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Author: Hellmut G. Karge
Publisher: Springer Science & Business Media
ISBN: 9783540643357
Category : Science
Languages : en
Pages : 636
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Book Description
Molecular Sieves - Science and Technology covers, in a comprehensive manner, the science and technology of zeolites and all related microporous and mesoporous materials. Authored by renowned experts, the contributions are grouped together topically in such a way that each volume of the book series deals with a specific sub-field. Volume 4 covers the characterization of molecular sieves with the help of the most important spectroscopic techniques (Characterization I), i.e. IR, Raman, NMR, EPR, UV-VIS Spectroscopy, X-ray absorption, photoelectron and Mössbauer Spectroscopy. Theory, experiment and application in selected examples are discussed.
Author: Hellmut G. Karge
Publisher: Springer Science & Business Media
ISBN: 9783540643357
Category : Science
Languages : en
Pages : 636
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Book Description
Molecular Sieves - Science and Technology covers, in a comprehensive manner, the science and technology of zeolites and all related microporous and mesoporous materials. Authored by renowned experts, the contributions are grouped together topically in such a way that each volume of the book series deals with a specific sub-field. Volume 4 covers the characterization of molecular sieves with the help of the most important spectroscopic techniques (Characterization I), i.e. IR, Raman, NMR, EPR, UV-VIS Spectroscopy, X-ray absorption, photoelectron and Mössbauer Spectroscopy. Theory, experiment and application in selected examples are discussed.
Author: Victoria Lynn Schmidt
Publisher: Penguin
ISBN: 1599635593
Category : Language Arts & Disciplines
Languages : en
Pages : 218
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Book Description
Develop compelling character arcs using the power of myth! In the best novels, characters undergo dramatic changes that keep readers turning pages. A Writer's Guide to Characterization shows you how to develop such meaningful character arcs in your own work--stories of transformation that will resonate with readers long after the story ends. In this comprehensive guide, author Victoria Lynn Schmidt examines cross-cultural archetypes to illustrate how they can make your work more powerful and compelling. Plus, you'll learn how to draw from Jungian psychology to add complexity and believability to your characters. Schmidt also provides: • 40 lessons on character development (with examples from well-known films and novels) that you can apply to your own work • Questionnaires and exercises to help you select male and female archetypes and adapt them to your story • 15 classic animal archetypes (including the coyote, snake, tiger, and butterfly) you can use to build convincing character profiles With A Writer's Guide to Characterization, you'll have the information you need to infuse the development of your characters with drama and authenticity.
Author: Mary Kole
Publisher: Penguin
ISBN: 1599635801
Category : Language Arts & Disciplines
Languages : en
Pages : 288
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Book Description
Captivate the hearts and minds of young adult readers! Writing for young adult (YA) and middle grade (MG) audiences isn't just "kid's stuff" anymore--it's kidlit! The YA and MG book markets are healthier and more robust than ever, and that means the competition is fiercer, too. In Writing Irresistible Kidlit, literary agent Mary Kole shares her expertise on writing novels for young adult and middle grade readers and teaches you how to: • Recognize the differences between middle grade and young adult audiences and how it impacts your writing. • Tailor your manuscript's tone, length, and content to your readership. • Avoid common mistakes and cliches that are prevalent in YA and MG fiction, in respect to characters, story ideas, plot structure and more. • Develop themes and ideas in your novel that will strike emotional chords. Mary Kole's candid commentary and insightful observations, as well as a collection of book excerpts and personal insights from bestselling authors and editors who specialize in the children's book market, are invaluable tools for your kidlit career. If you want the skills, techniques, and know-how you need to craft memorable stories for teens and tweens, Writing Irresistible Kidlit can give them to you.
