Author: Thomas Vogt
Publisher: Springer Science & Business Media
ISBN: 146142190X
Category : Science
Languages : en
Pages : 190
Book Description
This book presents advances in nanoscale imaging capabilities of scanning transmission electron microscopes, along with superresolution techniques, special denoising methods, application of mathematical/statistical learning theory, and compressed sensing.
Modeling Nanoscale Imaging in Electron Microscopy
Author: Thomas Vogt
Publisher: Springer Science & Business Media
ISBN: 146142190X
Category : Science
Languages : en
Pages : 190
Book Description
This book presents advances in nanoscale imaging capabilities of scanning transmission electron microscopes, along with superresolution techniques, special denoising methods, application of mathematical/statistical learning theory, and compressed sensing.
Publisher: Springer Science & Business Media
ISBN: 146142190X
Category : Science
Languages : en
Pages : 190
Book Description
This book presents advances in nanoscale imaging capabilities of scanning transmission electron microscopes, along with superresolution techniques, special denoising methods, application of mathematical/statistical learning theory, and compressed sensing.
Annual Review of Materials Research
Author:
Publisher:
ISBN:
Category : Electronic journals
Languages : en
Pages : 634
Book Description
Publisher:
ISBN:
Category : Electronic journals
Languages : en
Pages : 634
Book Description
Crystal Dislocations: Their Impact on Physical Properties of Crystals
Author: Peter Lagerlof
Publisher: MDPI
ISBN: 303897465X
Category : Science
Languages : en
Pages : 317
Book Description
This book is a printed edition of the Special Issue "Crystal Dislocations: Their Impact on Physical Properties of Crystals" that was published in Crystals
Publisher: MDPI
ISBN: 303897465X
Category : Science
Languages : en
Pages : 317
Book Description
This book is a printed edition of the Special Issue "Crystal Dislocations: Their Impact on Physical Properties of Crystals" that was published in Crystals
Diffusion and Defect Data
Author:
Publisher:
ISBN:
Category : Crystals
Languages : en
Pages : 712
Book Description
Publisher:
ISBN:
Category : Crystals
Languages : en
Pages : 712
Book Description
Advanced Processing and Manufacturing Technologies for Structural and Multifunctional Materials II
Author: Tatsuki Ohji
Publisher: John Wiley & Sons
ISBN: 9780470456217
Category : Technology & Engineering
Languages : en
Pages : 249
Book Description
This volume provides a one-stop resource, compiling current research on advanced processing and manufacturing technologies for structural and multifunctional materials. It is a collection of papers from The American Ceramic Society s 32nd International Conference on Advanced Ceramics and Composites, January 27-February 1, 2008. Topics include advanced processing and manufacturing technologies for a wide variety of non-oxide and oxide based structural ceramics, ultra-high temperature ceramics and composites, particulate and fiber reinforced composites, and multifunctional materials. This is a valuable, up-to-date resource for researchers in the field.
Publisher: John Wiley & Sons
ISBN: 9780470456217
Category : Technology & Engineering
Languages : en
Pages : 249
Book Description
This volume provides a one-stop resource, compiling current research on advanced processing and manufacturing technologies for structural and multifunctional materials. It is a collection of papers from The American Ceramic Society s 32nd International Conference on Advanced Ceramics and Composites, January 27-February 1, 2008. Topics include advanced processing and manufacturing technologies for a wide variety of non-oxide and oxide based structural ceramics, ultra-high temperature ceramics and composites, particulate and fiber reinforced composites, and multifunctional materials. This is a valuable, up-to-date resource for researchers in the field.
Dissertation Abstracts International
Author:
Publisher:
ISBN:
Category : Dissertations, Academic
Languages : en
Pages : 854
Book Description
Publisher:
ISBN:
Category : Dissertations, Academic
Languages : en
Pages : 854
Book Description
Developments in Strategic Materials
Author: Hua-Tay Lin
Publisher: John Wiley & Sons
ISBN: 9780470456194
Category : Technology & Engineering
Languages : en
Pages : 289
Book Description
This volume provides a one-stop resource, compiling current research on developments in strategic materials. It is a collection of papers from The American Ceramic Society s 32nd International Conference on Advanced Ceramics and Composites, January 27-February 1, 2008. Papers included in this issue come from five symposia: "Thermoelectric Materials for Power Conversion;" "Basic Science of Multifunctional Ceramics;" "Science of Ceramic Interfaces;" "Geopolymers;" and "Materials for Solid State Lighting." This is a valuable, up-to-date resource for researchers working in the field.
