Computer Vision, Models And Inspection PDF Download
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Author: A David Marshall
Publisher: World Scientific
ISBN: 981452008X
Category : Computers
Languages : en
Pages : 457
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Book Description
The main focus of this book is on the uses of computer vision for inspection and model based matching. It also provides a short, self contained introductory course on computer vision. The authors describe various state-of-the-art approaches to probems and then set forth their proposed approach to matching and inspection. They deal primarily with 3-D vision but also discuss 2-D vision strategies when relevant.The book is suitable for researchers, final year undergraduates and graduate students. Useful review questions at the end of each chapter allow this book to be used for self-study.
Author: A David Marshall
Publisher: World Scientific
ISBN: 981452008X
Category : Computers
Languages : en
Pages : 457
Get Book
Book Description
The main focus of this book is on the uses of computer vision for inspection and model based matching. It also provides a short, self contained introductory course on computer vision. The authors describe various state-of-the-art approaches to probems and then set forth their proposed approach to matching and inspection. They deal primarily with 3-D vision but also discuss 2-D vision strategies when relevant.The book is suitable for researchers, final year undergraduates and graduate students. Useful review questions at the end of each chapter allow this book to be used for self-study.
Author: A. D. Marshall
Publisher:
ISBN:
Category :
Languages : en
Pages : 437
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Book Description
Author: Herbert Freeman
Publisher: Elsevier
ISBN: 0323155588
Category : Technology & Engineering
Languages : en
Pages : 333
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Book Description
Machine Vision for Inspection and Measurement contains the proceedings of the Second Annual Workshop on Machine Vision sponsored by the Center for Computer Aids for Industrial Productivity (CAIP) at Rutgers University and held on April 25-26, 1988 in New Brunswick, New Jersey. The papers explore the application of machine vision to inspection and measurement and cover topics such as the problem of object-pose estimation and depth recovery through inverse optics. The use of machine vision techniques in inspection of integrated circuits and semiconductor wafers is also discussed. Comprised of 11 chapters, this book opens with the problem of using fine-grained parallel machines for VLSI inspection. The discussion then turns to a variety of real-life applications of machine vision, including inspection of integrated circuits, semiconductor wafers, TV-tube glass, and mechanical parts. The use of machine vision to measure the curvature of the human cornea for vision correction and contact lens fitting purposes is also considered. The remaining chapters focus on motion estimation from stereo sequences using orthographic-view algorithms; photometric sampling for determining surface shape and reflectance; and efficient depth recovery by means of inverse optics. A chapter addresses the question of whether the industry is ready for machine vision and comes up with some optimistic predictions. This monograph will be of interest to practitioners in the fields of computer science and applied mathematics.
Author: Richard K. Miller
Publisher: Springer Science & Business Media
ISBN: 9780442237370
Category : Technology & Engineering
Languages : en
Pages : 222
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Book Description
Aimed at manufacturing managers and engineers looking for an introduction to computer vision and its potential, this book discusses the areas in which machine vision is being used, explains different types of machine vision hardware and software and summarizes research at several universities.
Author: R. Rosandich
Publisher: Springer Science & Business Media
ISBN: 1461312019
Category : Technology & Engineering
Languages : en
Pages : 311
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Book Description
A great deal of research is being done in the areas of artificial vision and neural networks. Although much of this research has been theoretical in nature, many of the techniques developed through these efforts are now mature enough for use in practical applications. Automated Visual Inspection Using Artificial Neural Networks explains the application of recently emerging technology in the areas of artificial vision and neural networks to automated visual inspection. The information is organised in a clear, informative manner, bridging the gap between theoretical research and practical application. Significantly this book includes: * broad coverage of all aspects of the automated visual inspection problem, * details of the HAVENET neural network and the CAMERA vision model, and * detailed descriptions of practical applications of intelligent visual inspection.
Author: C. H. Chen
Publisher: World Scientific
ISBN: 9812384731
Category : Computers
Languages : en
Pages : 1045
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Book Description
The very significant advances in computer vision and pattern recognition and their applications in the last few years reflect the strong and growing interest in the field as well as the many opportunities and challenges it offers. The second edition of this handbook represents both the latest progress and updated knowledge in this dynamic field. The applications and technological issues are particularly emphasized in this edition to reflect the wide applicability of the field in many practical problems. To keep the book in a single volume, it is not possible to retain all chapters of the first edition. However, the chapters of both editions are well written for permanent reference.
