Characterization of a Home-built Low Temperature Scanning Probe Microscopy System PDF Download
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Author: Quang Thanh Thai
Publisher:
ISBN:
Category :
Languages : en
Pages : 157
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Author: Quang Thanh Thai
Publisher:
ISBN:
Category :
Languages : en
Pages : 157
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Author: Nigel David
Publisher:
ISBN:
Category : Hall effect
Languages : en
Pages : 0
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Book Description
Scanning Hall probe microscopy, which uses a Hall-effect sensor to non-invasively image magnetic fields at the surface of samples, is a powerful tool in condensed matter physics that can be used to study magnetism on mesoscopic length scales. The work done for this thesis was in the design, construction and characterization of a low temperature scanning Hall probe microscope for our lab. We have based some parts of our design, such as the m - range piezo scanner, on other microscopes in the field. However, components such as the "double-gimbal" rotation stage for the sensor, and the sample stage with capacitive touch-down sensor and thermal control, are unique to our design. Already the first of its kind in Canada, with the intended addition of a scanning near-field optical probe to the same scanhead as the Hall probe, this microscope will have unique features not available in any other lab.
Author: Dalia G. Yablon
Publisher: John Wiley & Sons
ISBN: 111872304X
Category : Technology & Engineering
Languages : en
Pages : 337
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Book Description
Describes new state-of-the-science tools and their contribution to industrial R&D With contributions from leading international experts in the field, this book explains how scanning probe microscopy is used in industry, resulting in improved product formulation, enhanced processes, better quality control and assurance, and new business opportunities. Readers will learn about the use of scanning probe microscopy to support R&D efforts in the semiconductor, chemical, personal care product, biomaterial, pharmaceutical, and food science industries, among others. Scanning Probe Microscopy in Industrial Applications emphasizes nanomechanical characterization using scanning probe microscopy. The first half of the book is dedicated to a general overview of nanomechanical characterization methods, offering a complete practical tutorial for readers who are new to the topic. Several chapters include worked examples of useful calculations such as using Hertz mechanics with and without adhesion to model a contact, step-by-step instructions for simulations to guide cantilever selection for an experiment, and data analysis procedures for dynamic contact experiments. The second half of the book describes applications of nanomechanical characterization in industry, including: New formulation development for pharmaceuticals Measurement of critical dimensions and thin dielectric films in the semiconductor industry Effect of humidity and temperature on biomaterials Characterization of polymer blends to guide product formulation in the chemicals sector Unraveling links between food structure and function in the food industry Contributions are based on the authors' thorough review of the current literature as well as their own firsthand experience applying scanning probe microscopy to solve industrial R&D problems. By explaining the fundamentals before advancing to applications, Scanning Probe Microscopy in Industrial Applications offers a complete treatise that is accessible to both novices and professionals. All readers will discover how to apply scanning probe microscopy to build and enhance their R&D efforts.
Author: Paula Maria Vilarinho
Publisher: Springer Science & Business Media
ISBN: 9781402030178
Category :
Languages : en
Pages : 530
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Author: James Augustin Hedberg
Publisher:
ISBN:
Category :
Languages : en
Pages :
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Author: Nigel D. Browning
Publisher: Cambridge University Press
ISBN: 1139429167
Category : Science
Languages : en
Pages : 409
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Book Description
This is a clear account of the application of electron-based microscopies to the study of high-Tc superconductors. Written by leading experts, this compilation provides a comprehensive review of scanning electron microscopy, transmission electron microscopy and scanning transmission electron microscopy, together with details of each technique and its applications. Introductory chapters cover the basics of high-resolution transmission electron microscopy, including a chapter devoted to specimen preparation techniques, and microanalysis by scanning transmission electron microscopy. Ensuing chapters examine identification of superconducting compounds, imaging of superconducting properties by low-temperature scanning electron microscopy, imaging of vortices by electron holography and electronic structure determination by electron energy loss spectroscopy. The use of scanning tunnelling microscopy for exploring surface morphology, growth processes and the mapping of superconducting carrier distributions is discussed. Final chapters consider applications of electron microscopy to the analysis of grain boundaries, thin films and device structures. Detailed references are included.
Author: Gero Wittich
Publisher:
ISBN:
Category :
Languages : en
Pages : 114
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Book Description
Author: Vladimir V. Tsukruk
Publisher: John Wiley & Sons
ISBN: 3527639969
Category : Technology & Engineering
Languages : en
Pages : 663
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Book Description
Well-structured and adopting a pedagogical approach, this self-contained monograph covers the fundamentals of scanning probe microscopy, showing how to use the techniques for investigating physical and chemical properties on the nanoscale and how they can be used for a wide range of soft materials. It concludes with a section on the latest techniques in nanomanipulation and patterning. This first book to focus on the applications is a must-have for both newcomers and established researchers using scanning probe microscopy in soft matter research. From the contents: * Atomic Force Microscopy and Other Advanced Imaging Modes * Probing of Mechanical, Thermal Chemical and Electrical Properties * Amorphous, Poorly Ordered and Organized Polymeric Materials * Langmuir-Blodgett and Layer-by-Layer Structures * Multi-Component Polymer Systems and Fibers * Colloids and Microcapsules * Biomaterials and Biological Structures * Nanolithography with Intrusive AFM Tipand Dip-Pen Nanolithography * Microcantilever-Based Sensors
Author: Seizo Morita
Publisher: Springer Science & Business Media
ISBN: 3540343156
Category : Technology & Engineering
Languages : en
Pages : 207
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Book Description
Scanning tunneling microscopy has achieved remarkable progress and become the key technology for surface science. This book predicts the future development for all of scanning probe microscopy (SPM). Such forecasts may help to determine the course ultimately taken and may accelerate research and development on nanotechnology and nanoscience, as well as all in SPM-related fields in the future.
Author: Erik E. Wehbring
Publisher:
ISBN:
Category :
Languages : en
Pages : 112
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Book Description