Publisher: John Wiley & Sons
ISBN: 9780470456194
Category : Technology & Engineering
Languages : en
Pages : 289
Book Description
This volume provides a one-stop resource, compiling current research on developments in strategic materials. It is a collection of papers from The American Ceramic Society s 32nd International Conference on Advanced Ceramics and Composites, January 27-February 1, 2008. Papers included in this issue come from five symposia: "Thermoelectric Materials for Power Conversion;" "Basic Science of Multifunctional Ceramics;" "Science of Ceramic Interfaces;" "Geopolymers;" and "Materials for Solid State Lighting." This is a valuable, up-to-date resource for researchers working in the field.
Atomic-scale Imaging of Surfaces and Interfaces
Author: D. K. Biegelsen
Publisher:
ISBN:
Category : Computers
Languages : en
Pages : 312
Book Description
Materials tunneling microscopy for hydrogen-desorption-induced structural change of Si(111) surface; Steps on the (110) surface InP; Scanning tunneling microscopy on charge density waves in layered compounds; Design of ultra high vacuum scanning electron microscope combined with scanning tunneling microscope; Scanning tunneling microscopy perspective of structures on reduced SrTiO3(001) surfaces; Surface structure and electronic property of reduced SrTiO3(100) surface observed by STM/STS; Metastable structural surface excitations and concerted adatom motions: a STM study of atomic motions within a semiconductor surface; Mechanisms and energetics of surface atomic processes: an atom-probe field ion microscope study; Atomic arrangement of Al near the phase boundaries between square root 3X square root 3-Al and 7X7 structures on Si(111) surfaces; Growth and surface morphology of thin silicon films using an atomic force microscope; Solving interface structures by combined electron microscopy and X-ray diffraction; Quantitative hrem study of the atomic structure of the sum(310)/[001] symmetric tilt grain boundary in Nb; Hrtem observation of a sum =3 \{112\} bicrystal boundary in aluminum; Atomic structure of the (310) twin in niobium; theoretical predictions and comparison with experimental observation; Quantitative high-resolution electron microscopy of grain boundaries in gamma-Al2=3; Comparisons of observed and simulated atomic structures of Pd/NiO heterophase interfaces; Atomic structure of sum =5 (130) symmetrical tilt boundary in strontium titanate; Assessment of GaInAs/GaInAsP interdiffusion profiles obtained using stem-edx and hrem; Electron microscopy characterization of epitaxial growth of Ag deposited on MgO microcubes; Real-time viewinf of dynamic processes on CdTe surfaces at elevated temperature; AFM imaging of the crystalline-to-amorphous transition on the surface of ion-implanted mica; AFM imagings of ferritin molecules bound to LB films of poly-1-benzyl-L-histidine; Artifacts in atomic force microscopy of nanoporous and mesoporous fiducial samples; Al induced reconstructions on the Si(111) surfaces studied by scanning tunneling microscopy; Structure of the sum =3 (111) grain boundary in Cu-1.5%Sb; High resolution electron microscopy of sum =3 NiSi2 (111)/(115) Si and NiSi2(221)/(001)Si interfaces; Image simulations of Ge twin boundaries; Surface structure of oxide catalyst microcrystals: high resolution electron microscopy study; A microstructural study of reaction-bonded silicon carbide...