Author: Simon J. D. Prince
Publisher: Cambridge University Press
ISBN: 1139510568
Category : Computers
Languages : en
Pages : 599
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Book Description
This modern treatment of computer vision focuses on learning and inference in probabilistic models as a unifying theme. It shows how to use training data to learn the relationships between the observed image data and the aspects of the world that we wish to estimate, such as the 3D structure or the object class, and how to exploit these relationships to make new inferences about the world from new image data. With minimal prerequisites, the book starts from the basics of probability and model fitting and works up to real examples that the reader can implement and modify to build useful vision systems. Primarily meant for advanced undergraduate and graduate students, the detailed methodological presentation will also be useful for practitioners of computer vision. • Covers cutting-edge techniques, including graph cuts, machine learning and multiple view geometry • A unified approach shows the common basis for solutions of important computer vision problems, such as camera calibration, face recognition and object tracking • More than 70 algorithms are described in sufficient detail to implement • More than 350 full-color illustrations amplify the text • The treatment is self-contained, including all of the background mathematics • Additional resources at www.computervisionmodels.com
Author: Jürgen Beyerer
Publisher: Springer
ISBN: 3662477947
Category : Technology & Engineering
Languages : en
Pages : 802
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Book Description
The book offers a thorough introduction to machine vision. It is organized in two parts. The first part covers the image acquisition, which is the crucial component of most automated visual inspection systems. All important methods are described in great detail and are presented with a reasoned structure. The second part deals with the modeling and processing of image signals and pays particular regard to methods, which are relevant for automated visual inspection.
Author: Muthukumaran Malarvel
Publisher: John Wiley & Sons
ISBN: 1119682096
Category : Computers
Languages : en
Pages : 256
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Book Description
This edited book brings together leading researchers, academic scientists and research scholars to put forward and share their experiences and research results on all aspects of an inspection system for detection analysis for various machine vision applications. It also provides a premier interdisciplinary platform to present and discuss the most recent innovations, trends, methodology, applications, and concerns as well as practical challenges encountered and solutions adopted in the inspection system in terms of image processing and analytics of machine vision for real and industrial application. Machine vision inspection systems (MVIS) utilized all industrial and non-industrial applications where the execution of their utilities based on the acquisition and processing of images. MVIS can be applicable in industry, governmental, defense, aerospace, remote sensing, medical, and academic/education applications but constraints are different. MVIS entails acceptable accuracy, high reliability, high robustness, and low cost. Image processing is a well-defined transformation between human vision and image digitization, and their techniques are the foremost way to experiment in the MVIS. The digital image technique furnishes improved pictorial information by processing the image data through machine vision perception. Digital image processing has widely been used in MVIS applications and it can be employed to a wide diversity of problems particularly in Non-Destructive testing (NDT), presence/absence detection, defect/fault detection (weld, textile, tiles, wood, etc.,), automated vision test & measurement, pattern matching, optical character recognition & verification (OCR/OCV), barcode reading and traceability, medical diagnosis, weather forecasting, face recognition, defence and space research, etc. This edited book is designed to address various aspects of recent methodologies, concepts and research plan out to the readers for giving more depth insights for perusing research on machine vision using image processing techniques.
Author: L.F Pau
Publisher: Springer Science & Business Media
ISBN: 1461305071
Category : Computers
Languages : en
Pages : 324
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Book Description
DEFECT PROPORTION OF DETECTION INITIAL RATE DETECTION RATE INSPECTOR 3 COMPLEXITY OF TIMES PAN OF PERFORMING o~ ________________________ o~ ______________________ __ -;. INSPECTION TASK -;. VISUAL INSPECTION Fagure 1. Trends in relations between the complexity of inspection tasks, defect detection rates (absolute and relative), and inspection time. Irrespective of the necessities described above, and with the excep tion of specific generic application systems (e.g., bare-board PCB inspection, wafer inspection, solder joint inspection, linewidth measure ment), vision systems are still not found frequently in today's electronics factories. Besides cost, some major reasons for this absence are: 1. The detection robustness or accuracy is still insufficient. 2. The total inspection time is often too high, although this can frequently be attributed to mechanical handling or sensing. 3. There are persistent gaps among process engineers, CAD en gineers, manufacturing engineers, test specialists, and computer vision specialists, as problems dominate the day-to-day interac tions and prevent the establishment of trust. 4. Computer vision specialists sometimes still believe that their contributions are universal, so that adaptation to each real problem becomes tedious, or stumbles over the insufficient availabIlity of multidisciplinary expertise. Whether we like it or not, we must still use appropriate sensors, lighting, and combina tions of algorithms for each class of applications; likewise, we cannot design mechanical handling, illumination, and sensing in isolation from each other.
