Characterization of Diffusion Processes in Thin Polymer Films Via Optical Waveguide Techniques PDF Download
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Author:
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Languages : en
Pages :
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Author:
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Category :
Languages : en
Pages :
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Author: Nicholas Francis Fell
Publisher:
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Category :
Languages : en
Pages : 270
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Category : Dissertations, Academic
Languages : en
Pages : 868
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Category : Dissertation abstracts
Languages : en
Pages : 784
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Author:
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Category : Aeronautics
Languages : en
Pages : 704
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Author: Marvin Young Paik
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Category :
Languages : en
Pages : 0
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Polymers have been used in thin film coatings as a way to produce tailor made surfaces. These thin films have been explored for use in a variety of applications to produce antifouling coatings, corrosion resistant coatings, biocompatible surfaces, and biomedical devices. Polymer brushes, polymer chains tethered to a substrate or surface, synthesized by surface-initiated polymerization have gained significant attention in recent years. As brushes offer a new pathway towards the preparation of functional surfaces and offer long term stability, even in adverse environments, they are attractive for use as high-tech coatings. Patterned polymer thin films have also seen growing interest for various applications. This dissertation will focus on the top-down direct patterning of polymer brushes and the bottom-up self-assembly of block copolymer thin films. A new approach to creating patterned polymer brushes is highlighted, which is a simpler approach than what is conventionally done. Various polymer brushes were patterned directly using electron beam lithography to create high resolution patterned polymer brushes in a single step. This method was then used to demonstrate the unique ability to create sub-surface patterns within the brush. Additionally, direct patterning was used to create high resolution patterned binary polymer brushes of PMMA and PEGMA. With this binary patterned surface, a surface that responds to its local environment was created. This thesis also details characterization techniques used in probing polymer thin films to better understand how to improve block copolymer self-assembly. By using a powerful technique called grazing incidence small angle X-ray scattering (GISAXS) on solvent vapor annealed block copolymer thin films while monitoring the solvent vapor swollen film thickness and controlling the film swelling with a nitrogen counterflow, the work presented demonstrates how to accurately determine the processing conditions necessary for the annealing process to take place. This process also provides information as to what changes are occurring during the annealing process. Another characterization technique known as near edge X-ray absorption fine structure (NEXAFS) is also highlighted. A more exact calculation of the electron escape depth (EED) for NEXAFS is done using polymer brushes as the calibration sample. With this information, we can do composition depth profiling on our polymer thin films to identify what is at the surface.
Author: Materials Research Society. Meeting
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Category : Medical
Languages : en
Pages : 232
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Polymers for orthopedic and reconstructive surgery. Polymers for drug delivery and tissue engineering. Synthesis and characterization of biomedical polymers.
Author: Roger A. Lessard
Publisher: SPIE-International Society for Optical Engineering
ISBN:
Category : Science
Languages : en
Pages : 562
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Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.
Author: National Institute of Standards and Technology (U.S.)
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Category : Government publications
Languages : en
Pages : 424
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Author: Ho-ming Herbert Tong
Publisher: Wiley-Interscience
ISBN:
Category : Science
Languages : en
Pages : 406
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Various industries and universities have aimed their activities toward the development of highly sensitive techniques capable of studying ultrathin polymer films. Provides researchers with a working description of the principles of operation, areas of application and data analysis methods for some of the newly developed techniques, as well as sufficient references for future in-depth studies of thin polymer films. The techniques covered are divided into two groups--bulk property measurements and surface/interface property measurements--with chapters covering microdielectrometry, stress measurement by x-ray diffraction, laser interferometry, ion beam analysis, photothermal analysis, and XPS/SIMS/AES, among other techniques. Abstracts for each of the chapters are conveniently located in the preface.
