Design of an Aberration Compensated Electrostatic Lens System Capable of Collecting Electrons Over a Large Solid Angle PDF Download
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Author: B R. Dobson
Publisher:
ISBN:
Category :
Languages : en
Pages :
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Author: B R. Dobson
Publisher:
ISBN:
Category :
Languages : en
Pages :
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Book Description
Author:
Publisher:
ISBN:
Category : Dissertations, Academic
Languages : en
Pages : 862
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Book Description
Author: D.W.O. Heddle
Publisher: CRC Press
ISBN: 1420034391
Category : Technology & Engineering
Languages : en
Pages : 264
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Book Description
Electrostatic Lens Systems: Second Edition enables readers to design lens systems for focusing beams of charged particles that have useful characteristics. The book covers the basic theory of the motion of charged particles in electrostatic fields and describes several methods for the calculation of the potential and field distribution for various electrode geometries. It emphasizes the Bessel function expansion method, developed by the author and his students, and the nine-point implementation of the finite difference method. Demonstration programs of other methods can be found via the websites provided. A chapter on aberrations presents formulae that enable the coefficients to be determined by an extension to the ray tracing procedures, demonstrating optimum conditions for lens operation. The book is accompanied by a disk that provides a suite of computer programs (LENSYS for MS-DOS) intended for practical use in the design and analysis of systems using round lenses with apertures or cylindrical elements. These programs are of value even to experienced workers in the field who may be quite familiar with much of the material in the text.
Author: P. W. Hawkes
Publisher:
ISBN:
Category : Science
Languages : en
Pages : 400
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Book Description
Author: D.W.O. Heddle
Publisher:
ISBN:
Category : Science
Languages : en
Pages : 120
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Book Description
The use of electrostatic lenses for the control of ion and electron beams has grown considerably in recent years. In addition, innovations in the production of low energy positrons have opened a whole new field of research for which electrostatic lenses are required. Electrostatic Lens Systems is therefore a timely treatise on the practical aspects of lens system design. The text gives a clear and concise treatment of the motion of charged particles in electrostatic fields and describes several methods of calculating the potential and field distributions for various electrode geometries. Electrostatic Lens Systems is also intended to be an interactive tutor on the practical design and analysis of systems using round lenses (both apertures and cylinders) through a unique suite of programs (provided on IBM compatible disc). Combined with an emphasis on the Bessel function expansion method and a thorough description of the well known relaxation methods, this volume will be a significant reference work and learning tool for experienced workers and new researchers alike. If you need to use electrostatic lenses then you need to read Electrostatic Lens Systems.
Author: Martin Hÿtch
Publisher: Elsevier
ISBN: 0323988652
Category : Technology & Engineering
Languages : en
Pages : 398
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Book Description
Coulomb Interactions in Particle Beams, Volume 223 in the Advances in Imaging and Electron Physics series, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy, and computing methods used in all these domains, with this release exploring Coulomb Interactions in Particle Beams. Provides the authority and expertise of leading contributors from an international board of authors Presents the latest release in the Advances in Imaging and Electron Physics series Updated release includes the latest information on Coulomb Interactions in Particle Beams
Author: Peter W. Hawkes
Publisher: Springer Nature
ISBN: 3030000699
Category : Technology & Engineering
Languages : en
Pages : 1561
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Book Description
This book features reviews by leading experts on the methods and applications of modern forms of microscopy. The recent awards of Nobel Prizes awarded for super-resolution optical microscopy and cryo-electron microscopy have demonstrated the rich scientific opportunities for research in novel microscopies. Earlier Nobel Prizes for electron microscopy (the instrument itself and applications to biology), scanning probe microscopy and holography are a reminder of the central role of microscopy in modern science, from the study of nanostructures in materials science, physics and chemistry to structural biology. Separate chapters are devoted to confocal, fluorescent and related novel optical microscopies, coherent diffractive imaging, scanning probe microscopy, transmission electron microscopy in all its modes from aberration corrected and analytical to in-situ and time-resolved, low energy electron microscopy, photoelectron microscopy, cryo-electron microscopy in biology, and also ion microscopy. In addition to serving as an essential reference for researchers and teachers in the fields such as materials science, condensed matter physics, solid-state chemistry, structural biology and the molecular sciences generally, the Springer Handbook of Microscopy is a unified, coherent and pedagogically attractive text for advanced students who need an authoritative yet accessible guide to the science and practice of microscopy.
Author: Frances M. Ross
Publisher: Cambridge University Press
ISBN: 1107116570
Category : Science
Languages : en
Pages : 529
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Book Description
2.6.2 Electrodes for Electrochemistry
Author: John F. Watts
Publisher: John Wiley & Sons
ISBN: 1119417643
Category : Technology & Engineering
Languages : en
Pages : 307
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Book Description
Provides a concise yet comprehensive introduction to XPS and AES techniques in surface analysis This accessible second edition of the bestselling book, An Introduction to Surface Analysis by XPS and AES, 2nd Edition explores the basic principles and applications of X-ray Photoelectron Spectroscopy (XPS) and Auger Electron Spectroscopy (AES) techniques. It starts with an examination of the basic concepts of electron spectroscopy and electron spectrometer design, followed by a qualitative and quantitative interpretation of the electron spectrum. Chapters examine recent innovations in instrument design and key applications in metallurgy, biomaterials, and electronics. Practical and concise, it includes compositional depth profiling; multi-technique analysis; and everything about samples—including their handling, preparation, stability, and more. Topics discussed in more depth include peak fitting, energy loss background analysis, multi-technique analysis, and multi-technique profiling. The book finishes with chapters on applications of electron spectroscopy in materials science and the comparison of XPS and AES with other analytical techniques. Extensively revised and updated with new material on NAPXPS, twin anode monochromators, gas cluster ion sources, valence band spectra, hydrogen detection, and quantification Explores key spectroscopic techniques in surface analysis Provides descriptions of latest instruments and techniques Includes a detailed glossary of key surface analysis terms Features an extensive bibliography of key references and additional reading Uses a non-theoretical style to appeal to industrial surface analysis sectors An Introduction to Surface Analysis by XPS and AES, 2nd Edition is an excellent introductory text for undergraduates, first-year postgraduates, and industrial users of XPS and AES.
Author: Saul Wischnitzer
Publisher: Elsevier
ISBN: 1483148696
Category : Science
Languages : en
Pages : 311
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Book Description
Introduction to Electron Microscopy, Second Edition provides an introduction to the foundations of electron microscopy; an outline of some practical aspects of instrument operation; and discussion of the rationale of the methodology of biological specimen preparation. The book seeks to provide a comprehensive understanding of the theoretical and operational aspects of the electron microscope. This edition consists of two parts. Part One deals with the history, basic theory, and operation of the electron microscope. Part Two discusses steps used in material preparation for electron microscope investigation such as fixation, embedding, and staining techniques. Biomedical researchers, molecular biologists, toxicologists, forensic investigators, and medical students will find this book a very useful reference.