Author: David Brandon
Publisher: John Wiley & Sons
ISBN: 1118681487
Category : Technology & Engineering
Languages : en
Pages : 517
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Book Description
Microstructural characterization is usually achieved by allowing some form of probe to interact with a carefully prepared specimen. The most commonly used probes are visible light, X-ray radiation, a high-energy electron beam, or a sharp, flexible needle. These four types of probe form the basis for optical microscopy, X-ray diffraction, electron microscopy, and scanning probe microscopy. Microstructural Characterization of Materials, 2nd Edition is an introduction to the expertise involved in assessing the microstructure of engineering materials and to the experimental methods used for this purpose. Similar to the first edition, this 2nd edition explores the methodology of materials characterization under the three headings of crystal structure, microstructural morphology, and microanalysis. The principal methods of characterization, including diffraction analysis, optical microscopy, electron microscopy, and chemical microanalytical techniques are treated both qualitatively and quantitatively. An additional chapter has been added to the new edition to cover surface probe microscopy, and there are new sections on digital image recording and analysis, orientation imaging microscopy, focused ion-beam instruments, atom-probe microscopy, and 3-D image reconstruction. As well as being fully updated, this second edition also includes revised and expanded examples and exercises, with a solutions manual available at http://develop.wiley.co.uk/microstructural2e/ Microstructural Characterization of Materials, 2nd Edition will appeal to senior undergraduate and graduate students of material science, materials engineering, and materials chemistry, as well as to qualified engineers and more advanced researchers, who will find the book a useful and comprehensive general reference source.
Author: Eric Lifshin
Publisher: John Wiley & Sons
ISBN: 3527613757
Category : Technology & Engineering
Languages : en
Pages : 277
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Book Description
Linking of materials properties with microstructures is a fundamental theme in materials science, for which a detailed knowledge of the modern characterization techniques is essential. Since modern materials such as high-temperature alloys, engineering thermoplastics and multilayer semiconductor films have many elemental constituents distributed in more than one phase, characterization is essential to the systematic development of such new materials and understanding how they behave in practical applications. X-ray techniques play a major role in providing information on the elemental composition and crystal and grain structures of all types of materials. The challenge to the materials characterization expert is to understand how specific instruments and analytical techniques can provide detailed information about what makes each material unique. The challenge to the materials scientist, chemist, or engineer is to know what information is needed to fully characterize each material and how to use this information to explain its behavior, develop new and improved properties, reduce costs, or ensure compliance with regulatory requirements. This comprehensive handbook presents all the necessary background to understand the applications of X-ray analysis to materials characterization with particular attention to the modern approach to these methods.
Author: Janick Artiola
Publisher: Elsevier
ISBN: 0080491278
Category : Science
Languages : en
Pages : 425
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Book Description
Environmental Monitoring and Characterization is an integrated, hands-on resource for monitoring all aspects of the environment. Sample collection methods and relevant physical, chemical and biological processes necessary to characterize the environment are brought together in twenty chapters which cover: sample collection methods, monitoring terrestrial, aquatic and air environments, and relevant chemical, physical and biological processes and contaminants. This book will serve as an authoritative reference for advanced students and environmental professionals. Examines the integration of physical, chemical, and biological processes Emphasizes field methods and real-time data acquisition, made more accessible with case studies, problems, calculations, and questions Includes four color illustrations throughout the text Brings together the concepts of environmental monitoring and site characterization
Author: Yang Leng
Publisher: John Wiley & Sons
ISBN: 0470822996
Category : Technology & Engineering
Languages : en
Pages : 384
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Book Description
This book covers state-of-the-art techniques commonly used in modern materials characterization. Two important aspects of characterization, materials structures and chemical analysis, are included. Widely used techniques, such as metallography (light microscopy), X-ray diffraction, transmission and scanning electron microscopy, are described. In addition, the book introduces advanced techniques, including scanning probe microscopy. The second half of the book accordingly presents techniques such as X-ray energy dispersive spectroscopy (commonly equipped in the scanning electron microscope), fluorescence X-ray spectroscopy, and popular surface analysis techniques (XPS and SIMS). Finally, vibrational spectroscopy (FTIR and Raman) and thermal analysis are also covered.
