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Author: Michel Neuhaus
Publisher: World Scientific
ISBN: 9812770208
Category : Computers
Languages : en
Pages : 245
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Book Description
In graph-based structural pattern recognition, the idea is to transform patterns into graphs and perform the analysis and recognition of patterns in the graph domain OCo commonly referred to as graph matching. A large number of methods for graph matching have been proposed. Graph edit distance, for instance, defines the dissimilarity of two graphs by the amount of distortion that is needed to transform one graph into the other and is considered one of the most flexible methods for error-tolerant graph matching.This book focuses on graph kernel functions that are highly tolerant towards structural errors. The basic idea is to incorporate concepts from graph edit distance into kernel functions, thus combining the flexibility of edit distance-based graph matching with the power of kernel machines for pattern recognition. The authors introduce a collection of novel graph kernels related to edit distance, including diffusion kernels, convolution kernels, and random walk kernels. From an experimental evaluation of a semi-artificial line drawing data set and four real-world data sets consisting of pictures, microscopic images, fingerprints, and molecules, the authors demonstrate that some of the kernel functions in conjunction with support vector machines significantly outperform traditional edit distance-based nearest-neighbor classifiers, both in terms of classification accuracy and running time."
Author: Michel Neuhaus
Publisher: World Scientific
ISBN: 9812770208
Category : Computers
Languages : en
Pages : 245
Get Book Here
Book Description
In graph-based structural pattern recognition, the idea is to transform patterns into graphs and perform the analysis and recognition of patterns in the graph domain OCo commonly referred to as graph matching. A large number of methods for graph matching have been proposed. Graph edit distance, for instance, defines the dissimilarity of two graphs by the amount of distortion that is needed to transform one graph into the other and is considered one of the most flexible methods for error-tolerant graph matching.This book focuses on graph kernel functions that are highly tolerant towards structural errors. The basic idea is to incorporate concepts from graph edit distance into kernel functions, thus combining the flexibility of edit distance-based graph matching with the power of kernel machines for pattern recognition. The authors introduce a collection of novel graph kernels related to edit distance, including diffusion kernels, convolution kernels, and random walk kernels. From an experimental evaluation of a semi-artificial line drawing data set and four real-world data sets consisting of pictures, microscopic images, fingerprints, and molecules, the authors demonstrate that some of the kernel functions in conjunction with support vector machines significantly outperform traditional edit distance-based nearest-neighbor classifiers, both in terms of classification accuracy and running time."
Author: Michel Neuhaus
Publisher: World Scientific
ISBN: 9812708170
Category : Computers
Languages : en
Pages : 245
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Book Description
In graph-based structural pattern recognition, the idea is to transform patterns into graphs and perform the analysis and recognition of patterns in the graph domain ? commonly referred to as graph matching. A large number of methods for graph matching have been proposed. Graph edit distance, for instance, defines the dissimilarity of two graphs by the amount of distortion that is needed to transform one graph into the other and is considered one of the most flexible methods for error-tolerant graph matching.This book focuses on graph kernel functions that are highly tolerant towards structural errors. The basic idea is to incorporate concepts from graph edit distance into kernel functions, thus combining the flexibility of edit distance-based graph matching with the power of kernel machines for pattern recognition. The authors introduce a collection of novel graph kernels related to edit distance, including diffusion kernels, convolution kernels, and random walk kernels. From an experimental evaluation of a semi-artificial line drawing data set and four real-world data sets consisting of pictures, microscopic images, fingerprints, and molecules, the authors demonstrate that some of the kernel functions in conjunction with support vector machines significantly outperform traditional edit distance-based nearest-neighbor classifiers, both in terms of classification accuracy and running time.
Author: Georgy Gimel ́farb
Publisher: Springer
ISBN: 3642341667
Category : Computers
Languages : en
Pages : 770
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Book Description
This volume constitutes the refereed proceedings of the Joint IAPR International Workshops on Structural and Syntactic Pattern Recognition (SSPR 2012) and Statistical Techniques in Pattern Recognition (SPR 2012), held in Hiroshima, Japan, in November 2012 as a satellite event of the 21st International Conference on Pattern Recognition, ICPR 2012. The 80 revised full papers presented together with 1 invited paper and the Pierre Devijver award lecture were carefully reviewed and selected from more than 120 initial submissions. The papers are organized in topical sections on structural, syntactical, and statistical pattern recognition, graph and tree methods, randomized methods and image analysis, kernel methods in structural and syntactical pattern recognition, applications of structural and syntactical pattern recognition, clustering, learning, kernel methods in statistical pattern recognition, kernel methods in statistical pattern recognition, as well as applications of structural, syntactical, and statistical methods.
Author: Andrea Torsello
Publisher: Springer Science & Business Media
ISBN: 3642021247
Category : Computers
Languages : en
Pages : 387
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Book Description
This book constitutes the refereed proceedings of the 7th IAPR-TC-15 International Workshop on Graph-Based Representations in Pattern Recognition, GbRPR 2009, held in Venice, Italy in May 2009. The 37 revised full papers presented were carefully reviewed and selected from 47 submissions. The papers are organized in topical sections on graph-based representation and recognition, graph matching, graph clustering and classification, pyramids, combinatorial maps, and homologies, as well as graph-based segmentation.
