Challenges of Decoding Data in Spectroscopy, Reflectometry, X-Ray and Electron Diffraction PDF Download
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Author: Felix N. Chukhovskii
Publisher: Cambridge Scholars Publishing
ISBN: 1527586057
Category : Science
Languages : en
Pages : 115
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Book Description
This is the first book to present the direct method for solving the inverse problems in the X-ray multicomponent spectroscopy and small-angle X-ray scattering, X-ray diffraction tomography, grazing-incidence small-angle X-ray reflectometry of multilayer structures, and electron multibeam diffraction imaging. It considers the theory of numerical analysis of multivariate additive spectra of non-separable mixtures, and decodes data obtained using the X-ray diffraction tomography technique. The book also discusses the theory of high-resolution X-ray reflectometry (HRXR) of multilayer structures (MLS) based on the modified Parratt relationships for reflection and transmission coefficients and the phase problem in electron structural crystallography.
Author: Felix N. Chukhovskii
Publisher: Cambridge Scholars Publishing
ISBN: 1527586057
Category : Science
Languages : en
Pages : 115
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Book Description
This is the first book to present the direct method for solving the inverse problems in the X-ray multicomponent spectroscopy and small-angle X-ray scattering, X-ray diffraction tomography, grazing-incidence small-angle X-ray reflectometry of multilayer structures, and electron multibeam diffraction imaging. It considers the theory of numerical analysis of multivariate additive spectra of non-separable mixtures, and decodes data obtained using the X-ray diffraction tomography technique. The book also discusses the theory of high-resolution X-ray reflectometry (HRXR) of multilayer structures (MLS) based on the modified Parratt relationships for reflection and transmission coefficients and the phase problem in electron structural crystallography.
Author:
Publisher:
ISBN:
Category : Dissertations, Academic
Languages : en
Pages : 608
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Book Description
Theses on any subject submitted by the academic libraries in the UK and Ireland.
Author: United States. National Aeronautics and Space Administration. Scientific and Technical Information Branch
Publisher:
ISBN:
Category : Science
Languages : en
Pages : 1080
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Book Description
Author: Dragan Uskoković
Publisher: Institute of Technical Sciences of the Serbian Academy of Sciences and Arts
ISBN: 8680321257
Category : Science
Languages : en
Pages : 270
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Book Description
The First Conference on materials science and engineering, including physics, physical chemistry, condensed matter chemistry, and technology in general, was held in September 1995, in Herceg Novi. An initiative to establish Yugoslav Materials Research Society was born at the conference and, similar to other MR societies in the world, the programme was made and objectives determined. The Yugoslav Materials Research Society (Yu-MRS), a nongovernment and non-profit scientific association, was founded in 1997 to promote multidisciplinary goal-oriented research in materials science and engineering. The main task and objective of the Society has been to encourage creativity in materials research and engineering to reach a harmonic coordination between achievements in this field in our country and analogous activities in the world with an aim to include our country into global international projects. Until 2003, Conferences were held every second year and then they grew into Annual Conferences that were traditionally held in Herceg Novi in September of every year. In 2007 Yu-MRS formed two new MRS: MRS-Serbia (official successor of Yu-MRS) and MRS-Montenegro (in founding). In 2008, MRS – Serbia became a member of FEMS (Federation of European Materials Societies). The Twelfth Annual Conference YUCOMAT 2010 was held on September 6-10, 2010 in Heceg Novi, Montenegro
Author: Michael Wang
Publisher: BoD – Books on Demand
ISBN: 1789842611
Category : Science
Languages : en
Pages : 226
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Book Description
Optical coherence tomography (OCT) is a promising non-invasive non-contact 3D imaging technique that can be used to evaluate and inspect material surfaces, multilayer polymer films, fiber coils, and coatings. OCT can be used for the examination of cultural heritage objects and 3D imaging of microstructures. With subsurface 3D fingerprint imaging capability, OCT could be a valuable tool for enhancing security in biometric applications. OCT can also be used for the evaluation of fastener flushness for improving aerodynamic performance of high-speed aircraft. More and more OCT non-medical applications are emerging. In this book, we present some recent advancements in OCT technology and non-medical applications.
