Author: M. Meyyappan
Publisher: Artech House Publishers
ISBN:
Category : Computers
Languages : en
Pages : 384
Book Description
This book provides you with in-depth coverage of the models, governing equations, and numerical techniques suitable for process simulation -- so you can give your designs the competitive edge. You will understand the basic principles of transport phenomena, gas phase, and surface reactions in electronics material processing, and learn practical numerical techniques used in process simulations.
Computational Modeling in Semiconductor Processing
Author: M. Meyyappan
Publisher: Artech House Publishers
ISBN:
Category : Computers
Languages : en
Pages : 384
Book Description
This book provides you with in-depth coverage of the models, governing equations, and numerical techniques suitable for process simulation -- so you can give your designs the competitive edge. You will understand the basic principles of transport phenomena, gas phase, and surface reactions in electronics material processing, and learn practical numerical techniques used in process simulations.
Publisher: Artech House Publishers
ISBN:
Category : Computers
Languages : en
Pages : 384
Book Description
This book provides you with in-depth coverage of the models, governing equations, and numerical techniques suitable for process simulation -- so you can give your designs the competitive edge. You will understand the basic principles of transport phenomena, gas phase, and surface reactions in electronics material processing, and learn practical numerical techniques used in process simulations.
Production Planning and Control for Semiconductor Wafer Fabrication Facilities
Author: Lars Mönch
Publisher: Springer Science & Business Media
ISBN: 1461444713
Category : Business & Economics
Languages : en
Pages : 298
Book Description
Over the last fifty-plus years, the increased complexity and speed of integrated circuits have radically changed our world. Today, semiconductor manufacturing is perhaps the most important segment of the global manufacturing sector. As the semiconductor industry has become more competitive, improving planning and control has become a key factor for business success. This book is devoted to production planning and control problems in semiconductor wafer fabrication facilities. It is the first book that takes a comprehensive look at the role of modeling, analysis, and related information systems for such manufacturing systems. The book provides an operations research- and computer science-based introduction into this important field of semiconductor manufacturing-related research.
Publisher: Springer Science & Business Media
ISBN: 1461444713
Category : Business & Economics
Languages : en
Pages : 298
Book Description
Over the last fifty-plus years, the increased complexity and speed of integrated circuits have radically changed our world. Today, semiconductor manufacturing is perhaps the most important segment of the global manufacturing sector. As the semiconductor industry has become more competitive, improving planning and control has become a key factor for business success. This book is devoted to production planning and control problems in semiconductor wafer fabrication facilities. It is the first book that takes a comprehensive look at the role of modeling, analysis, and related information systems for such manufacturing systems. The book provides an operations research- and computer science-based introduction into this important field of semiconductor manufacturing-related research.
Proceedings of the Symposium Om Process Control, Diagnostics, and Modeling in Semiconductor Manufacturing
Author: M. Meyyappan
Publisher: The Electrochemical Society
ISBN: 9781566770965
Category : Technology & Engineering
Languages : en
Pages : 644
Book Description
Publisher: The Electrochemical Society
ISBN: 9781566770965
Category : Technology & Engineering
Languages : en
Pages : 644
Book Description
Semiconductor Modeling:
Author: Roy Leventhal
Publisher: Springer Science & Business Media
ISBN: 0387241604
Category : Technology & Engineering
Languages : en
Pages : 769
Book Description
Discusses process variation, model accuracy, design flow and many other practical engineering, reliability and manufacturing issues Gives a good overview for a person who is not an expert in modeling and simulation, enabling them to extract the necessary information to competently use modeling and simulation programs Written for engineering students and product design engineers
Publisher: Springer Science & Business Media
ISBN: 0387241604
Category : Technology & Engineering
Languages : en
Pages : 769
Book Description
Discusses process variation, model accuracy, design flow and many other practical engineering, reliability and manufacturing issues Gives a good overview for a person who is not an expert in modeling and simulation, enabling them to extract the necessary information to competently use modeling and simulation programs Written for engineering students and product design engineers
CVD XV
Author: Mark Donald Allendorf
Publisher: The Electrochemical Society
ISBN: 9781566772785
Category : Technology & Engineering
Languages : en
Pages : 826
Book Description
Publisher: The Electrochemical Society
ISBN: 9781566772785
Category : Technology & Engineering
Languages : en
Pages : 826
Book Description
Computational Science - ICCS 2003. Part 1.
