Computed Electron Micrographs And Defect Identification PDF Download
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Author: A.K. Head
Publisher: Elsevier
ISBN: 0444601473
Category : Computers
Languages : en
Pages : 413
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Book Description
Computed Electron Micrographs and Defect Identification illustrates a technique for identifying defects in crystalline solids by the comparison of their images, which are produced in the electron microscope, with corresponding theoretical images. This book discusses the diffraction of electrons by a crystal; the two-beam dynamical equations; the absorption parameters; the deviation of the crystal from the Bragg reflecting position; the extinction distance; the displacement vector; and the foil normal. Chapter three presents the experimental techniques for determination of beam direction, defect line normal, foil normal, foil thickness, and extinction distance. Chapters four to seven explore ONEDIS and TWODIS and their principles. Chapters eight and nine focus on the application and limitations of the technique, while the last chapter explores the different computer programs related to the technique. Post-graduate students, as well as researchers using transmission electron microscopy for studying defects in crystalline solids, will find this book invaluable.
Author: A.K. Head
Publisher: Elsevier
ISBN: 0444601473
Category : Computers
Languages : en
Pages : 413
Get Book Here
Book Description
Computed Electron Micrographs and Defect Identification illustrates a technique for identifying defects in crystalline solids by the comparison of their images, which are produced in the electron microscope, with corresponding theoretical images. This book discusses the diffraction of electrons by a crystal; the two-beam dynamical equations; the absorption parameters; the deviation of the crystal from the Bragg reflecting position; the extinction distance; the displacement vector; and the foil normal. Chapter three presents the experimental techniques for determination of beam direction, defect line normal, foil normal, foil thickness, and extinction distance. Chapters four to seven explore ONEDIS and TWODIS and their principles. Chapters eight and nine focus on the application and limitations of the technique, while the last chapter explores the different computer programs related to the technique. Post-graduate students, as well as researchers using transmission electron microscopy for studying defects in crystalline solids, will find this book invaluable.
Author: L.M Clarebrough
Publisher: Routledge
ISBN: 1351453203
Category : Science
Languages : en
Pages : 435
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Book Description
Electron Microscopy of Interfaces in Metals and Alloys examines the structure of interfaces in metals and alloys using transmission electron microscopy. The book presents quantitative methods of analysis and reviews the most significant work on interface structure over the last 20 years. It provides the first book description of the methods used for quantitative identification of Burgers vectors of interfacial dislocations, including the geometric analysis of periodicities in interface structure and the comparison of experimental and theoretical electron micrographs. The book explores low- and high-angle grain boundaries and interphase interfaces between neighboring grains, emphasizing interfacial dislocations and rigid-body displacements to the structure and properties of interfaces. It also analyzes the use of two-beam images and diffraction patterns for analysis and studies n-beam lattice imaging. The book includes numerous worked examples of the analysis of the structure of grain boundaries and interphase interfaces, which are particularly useful to those who need to consider the nature of intercrystalline interfaces.
Author: Brent Fultz
Publisher: Springer Science & Business Media
ISBN: 3642297617
Category : Science
Languages : en
Pages : 764
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Book Description
This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The fourth edition adds important new techniques of TEM such as electron tomography, nanobeam diffraction, and geometric phase analysis. A new chapter on neutron scattering completes the trio of x-ray, electron and neutron diffraction. All chapters were updated and revised for clarity. The book explains the fundamentals of how waves and wavefunctions interact with atoms in solids, and the similarities and differences of using x-rays, electrons, or neutrons for diffraction measurements. Diffraction effects of crystalline order, defects, and disorder in materials are explained in detail. Both practical and theoretical issues are covered. The book can be used in an introductory-level or advanced-level course, since sections are identified by difficulty. Each chapter includes a set of problems to illustrate principles, and the extensive Appendix includes laboratory exercises.
Author: Peter Buseck
Publisher: Oxford University Press
ISBN: 0195364651
Category : Science
Languages : en
Pages : 668
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Book Description
This book provides an introduction to the fundamental concepts, techniques, and methods used for electron microscopy at high resolution in space, energy, and even in time. It delineates the theory of elastic scattering, which is most useful for spectroscopic and chemical analyses. There are also discussions of the theory and practice of image calculations, and applications of HRTEM to the study of solid surfaces, highly disordered materials, solid state chemistry, mineralogy, semiconductors and metals. Contributors include J. Cowley, J. Spence, P. Buseck, P. Self, and M.A. O'Keefe. Compiled by experts in the fields of geology, physics and chemistry, this comprehensive text will be the standard reference for years to come.