Author:
Publisher: John Wiley & Sons
ISBN: 1789450136
Category : Science
Languages : en
Pages : 386
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Book Description
This book covers both the fundamental and applied aspects of advanced Na-ion batteries (NIB) which have proven to be a potential challenger to Li-ion batteries. Both the chemistry and design of positive and negative electrode materials are examined. In NIB, the electrolyte is also a crucial part of the batteries and the recent research, showing a possible alternative to classical electrolytes – with the development of ionic liquid-based electrolytes – is also explored. Cycling performance in NIB is also strongly associated with the quality of the electrode-electrolyte interface, where electrolyte degradation takes place; thus, Na-ion Batteries details the recent achievements in furthering knowledge of this interface. Finally, as the ultimate goal is commercialization of this new electrical storage technology, the last chapters are dedicated to the industrial point of view, given by two startup companies, who developed two different NIB chemistries for complementary applications and markets.
Author:
Publisher:
ISBN:
Category : Electrical engineering
Languages : en
Pages : 1860
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Book Description
Author: G. L. Squires
Publisher: Cambridge University Press
ISBN: 1107644062
Category : Science
Languages : en
Pages : 273
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Book Description
A long-awaited reprint of the book that has established itself as the classic textbook on neutron scattering. It will be an invaluable introductory text for students taking courses on neutron scattering, as well as for researchers and those who would like to deepen their knowledge on the subject through self-study.
Author: Ron Milo
Publisher: Garland Science
ISBN: 1317230698
Category : Science
Languages : en
Pages : 399
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Book Description
A Top 25 CHOICE 2016 Title, and recipient of the CHOICE Outstanding Academic Title (OAT) Award. How much energy is released in ATP hydrolysis? How many mRNAs are in a cell? How genetically similar are two random people? What is faster, transcription or translation?Cell Biology by the Numbers explores these questions and dozens of others provid
Author: Marius Bazu
Publisher: John Wiley & Sons
ISBN: 1119990009
Category : Technology & Engineering
Languages : en
Pages : 372
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Book Description
Failure analysis is the preferred method to investigate product or process reliability and to ensure optimum performance of electrical components and systems. The physics-of-failure approach is the only internationally accepted solution for continuously improving the reliability of materials, devices and processes. The models have been developed from the physical and chemical phenomena that are responsible for degradation or failure of electronic components and materials and now replace popular distribution models for failure mechanisms such as Weibull or lognormal. Reliability engineers need practical orientation around the complex procedures involved in failure analysis. This guide acts as a tool for all advanced techniques, their benefits and vital aspects of their use in a reliability programme. Using twelve complex case studies, the authors explain why failure analysis should be used with electronic components, when implementation is appropriate and methods for its successful use. Inside you will find detailed coverage on: a synergistic approach to failure modes and mechanisms, along with reliability physics and the failure analysis of materials, emphasizing the vital importance of cooperation between a product development team involved the reasons why failure analysis is an important tool for improving yield and reliability by corrective actions the design stage, highlighting the ‘concurrent engineering' approach and DfR (Design for Reliability) failure analysis during fabrication, covering reliability monitoring, process monitors and package reliability reliability resting after fabrication, including reliability assessment at this stage and corrective actions a large variety of methods, such as electrical methods, thermal methods, optical methods, electron microscopy, mechanical methods, X-Ray methods, spectroscopic, acoustical, and laser methods new challenges in reliability testing, such as its use in microsystems and nanostructures This practical yet comprehensive reference is useful for manufacturers and engineers involved in the design, fabrication and testing of electronic components, devices, ICs and electronic systems, as well as for users of components in complex systems wanting to discover the roots of the reliability flaws for their products.