Author: Peter Sloot
Publisher: Springer Science & Business Media
ISBN: 3540401946
Category : Computers
Languages : en
Pages : 1124
Book Description
The four-volume set LNCS 2657, LNCS 2658, LNCS 2659, and LNCS 2660 constitutes the refereed proceedings of the Third International Conference on Computational Science, ICCS 2003, held concurrently in Melbourne, Australia and in St. Petersburg, Russia in June 2003. The four volumes present more than 460 reviewed contributed and invited papers and span the whole range of computational science, from foundational issues in computer science and algorithmic mathematics to advanced applications in virtually all application fields making use of computational techniques. These proceedings give a unique account of recent results in the field.
Publisher: Springer Science & Business Media
ISBN: 3540401946
Category : Computers
Languages : en
Pages : 1124
Book Description
The four-volume set LNCS 2657, LNCS 2658, LNCS 2659, and LNCS 2660 constitutes the refereed proceedings of the Third International Conference on Computational Science, ICCS 2003, held concurrently in Melbourne, Australia and in St. Petersburg, Russia in June 2003. The four volumes present more than 460 reviewed contributed and invited papers and span the whole range of computational science, from foundational issues in computer science and algorithmic mathematics to advanced applications in virtually all application fields making use of computational techniques. These proceedings give a unique account of recent results in the field.
Intelligent Modeling, Diagnosis And Control Of Manufacturing Processes
Author: B-t Chu
Publisher: World Scientific
ISBN: 9814520446
Category : Phase space (Statistical physics)
Languages : en
Pages : 273
Book Description
This volume demonstrates that the key to the modeling, diagnosis and control of the next generation manufacturing processes is to integrate knowledge-based systems with traditional techniques. An up-to-date study is given here of this relatively recent development.The book is for those working primarily with traditional techniques and those working in the knowledge-based systems field. Both sets of readers will find it to be a source of many specific ideas about the integration of knowledge-based systems with traditional techniques, and carrying a wealth of useful references.
Publisher: World Scientific
ISBN: 9814520446
Category : Phase space (Statistical physics)
Languages : en
Pages : 273
Book Description
This volume demonstrates that the key to the modeling, diagnosis and control of the next generation manufacturing processes is to integrate knowledge-based systems with traditional techniques. An up-to-date study is given here of this relatively recent development.The book is for those working primarily with traditional techniques and those working in the knowledge-based systems field. Both sets of readers will find it to be a source of many specific ideas about the integration of knowledge-based systems with traditional techniques, and carrying a wealth of useful references.
Journal of Research of the National Institute of Standards and Technology
Author:
Publisher:
ISBN:
Category : Measurement
Languages : en
Pages : 476
Book Description
Publisher:
ISBN:
Category : Measurement
Languages : en
Pages : 476
Book Description
Computational Methods of Multi-Physics Problems
Author: Timon Rabczuk
Publisher: MDPI
ISBN: 3039214179
Category : Technology & Engineering
Languages : en
Pages : 128
Book Description
This book offers a collection of six papers addressing problems associated with the computational modeling of multi-field problems. Some of the proposed contributions present novel computational techniques, while other topics focus on applying state-of-the-art techniques in order to solve coupled problems in various areas including the prediction of material failure during the lithiation process, which is of major importance in batteries; efficient models for flexoelectricity, which require higher-order continuity; the prediction of composite pipes under thermomechanical conditions; material failure in rock; and computational materials design. The latter exploits nano-scale modeling in order to predict various material properties for two-dimensional materials with applications in, for example, semiconductors. In summary, this book provides a good overview of the computational modeling of different multi-field problems.
Publisher: MDPI
ISBN: 3039214179
Category : Technology & Engineering
Languages : en
Pages : 128
Book Description
This book offers a collection of six papers addressing problems associated with the computational modeling of multi-field problems. Some of the proposed contributions present novel computational techniques, while other topics focus on applying state-of-the-art techniques in order to solve coupled problems in various areas including the prediction of material failure during the lithiation process, which is of major importance in batteries; efficient models for flexoelectricity, which require higher-order continuity; the prediction of composite pipes under thermomechanical conditions; material failure in rock; and computational materials design. The latter exploits nano-scale modeling in order to predict various material properties for two-dimensional materials with applications in, for example, semiconductors. In summary, this book provides a good overview of the computational modeling of different multi-field problems.
Semiconductor Device Modeling with Spice
Author: Giuseppe Massabrio
Publisher: McGraw Hill Professional
ISBN: 9780071349550
Category : Technology & Engineering
Languages : en
Pages : 500
Book Description
Publisher's Note: Products purchased from Third Party sellers are not guaranteed by the publisher for quality, authenticity, or access to any online entitlements included with the product.
Publisher: McGraw Hill Professional
ISBN: 9780071349550
Category : Technology & Engineering
Languages : en
Pages : 500
Book Description
Publisher's Note: Products purchased from Third Party sellers are not guaranteed by the publisher for quality, authenticity, or access to any online entitlements included with the product.