Author: Dieter K. Schroder
Publisher: John Wiley & Sons
ISBN: 0471739065
Category : Technology & Engineering
Languages : en
Pages : 800
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Book Description
This Third Edition updates a landmark text with the latest findings The Third Edition of the internationally lauded Semiconductor Material and Device Characterization brings the text fully up-to-date with the latest developments in the field and includes new pedagogical tools to assist readers. Not only does the Third Edition set forth all the latest measurement techniques, but it also examines new interpretations and new applications of existing techniques. Semiconductor Material and Device Characterization remains the sole text dedicated to characterization techniques for measuring semiconductor materials and devices. Coverage includes the full range of electrical and optical characterization methods, including the more specialized chemical and physical techniques. Readers familiar with the previous two editions will discover a thoroughly revised and updated Third Edition, including: Updated and revised figures and examples reflecting the most current data and information 260 new references offering access to the latest research and discussions in specialized topics New problems and review questions at the end of each chapter to test readers' understanding of the material In addition, readers will find fully updated and revised sections in each chapter. Plus, two new chapters have been added: Charge-Based and Probe Characterization introduces charge-based measurement and Kelvin probes. This chapter also examines probe-based measurements, including scanning capacitance, scanning Kelvin force, scanning spreading resistance, and ballistic electron emission microscopy. Reliability and Failure Analysis examines failure times and distribution functions, and discusses electromigration, hot carriers, gate oxide integrity, negative bias temperature instability, stress-induced leakage current, and electrostatic discharge. Written by an internationally recognized authority in the field, Semiconductor Material and Device Characterization remains essential reading for graduate students as well as for professionals working in the field of semiconductor devices and materials. An Instructor's Manual presenting detailed solutions to all the problems in the book is available from the Wiley editorial department.
Author: Gerhard Huebschen
Publisher: Woodhead Publishing
ISBN: 008100057X
Category : Technology & Engineering
Languages : en
Pages : 322
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Book Description
Materials Characterization Using Nondestructive Evaluation (NDE) Methods discusses NDT methods and how they are highly desirable for both long-term monitoring and short-term assessment of materials, providing crucial early warning that the fatigue life of a material has elapsed, thus helping to prevent service failures. Materials Characterization Using Nondestructive Evaluation (NDE) Methods gives an overview of established and new NDT techniques for the characterization of materials, with a focus on materials used in the automotive, aerospace, power plants, and infrastructure construction industries. Each chapter focuses on a different NDT technique and indicates the potential of the method by selected examples of applications. Methods covered include scanning and transmission electron microscopy, X-ray microtomography and diffraction, ultrasonic, electromagnetic, microwave, and hybrid techniques. The authors review both the determination of microstructure properties, including phase content and grain size, and the determination of mechanical properties, such as hardness, toughness, yield strength, texture, and residual stress. Gives an overview of established and new NDT techniques, including scanning and transmission electron microscopy, X-ray microtomography and diffraction, ultrasonic, electromagnetic, microwave, and hybrid techniques Reviews the determination of microstructural and mechanical properties Focuses on materials used in the automotive, aerospace, power plants, and infrastructure construction industries Serves as a highly desirable resource for both long-term monitoring and short-term assessment of materials
Author: Meysam Pazoki
Publisher: Elsevier
ISBN: 0128147288
Category : Technology & Engineering
Languages : en
Pages : 278
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Book Description
Characterization Techniques for Perovskite Solar Cell Materials: Characterization of Recently Emerged Perovskite Solar Cell Materials to Provide an Understanding of the Fundamental Physics on the Nano Scale and Optimize the Operation of the Device Towards Stable and Low-Cost Photovoltaic Technology explores the characterization of nanocrystals of the perovskite film, related interfaces, and the overall impacts of these properties on device efficiency. Included is a collection of both main and research techniques for perovskite solar cells. For the first time, readers will have a complete reference of different characterization techniques, all housed in a work written by highly experienced experts. Explores various characterization techniques for perovskite solar cells and discusses both their strengths and weaknesses Discusses material synthesis and device fabrication of perovskite solar cells Includes a comparison throughout the work on how to distinguish one perovskite solar cell from another