Publisher:
ISBN:
Category : Computers
Languages : en
Pages : 312
Book Description
Materials tunneling microscopy for hydrogen-desorption-induced structural change of Si(111) surface; Steps on the (110) surface InP; Scanning tunneling microscopy on charge density waves in layered compounds; Design of ultra high vacuum scanning electron microscope combined with scanning tunneling microscope; Scanning tunneling microscopy perspective of structures on reduced SrTiO3(001) surfaces; Surface structure and electronic property of reduced SrTiO3(100) surface observed by STM/STS; Metastable structural surface excitations and concerted adatom motions: a STM study of atomic motions within a semiconductor surface; Mechanisms and energetics of surface atomic processes: an atom-probe field ion microscope study; Atomic arrangement of Al near the phase boundaries between square root 3X square root 3-Al and 7X7 structures on Si(111) surfaces; Growth and surface morphology of thin silicon films using an atomic force microscope; Solving interface structures by combined electron microscopy and X-ray diffraction; Quantitative hrem study of the atomic structure of the sum(310)/[001] symmetric tilt grain boundary in Nb; Hrtem observation of a sum =3 \{112\} bicrystal boundary in aluminum; Atomic structure of the (310) twin in niobium; theoretical predictions and comparison with experimental observation; Quantitative high-resolution electron microscopy of grain boundaries in gamma-Al2=3; Comparisons of observed and simulated atomic structures of Pd/NiO heterophase interfaces; Atomic structure of sum =5 (130) symmetrical tilt boundary in strontium titanate; Assessment of GaInAs/GaInAsP interdiffusion profiles obtained using stem-edx and hrem; Electron microscopy characterization of epitaxial growth of Ag deposited on MgO microcubes; Real-time viewinf of dynamic processes on CdTe surfaces at elevated temperature; AFM imaging of the crystalline-to-amorphous transition on the surface of ion-implanted mica; AFM imagings of ferritin molecules bound to LB films of poly-1-benzyl-L-histidine; Artifacts in atomic force microscopy of nanoporous and mesoporous fiducial samples; Al induced reconstructions on the Si(111) surfaces studied by scanning tunneling microscopy; Structure of the sum =3 (111) grain boundary in Cu-1.5%Sb; High resolution electron microscopy of sum =3 NiSi2 (111)/(115) Si and NiSi2(221)/(001)Si interfaces; Image simulations of Ge twin boundaries; Surface structure of oxide catalyst microcrystals: high resolution electron microscopy study; A microstructural study of reaction-bonded silicon carbide...
Visualizing Chemistry
Author: National Research Council
Publisher: National Academies Press
ISBN: 030916463X
Category : Science
Languages : en
Pages : 222
Book Description
Scientists and engineers have long relied on the power of imaging techniques to help see objects invisible to the naked eye, and thus, to advance scientific knowledge. These experts are constantly pushing the limits of technology in pursuit of chemical imagingâ€"the ability to visualize molecular structures and chemical composition in time and space as actual events unfoldâ€"from the smallest dimension of a biological system to the widest expanse of a distant galaxy. Chemical imaging has a variety of applications for almost every facet of our daily lives, ranging from medical diagnosis and treatment to the study and design of material properties in new products. In addition to highlighting advances in chemical imaging that could have the greatest impact on critical problems in science and technology, Visualizing Chemistry reviews the current state of chemical imaging technology, identifies promising future developments and their applications, and suggests a research and educational agenda to enable breakthrough improvements.
Publisher: National Academies Press
ISBN: 030916463X
Category : Science
Languages : en
Pages : 222
Book Description
Scientists and engineers have long relied on the power of imaging techniques to help see objects invisible to the naked eye, and thus, to advance scientific knowledge. These experts are constantly pushing the limits of technology in pursuit of chemical imagingâ€"the ability to visualize molecular structures and chemical composition in time and space as actual events unfoldâ€"from the smallest dimension of a biological system to the widest expanse of a distant galaxy. Chemical imaging has a variety of applications for almost every facet of our daily lives, ranging from medical diagnosis and treatment to the study and design of material properties in new products. In addition to highlighting advances in chemical imaging that could have the greatest impact on critical problems in science and technology, Visualizing Chemistry reviews the current state of chemical imaging technology, identifies promising future developments and their applications, and suggests a research and educational agenda to enable breakthrough improvements.
Annual Meeting Abstracts
Author: American Ceramic Society. Meeting
Publisher:
ISBN:
Category : Ceramics
Languages : en
Pages : 454
Book Description
Publisher:
ISBN:
Category : Ceramics
Languages : en
Pages : 454
Book Description