Author: Kaspar Riesen
Publisher: Springer
ISBN: 3319272527
Category : Computers
Languages : en
Pages : 164
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Book Description
This unique text/reference presents a thorough introduction to the field of structural pattern recognition, with a particular focus on graph edit distance (GED). The book also provides a detailed review of a diverse selection of novel methods related to GED, and concludes by suggesting possible avenues for future research. Topics and features: formally introduces the concept of GED, and highlights the basic properties of this graph matching paradigm; describes a reformulation of GED to a quadratic assignment problem; illustrates how the quadratic assignment problem of GED can be reduced to a linear sum assignment problem; reviews strategies for reducing both the overestimation of the true edit distance and the matching time in the approximation framework; examines the improvement demonstrated by the described algorithmic framework with respect to the distance accuracy and the matching time; includes appendices listing the datasets employed for the experimental evaluations discussed in the book.
Author: Xiao Bai
Publisher: Springer
ISBN: 3319977857
Category : Computers
Languages : en
Pages : 525
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Book Description
This book constitutes the proceedings of the Joint IAPR International Workshop on Structural, Syntactic, and Statistical Pattern Recognition, S+SSPR 2018, held in Beijing, China, in August 2018. The 49 papers presented in this volume were carefully reviewed and selected from 75 submissions. They were organized in topical sections named: classification and clustering; deep learning and neurla networks; dissimilarity representations and Gaussian processes; semi and fully supervised learning methods; spatio-temporal pattern recognition and shape analysis; structural matching; multimedia analysis and understanding; and graph-theoretic methods.
Author: Maria De Marsico
Publisher: Springer
ISBN: 3319936476
Category : Computers
Languages : en
Pages : 250
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Book Description
This book contains revised and extended versions of selected papers from the 6th International Conference on Pattern Recognition, ICPRAM 2017, held in Porto, Portugal, in February 2017. The 13 full papers presented were carefully reviewed and selected from 139 initial submissions. They aim at making visible and understandable the relevant trends of current research on pattern recognition.
Author: Huimin Lu
Publisher: Springer Nature
ISBN: 3031476379
Category : Computers
Languages : en
Pages : 439
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Book Description
This three-volume set LNCS 14406-14408 constitutes the refereed proceedings of the 7th Asian Conference on Pattern Recognition, ACPR 2023, held in Kitakyushu, Japan, in November 2023. The 93 full papers presented were carefully reviewed and selected from 164 submissions. The conference focuses on four important areas of pattern recognition: pattern recognition and machine learning, computer vision and robot vision, signal processing, and media processing and interaction, covering various technical aspects.
Author: Yuan Yan Tang
Publisher: World Scientific Publishing Company
ISBN:
Category : Computers
Languages : en
Pages : 492
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Book Description
Ch. 1. Introduction. 1.1. Wavelet : a novel mathematical tool for pattern recognition. 1.2. Brief review of pattern recognition with wavelet theory -- ch. 2. Continuous wavelet transforms. 2.1. General theory of continuous wavelet transforms. 2.2. The continuous wavelet transform as a filter. 2.3. Characterization of Lipschitz regularity of signal by wavelet. 2.4. Some examples of basic wavelets -- ch. 3. Multiresolution analysis and wavelet bases. 3.1. Multiresolution analysis. 3.2. The construction of MRAs. 3.3. The construction of biorthonormal wavelet bases. 3.4. S. mallat algorithms -- ch. 4. Some typical wavelet bases. 4.1. Orthonormal wavelet bases. 4.2. Nonorthonormal wavelet bases -- ch. 5. Step-edge detection by wavelet transform. 5.1. Edge detection with local maximal modulus of wavelet transform. 5.2. Calculation of W[symbol]f(x) and W[symbol]f(x, y). 5.3. Wavelet transform for contour extraction and background removal -- ch. 6. Characterization of dirac-edges with quadratic spline wavelet transform. 6.1. Selection of wavelet functions by derivation. 6.2. Characterization of dirac-structure edges by wavelet transform. 6.3. Experiments -- ch. 7. Construction of new wavelet function and application to curve analysis. 7.1. Construction of new wavelet function - Tang-Yang wavelet. 7.2. Characterization of curves through new wavelet transform. 7.3. Comparison with other wavelets. 7.4. Algorithm and experiments -- ch. 8. Skeletonization of ribbon-like shapes with new wavelet function. 8.1. Tang-Yang wavelet function. 8.2. Characterization of the boundary of a shape by wavelet transform. 8.3. Wavelet skeletons and its implementation. 8.4. Algorithm and experiment -- ch. 9. Feature extraction by wavelet sub-patterns and divider dimensions. 9.1. Dimensionality reduction of two-dimensional patterns with ring-projection. 9.2. Wavelet orthonormal decomposition to produce sub-patterns. 9.3. Wavelet-fractal scheme. 9.4. Experiments -- ch. 10. Document analysis by reference line detection with 2-D wavelet transform. 10.1. Two-dimensional MRA and mallat algorithm. 10.2. Detection of reference line from sub-images by the MRA. 10.3. Experiments -- ch. 11. Chinese character processing with B-spline wavelet transform. 11.1. Compression of Chinese character. 11.2. Enlargement of type size with arbitrary scale based on wavelet transform. 11.3. Generation of Chinese type style based on wavelet transform -- ch. 12. Classifier design based on orthogonal wavelet series. 12.1. Fundamentals. 12.2. Minimum average lose classifier design. 12.3. Minimum error-probability classifier design. 12.4. Probability density estimation based on orthogonal wavelet series
Author: Arthur James Wells
Publisher:
ISBN:
Category : Bibliography, National
Languages : en
Pages : 1922
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Book Description
