Correction Method for Determining the Optical Constants of Thin Films with Non-uniform Thickness PDF Download
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Languages : en
Pages :
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Author:
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Languages : en
Pages :
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Author:
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Category :
Languages : en
Pages : 5
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Author: Olaf Stenzel
Publisher: Springer
ISBN: 3319753258
Category : Science
Languages : en
Pages : 474
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This book is an up-to-date survey of the major optical characterization techniques for thin solid films. Emphasis is placed on practicability of the various approaches. Relevant fundamentals are briefly reviewed before demonstrating the application of these techniques to practically relevant research and development topics. The book is written by international top experts, all of whom are involved in industrial research and development projects.
Author: K. F. Palmer
Publisher:
ISBN:
Category :
Languages : en
Pages : 60
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In this report, a new subtractive Kramers-Kronig computer program is described which can obtain accurate optical constants of a uniform thin film on a thick substrate using only the transmittance measurements of a single-film thickness. Preliminary results from existing data show that the optical properties of a dielectric film may depend, to a small degree, upon the thickness of the film. This effect seems to be more noticeable in films containing molecules, such as H2O and NH3, which readily form hydrogen bonds. Also described are two methods for extracting the optical constants of a dielectric thin film from measurements of the reflectance of a beam incident in a vacuum upon a film layer on a metal substrate. In one method, the dependence is observed of the reflectances of several thicknesses of the same film material upon its thickness. This method contains the assumption that the optical properties of a film material do not vary with changes in film thickness. The second method does not depend on this assumption. It uses the reflectance spectrum of a single-film thickness to compute the optical constants of the film from a dispersion relation.
Author: Flory
Publisher: CRC Press
ISBN: 9780824796334
Category : Science
Languages : en
Pages : 608
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Book Description
This work presents advances in thin films for applications in the fields of integrated optics, micro-optics, optical telecommunications and optoelectronics. It delineates the performance characteristics needed for graded coatings, damage-resistant laser coatings and many others. Basic theory and applications are illustrated.
Author: Elio Passaglia
Publisher:
ISBN:
Category : Ellipsometry
Languages : en
Pages : 366
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![Determination of the Optical Constants and Thickness of Amorphous V O Thin Films. [Authors] PDF](https://books.google.com/books/content/images/frontcover/tJvrsgEACAAJ?fife=w80-h100)
Author:
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Category :
Languages : en
Pages :
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Author: O. S. Heavens
Publisher:
ISBN:
Category : Electron optics
Languages : en
Pages : 284
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Category : Finishes and finishing
Languages : en
Pages : 472
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Author:
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Category : Weights and measures
Languages : en
Pages : 336
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