Author: S. Ashok
Publisher:
ISBN:
Category : Technology & Engineering
Languages : en
Pages : 1176
Book Description
Proceedings of the San Francisco meeting of April-May 1992. Papers emphasize deliberate and controlled introduction and manipulation of defects in order to engineer some desired properties in semiconductor materials and devices. Topics include: defects in bulk crystals, and in thin films; defect characterization; hydrogen interaction; processing induction of defects; quantum wells; ion implantation. Annotation copyright by Book News, Inc., Portland, OR
Defect Engineering in Semiconductor Growth, Processing, and Device Technology
Author: S. Ashok
Publisher:
ISBN:
Category : Technology & Engineering
Languages : en
Pages : 1176
Book Description
Proceedings of the San Francisco meeting of April-May 1992. Papers emphasize deliberate and controlled introduction and manipulation of defects in order to engineer some desired properties in semiconductor materials and devices. Topics include: defects in bulk crystals, and in thin films; defect characterization; hydrogen interaction; processing induction of defects; quantum wells; ion implantation. Annotation copyright by Book News, Inc., Portland, OR
Publisher:
ISBN:
Category : Technology & Engineering
Languages : en
Pages : 1176
Book Description
Proceedings of the San Francisco meeting of April-May 1992. Papers emphasize deliberate and controlled introduction and manipulation of defects in order to engineer some desired properties in semiconductor materials and devices. Topics include: defects in bulk crystals, and in thin films; defect characterization; hydrogen interaction; processing induction of defects; quantum wells; ion implantation. Annotation copyright by Book News, Inc., Portland, OR
Proceedings of the Third International Symposium on Defects in Silicon
Author: Takao Abe
Publisher: The Electrochemical Society
ISBN: 9781566772235
Category : Science
Languages : en
Pages : 548
Book Description
Publisher: The Electrochemical Society
ISBN: 9781566772235
Category : Science
Languages : en
Pages : 548
Book Description
Gettering and Defect Engineering in Semiconductor Technology
Author: H. Richter
Publisher:
ISBN:
Category : Electric engineering
Languages : en
Pages : 718
Book Description
Publisher:
ISBN:
Category : Electric engineering
Languages : en
Pages : 718
Book Description
Defects in Semiconductors
Author:
Publisher: Academic Press
ISBN: 0128019409
Category : Technology & Engineering
Languages : en
Pages : 458
Book Description
This volume, number 91 in the Semiconductor and Semimetals series, focuses on defects in semiconductors. Defects in semiconductors help to explain several phenomena, from diffusion to getter, and to draw theories on materials' behavior in response to electrical or mechanical fields. The volume includes chapters focusing specifically on electron and proton irradiation of silicon, point defects in zinc oxide and gallium nitride, ion implantation defects and shallow junctions in silicon and germanium, and much more. It will help support students and scientists in their experimental and theoretical paths. - Expert contributors - Reviews of the most important recent literature - Clear illustrations - A broad view, including examination of defects in different semiconductors
Publisher: Academic Press
ISBN: 0128019409
Category : Technology & Engineering
Languages : en
Pages : 458
Book Description
This volume, number 91 in the Semiconductor and Semimetals series, focuses on defects in semiconductors. Defects in semiconductors help to explain several phenomena, from diffusion to getter, and to draw theories on materials' behavior in response to electrical or mechanical fields. The volume includes chapters focusing specifically on electron and proton irradiation of silicon, point defects in zinc oxide and gallium nitride, ion implantation defects and shallow junctions in silicon and germanium, and much more. It will help support students and scientists in their experimental and theoretical paths. - Expert contributors - Reviews of the most important recent literature - Clear illustrations - A broad view, including examination of defects in different semiconductors
Proceedings of the Eleventh International Symposium on Plasma Processing
Author: Electrochemical Society. Dielectric Science and Technology Division
Publisher: The Electrochemical Society
ISBN: 9781566771641
Category : Science
Languages : en
Pages : 740
Book Description
Publisher: The Electrochemical Society
ISBN: 9781566771641
Category : Science
Languages : en
Pages : 740
Book Description
Proceedings of the Fourth International Symposium on High Purity Silicon
Author: Cor L. Claeys
Publisher: The Electrochemical Society
ISBN: 9781566771566
Category : Science
Languages : en
Pages : 606
Book Description
Publisher: The Electrochemical Society
ISBN: 9781566771566
Category : Science
Languages : en
Pages : 606
Book Description
Gettering and Defect Engineering in Semiconductor Technology IX
Author: Vito Raineri
Publisher: Trans Tech Publications Ltd
ISBN: 3035707073
Category : Technology & Engineering
Languages : en
Pages : 809
Book Description
GADEST 2001 Proceedings of the 9th Int. Conference on Gettering anf Defect Engineering in Semiconductor Technology , S. Tecla, Italy
Publisher: Trans Tech Publications Ltd
ISBN: 3035707073
Category : Technology & Engineering
Languages : en
Pages : 809
Book Description
GADEST 2001 Proceedings of the 9th Int. Conference on Gettering anf Defect Engineering in Semiconductor Technology , S. Tecla, Italy
Proceedings of the Symposium on Diagnostic Techniques for Semiconductor Materials and Devices
Author: Dieter K. Schroder
Publisher: The Electrochemical Society
ISBN: 9781566770927
Category : Technology & Engineering
Languages : en
Pages : 408
Book Description
Publisher: The Electrochemical Society
ISBN: 9781566770927
Category : Technology & Engineering
Languages : en
Pages : 408
Book Description
Proceedings of the Fifth International Symposium on High Purity Silicon
Author: Cor L. Claeys
Publisher: The Electrochemical Society
ISBN: 9781566772075
Category : Science
Languages : en
Pages : 498
Book Description
Publisher: The Electrochemical Society
ISBN: 9781566772075
Category : Science
Languages : en
Pages : 498
Book Description
Proceedings of the Symposium on Crystalline Defects and Contamination, Their Impact and Control in Device Manufacturing II
Author: Bernd O. Kolbesen (Chemiker.)
Publisher:
ISBN:
Category : Technology & Engineering
Languages : en
Pages : 536
Book Description
Publisher:
ISBN:
Category : Technology & Engineering
Languages : en
Pages : 536
Book Description