and commercially viable.
