Author: Aloke Guha
Publisher:
ISBN:
Category :
Languages : en
Pages : 476
Book Description
Concurrent Testing of Microprogrammed Control Units and Combinational Logic
Author: Aloke Guha
Publisher:
ISBN:
Category :
Languages : en
Pages : 476
Book Description
Publisher:
ISBN:
Category :
Languages : en
Pages : 476
Book Description
Concurrent Testing of Microprogrammed Control Units and Systolic Arrays
Author: Vijay Sourirajan Iyengar
Publisher:
ISBN:
Category :
Languages : en
Pages : 348
Book Description
Publisher:
ISBN:
Category :
Languages : en
Pages : 348
Book Description
Evaluation of Concurrent Error Detection in Microprogrammed Control Units
Author: Argirios Bailas
Publisher:
ISBN:
Category :
Languages : en
Pages : 416
Book Description
Publisher:
ISBN:
Category :
Languages : en
Pages : 416
Book Description
1987 IEEE International Symposium on Circuits and Systems
Author:
Publisher:
ISBN:
Category : Electric filters
Languages : en
Pages : 460
Book Description
Publisher:
ISBN:
Category : Electric filters
Languages : en
Pages : 460
Book Description
Dissertation Abstracts International
Author:
Publisher:
ISBN:
Category : Dissertations, Academic
Languages : en
Pages : 740
Book Description
Publisher:
ISBN:
Category : Dissertations, Academic
Languages : en
Pages : 740
Book Description
Defect and Fault Tolerance in VLSI Systems
Author: Israel Koren
Publisher: Springer Science & Business Media
ISBN: 1461567998
Category : Computers
Languages : en
Pages : 362
Book Description
This book contains an edited selection of papers presented at the International Workshop on Defect and Fault Tolerance in VLSI Systems held October 6-7, 1988 in Springfield, Massachusetts. Our thanks go to all the contributors and especially the members of the program committee for the difficult and time-consuming work involved in selecting the papers that were presented in the workshop and reviewing the papers included in this book. Thanks are also due to the IEEE Computer Society (in particular, the Technical Committee on Fault-Tolerant Computing and the Technical Committee on VLSI) and the University of Massachusetts at Amherst for sponsoring the workshop, and to the National Science Foundation for supporting (under grant number MIP-8803418) the keynote address and the distribution of this book to all workshop attendees. The objective of the workshop was to bring t. ogether researchers and practition ers from both industry and academia in the field of defect tolerance and yield en ha. ncement in VLSI to discuss their mutual interests in defect-tolerant architectures and models for integrated circuit defects, faults, and yield. Progress in this area was slowed down by the proprietary nature of yield-related data, and by the lack of appropriate forums for disseminating such information. The goal of this workshop was therefore to provide a forum for a dialogue and exchange of views. A follow-up workshop in October 1989, with C. H. Stapper from IBM and V. K. Jain from the University of South Florida as general co-chairmen, is being organized.
Publisher: Springer Science & Business Media
ISBN: 1461567998
Category : Computers
Languages : en
Pages : 362
Book Description
This book contains an edited selection of papers presented at the International Workshop on Defect and Fault Tolerance in VLSI Systems held October 6-7, 1988 in Springfield, Massachusetts. Our thanks go to all the contributors and especially the members of the program committee for the difficult and time-consuming work involved in selecting the papers that were presented in the workshop and reviewing the papers included in this book. Thanks are also due to the IEEE Computer Society (in particular, the Technical Committee on Fault-Tolerant Computing and the Technical Committee on VLSI) and the University of Massachusetts at Amherst for sponsoring the workshop, and to the National Science Foundation for supporting (under grant number MIP-8803418) the keynote address and the distribution of this book to all workshop attendees. The objective of the workshop was to bring t. ogether researchers and practition ers from both industry and academia in the field of defect tolerance and yield en ha. ncement in VLSI to discuss their mutual interests in defect-tolerant architectures and models for integrated circuit defects, faults, and yield. Progress in this area was slowed down by the proprietary nature of yield-related data, and by the lack of appropriate forums for disseminating such information. The goal of this workshop was therefore to provide a forum for a dialogue and exchange of views. A follow-up workshop in October 1989, with C. H. Stapper from IBM and V. K. Jain from the University of South Florida as general co-chairmen, is being organized.
Commencement
Author: University of Minnesota
Publisher:
ISBN:
Category : Commencement ceremonies
Languages : en
Pages : 138
Book Description
Publisher:
ISBN:
Category : Commencement ceremonies
Languages : en
Pages : 138
Book Description
Doctoral Degree Recipients
Author: University of Minnesota
Publisher:
ISBN:
Category : Dissertations, Academic
Languages : en
Pages : 276
Book Description
Publisher:
ISBN:
Category : Dissertations, Academic
Languages : en
Pages : 276
Book Description
Proceedings
Author:
Publisher:
ISBN:
Category : Integrated circuits
Languages : en
Pages : 624
Book Description
Publisher:
ISBN:
Category : Integrated circuits
Languages : en
Pages : 624
Book Description
Register of Doctoral Degrees Conferred by the University of Minnesota
Author: University of Minnesota
Publisher:
ISBN:
Category : Dissertations, Academic
Languages : en
Pages : 536
Book Description
Publisher:
ISBN:
Category : Dissertations, Academic
Languages : en
Pages : 536
Book Description