Comparison of Two Built-in Test Pattern Generation Methods for Test Set Embedding Problem PDF Download
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Author: Yonglian Wang
Publisher:
ISBN:
Category : Shift registers
Languages : en
Pages : 128
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Book Description
Author: Yonglian Wang
Publisher:
ISBN:
Category : Shift registers
Languages : en
Pages : 128
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Book Description
Author:
Publisher: Allied Publishers
ISBN: 9788177645583
Category :
Languages : en
Pages : 658
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Book Description
Author: Digital Equipment Corporation. Western Research Laboratory
Publisher:
ISBN:
Category : Electronic circuits
Languages : en
Pages :
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Book Description
The first paper, Efficient Generation of Test Patterns Using Boolean Difference, gives an overview of a successful test pattern generation system using the Boolean satisfiability method. The second paper, A Framework for Evaluating Test Pattern Generation Strategies, describes potential test pattern generation heuristics and their efficacy in the Boolean satisfiability system."
Author: Gautam Das
Publisher: Springer
ISBN: 3540305610
Category : Computers
Languages : en
Pages : 438
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Book Description
The 7th International Conference on Information Technology (CIT 2004) was held in Hyderabad, India, during December 20–23, 2004. The CIT 2004 was a forum where researchers from various areas of information technology and its applications could stimulate and exchange ideas on technological advancements. CIT, organizedby the Orissa InformationTechnologySociety (OITS), has emerged as one of the major international conferences in India and is fast becoming the premier forum for the presentation of the latest research and development in the critical area of information technology. The last six conferences attracted reputed researchers from around the world, and CIT 2004 took this trend forward. This conference focused on the latest research ?ndings on all topics in the area of information technology. Although the natural focus was on computer science issues, research results contributed from management, business and other disciplines formed an integral part. We received more than 200 papers from over 27 countries in the areas of com- tational intelligence, neural networks, mobile and adhoc networks, security, databases, softwareengineering,signal andimageprocessing,andInternetandWWW-basedc- puting. The programme committee, consisting of eminent researchers, academicians and practitioners, ?nally selected 43 full papers on the basis of reviewer grades. This proceedings contains the research papers selected for presentation at the c- ference and this is the ?rst time that the proceedingshave been published in the Lecture Notes in Computer Science (LNCS) series. The poster papers are being printed as a separate conference proceedings.
Author: Luciano Lavagno
Publisher: CRC Press
ISBN: 1482254638
Category : Technology & Engineering
Languages : en
Pages : 644
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Book Description
The first of two volumes in the Electronic Design Automation for Integrated Circuits Handbook, Second Edition, Electronic Design Automation for IC System Design, Verification, and Testing thoroughly examines system-level design, microarchitectural design, logic verification, and testing. Chapters contributed by leading experts authoritatively discuss processor modeling and design tools, using performance metrics to select microprocessor cores for integrated circuit (IC) designs, design and verification languages, digital simulation, hardware acceleration and emulation, and much more. New to This Edition: Major updates appearing in the initial phases of the design flow, where the level of abstraction keeps rising to support more functionality with lower non-recurring engineering (NRE) costs Significant revisions reflected in the final phases of the design flow, where the complexity due to smaller and smaller geometries is compounded by the slow progress of shorter wavelength lithography New coverage of cutting-edge applications and approaches realized in the decade since publication of the previous edition—these are illustrated by new chapters on high-level synthesis, system-on-chip (SoC) block-based design, and back-annotating system-level models Offering improved depth and modernity, Electronic Design Automation for IC System Design, Verification, and Testing provides a valuable, state-of-the-art reference for electronic design automation (EDA) students, researchers, and professionals.
Author: Wai-Kai Chen
Publisher: CRC Press
ISBN: 020301023X
Category : Technology & Engineering
Languages : en
Pages : 386
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Book Description
Timing, memory, power dissipation, testing, and testability are all crucial elements of VLSI circuit design. In this volume culled from the popular VLSI Handbook, experts from around the world provide in-depth discussions on these and related topics. Stacked gate, embedded, and flash memory all receive detailed treatment, including their power cons
Author:
Publisher:
ISBN:
Category : Application-specific integrated circuits
Languages : en
Pages : 504
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Book Description
Author: Sajal K. Das
Publisher: Springer Science & Business Media
ISBN: 354000355X
Category : Computers
Languages : en
Pages : 368
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Book Description
This book constitutes the refereed proceedings of the 4th International Workshop on Distributed Computing, IWDC 2002, held in Calcutta, India, in December 2002. The 31 revised full papers and 3 student papers presented together with 3 keynote papers were carefully reviewed and selected from more than 90 submissions. The papers are organized in topical sections on Web caching, distributed computing, wireless networks, wireless mobile systems, VLSI and parallel systems, optical networks, and distributed systems.
Author:
Publisher:
ISBN:
Category : Computer engineering
Languages : en
Pages : 1030
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Book Description
Author: Dimitris Gizopoulos
Publisher: Springer Science & Business Media
ISBN: 1402028016
Category : Computers
Languages : en
Pages : 226
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Book Description
Embedded Processor-Based Self-Test is a guide to self-testing strategies for embedded processors. Embedded processors are regularly used today in most System-on-Chips (SoCs). Testing of microprocessors and embedded processors has always been a challenge because most traditional testing techniques fail when applied to them. This is due to the complex sequential structure of processor architectures, which consists of high performance datapath units and sophisticated control logic for performance optimization. Structured Design-for-Testability (DfT) and hardware-based self-testing techniques, which usually have a non-trivial impact on a circuit’s performance, size and power, can not be applied without serious consideration and careful incorporation into the processor design. Embedded Processor-Based Self-Test shows how the powerful embedded functionality that processors offer can be utilized as a self-testing resource. Through a discussion of different strategies the book emphasizes on the emerging area of Software-Based Self-Testing (SBST). SBST is based on the idea of execution of embedded software programs to perform self-testing of the processor itself and its surrounding blocks in the SoC. SBST is a low-cost strategy in terms of overhead (area, speed, power), development effort and test application cost, as it is applied using low-cost, low-speed test equipment. Embedded Processor-Based Self-Test can be used by designers, DfT engineers, test practitioners, researchers and students working on digital testing, and in particular processor and SoC test. This book sets the framework for comparisons among different SBST methodologies by discussing key requirements. It presents successful applications of SBST to a number of embedded processors of different complexities and instruction set architectures.