Author: Ludwig Reimer
Publisher: Springer
ISBN: 0387347585
Category : Science
Languages : en
Pages : 602
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Book Description
The aim of this monograph is to outline the physics of image formation, electron–specimen interactions, and image interpretation in transmission el- tron microscopy. Since the last edition, transmission electron microscopy has undergone a rapid evolution. The introduction of monochromators and - proved energy ?lters has allowed electron energy-loss spectra with an energy resolution down to about 0.1 eV to be obtained, and aberration correctors are now available that push the point-to-point resolution limit down below 0.1 nm. After the untimely death of Ludwig Reimer, Dr. Koelsch from Springer- Verlag asked me if I would be willing to prepare a new edition of the book. As it had served me as a reference for more than 20 years, I agreed without hesitation. Distinct from more specialized books on speci?c topics and from books intended for classroom teaching, the Reimer book starts with the basic principles and gives a broad survey of the state-of-the-art methods, comp- mented by a list of references to allow the reader to ?nd further details in the literature. The main objective of this revised edition was therefore to include the new developments but leave the character of the book intact. The presentation of the material follows the format of the previous e- tion as outlined in the preface to that volume, which immediately follows. A few derivations have been modi?ed to correspond more closely to modern textbooks on quantum mechanics, scattering theory, or solid state physics.
Author: P.E. Champness
Publisher: Springer Science & Business Media
ISBN: 3642661963
Category : Science
Languages : en
Pages : 574
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Book Description
During the last five years transmission electron microscopy (TEM) has added numerous important new data to mineralogy and has considerably changed its outlook. This is partly due to the fact that metallurgists and crystal physicists having solved most of the structural and crystallographic problems in metals have begun to show a widening interest in the much more complicated structures of minerals, and partly to recent progress in experimental techniques, mainly the availability of ion-thinning devices. While electron microscopists have become increasingly interested in minerals (judging from special symposia at recent meetings such as Fifth European Congress on Electron microscopy, Man chester 1972; Eight International Congress on Electron Microscopy, Canberra 1974) mineralogists have realized advantages of the new technique and applied it with increasing frequency. In an effort to coordinate the growing quantity of research, electron microscopy sessions have been included in meetings of mineralogists (e. g. Geological Society of America, Minneapolis, 1972, American Crystallographic Association, Berkeley, 1974). The tremendous response for the TEM symposium which H. -R. Wenk and G. Thomas organized at the Berkeley Conference of the American Crystallographic Association formed the basis for this book. It appeared useful at this stage to summarize the achievements of electron microscopy, scattered in many different journals in several different fields and present them to mineralogists. A group of participants as the Berkeley symposium formed an Editorial Committee and outlined the content of this book.
Author: Marc De Graef
Publisher: Cambridge University Press
ISBN: 9780521629959
Category : Science
Languages : en
Pages : 718
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Book Description
A graduate level textbook covering the fundamentals of conventional transmission electron microscopy, first published in 2003.
Author: John C. H. Spence
Publisher: OUP Oxford
ISBN: 0191508403
Category : Science
Languages : en
Pages : 427
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Book Description
This new fourth edition of the standard text on atomic-resolution transmission electron microscopy (TEM) retains previous material on the fundamentals of electron optics and aberration correction, linear imaging theory (including wave aberrations to fifth order) with partial coherence, and multiple-scattering theory. Also preserved are updated earlier sections on practical methods, with detailed step-by-step accounts of the procedures needed to obtain the highest quality images of atoms and molecules using a modern TEM or STEM electron microscope. Applications sections have been updated - these include the semiconductor industry, superconductor research, solid state chemistry and nanoscience, and metallurgy, mineralogy, condensed matter physics, materials science and material on cryo-electron microscopy for structural biology. New or expanded sections have been added on electron holography, aberration correction, field-emission guns, imaging filters, super-resolution methods, Ptychography, Ronchigrams, tomography, image quantification and simulation, radiation damage, the measurement of electron-optical parameters, and detectors (CCD cameras, Image plates and direct-injection solid state detectors). The theory of Scanning transmission electron microscopy (STEM) and Z-contrast are treated comprehensively. Chapters are devoted to associated techniques, such as energy-loss spectroscopy, Alchemi, nanodiffraction, environmental TEM, twisty beams for magnetic imaging, and cathodoluminescence. Sources of software for image interpretation and electron-optical design are given.
Author: Zhiping Luo
Publisher: Momentum Press
ISBN: 1606507044
Category : Technology & Engineering
Languages : en
Pages : 140
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Book Description
Transmission Electron Microscope (TEM) is a very powerful tool for characterizing various types of materials. Using a light microscope, the imaging resolution is at several hundred nanometers, and for a Scanning Electron Microscope (SEM) at several nanometers. The imaging resolution of the TEM, however, can routinely reach several angstroms on a modem instrument. In addition, the TEM can also provide material structural information, since the electrons penetrate through the thin specimens, and chemical compositional information due to the strong electron-specimen atom interactions. This book provides a concise practical guide to the TEM user, starting from the beginner level, including upper-division undergraduates, graduates, researchers, and engineers, on how to learn TEM efficiently in a short period of time. It covers most of the areas using TEM, including the instrumentation, sample preparation, diffraction, imaging, analytical microscopy, and some newly developed advanced microscopy techniques. This book may serve as a textbook for a TEM course or workshop, or a reference book for the TEM user to improve their TEM skills.
Author: David B. Williams
Publisher: Springer Science & Business Media
ISBN: 0387765018
Category : Technology & Engineering
Languages : en
Pages : 805
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Book Description
This profusely illustrated text on Transmission Electron Microscopy provides the necessary instructions for successful hands-on application of this versatile materials characterization technique. The new edition also includes an extensive collection of questions for the student, providing approximately 800 self-assessment questions and over 400 questions suitable for homework assignment.
