Author: Thomas F. Kelly
Publisher: Cambridge University Press
ISBN: 1107162505
Category : Technology & Engineering
Languages : en
Pages : 263
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Book Description
The first comprehensive guide on Atomic-Scale Analytical Tomography, extending basics to the future implications for science and technology.
Author: Williams Lefebvre
Publisher: Academic Press
ISBN: 0128047453
Category : Science
Languages : en
Pages : 418
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Book Description
Atom Probe Tomography is aimed at beginners and researchers interested in expanding their expertise in this area. It provides the theoretical background and practical information necessary to investigate how materials work using atom probe microscopy techniques, and includes detailed explanations of the fundamentals, the instrumentation, contemporary specimen preparation techniques, and experimental details, as well as an overview of the results that can be obtained. The book emphasizes processes for assessing data quality and the proper implementation of advanced data mining algorithms. For those more experienced in the technique, this book will serve as a single comprehensive source of indispensable reference information, tables, and techniques. Both beginner and expert will value the way the book is set out in the context of materials science and engineering. In addition, its references to key research outcomes based upon the training program held at the University of Rouen—one of the leading scientific research centers exploring the various aspects of the instrument—will further enhance understanding and the learning process. - Provides an introduction to the capabilities and limitations of atom probe tomography when analyzing materials - Written for both experienced researchers and new users - Includes exercises, along with corrections, for users to practice the techniques discussed - Contains coverage of more advanced and less widespread techniques, such as correlative APT and STEM microscopy
Author: Michael K. Miller
Publisher: Springer
ISBN: 148997430X
Category : Technology & Engineering
Languages : en
Pages : 437
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Book Description
Nanocharacterization by Atom Probe Tomography is a practical guide for researchers interested atomic level characterization of materials with atom probe tomography. Readers will find descriptions of the atom probe instrument and atom probe tomography technique, field ionization, field evaporation and field ion microscopy. The fundamental underlying physics principles are examined, in addition to data reconstruction and visualization, statistical data analysis methods and specimen preparation by electropolishing and FIB-based techniques. A full description of the local electrode atom probe – a new state-of-the-art instrument – is also provided, along with detailed descriptions and limitations of laser pulsing as a method to field evaporate atoms. Valuable coverage of the new ionization theory is also included, which underpins the overall technique.
Author: Michael K. Miller
Publisher: Springer Science & Business Media
ISBN: 1461542812
Category : Technology & Engineering
Languages : en
Pages : 247
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Book Description
The microanalytical technique of atom probe tomography (APT) permits the spatial coordinates and elemental identities of the individual atoms within a small volume to be determined with near atomic resolution. Therefore, atom probe tomography provides a technique for acquiring atomic resolution three dimensional images of the solute distribution within the microstructures of materials. This monograph is designed to provide researchers and students the necessary information to plan and experimentally conduct an atom probe tomography experiment. The techniques required to visualize and to analyze the resulting three-dimensional data are also described. The monograph is organized into chapters each covering a specific aspect of the technique. The development of this powerful microanalytical technique from the origins offield ion microscopy in 1951, through the first three-dimensional atom probe prototype built in 1986 to today's commercial state-of-the-art three dimensional atom probe is documented in chapter 1. A general introduction to atom probe tomography is also presented in chapter 1. The various methods to fabricate suitable needle-shaped specimens are presented in chapter 2. The procedure to form field ion images of the needle-shaped specimen is described in chapter 3. In addition, the appearance of microstructural features and the information that may be estimated from field ion microscopy are summarized. A brief account of the theoretical basis for processes of field ionization and field evaporation is also included.
Author: Peter W. Hawkes
Publisher: Springer Nature
ISBN: 3030000699
Category : Technology & Engineering
Languages : en
Pages : 1561
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Book Description
This book features reviews by leading experts on the methods and applications of modern forms of microscopy. The recent awards of Nobel Prizes awarded for super-resolution optical microscopy and cryo-electron microscopy have demonstrated the rich scientific opportunities for research in novel microscopies. Earlier Nobel Prizes for electron microscopy (the instrument itself and applications to biology), scanning probe microscopy and holography are a reminder of the central role of microscopy in modern science, from the study of nanostructures in materials science, physics and chemistry to structural biology. Separate chapters are devoted to confocal, fluorescent and related novel optical microscopies, coherent diffractive imaging, scanning probe microscopy, transmission electron microscopy in all its modes from aberration corrected and analytical to in-situ and time-resolved, low energy electron microscopy, photoelectron microscopy, cryo-electron microscopy in biology, and also ion microscopy. In addition to serving as an essential reference for researchers and teachers in the fields such as materials science, condensed matter physics, solid-state chemistry, structural biology and the molecular sciences generally, the Springer Handbook of Microscopy is a unified, coherent and pedagogically attractive text for advanced students who need an authoritative yet accessible guide to the science and practice of microscopy.
Author: Roger Lumley
Publisher: Woodhead Publishing
ISBN: 0081020643
Category : Technology & Engineering
Languages : en
Pages : 594
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Book Description
Fundamentals of Aluminium Metallurgy: Recent Advances updates the very successful book Fundamentals of Aluminium Metallurgy. As the technologies related to casting and forming of aluminum components are rapidly improving, with new technologies generating alternative manufacturing methods that improve competitiveness, this book is a timely resource. Sections provide an overview of recent research breakthroughs, methods and techniques of advanced manufacture, including additive manufacturing and 3D printing, a comprehensive discussion of the status of metalcasting technologies, including sand casting, permanent mold casting, pressure diecastings and investment casting, and recent information on advanced wrought alloy development, including automotive bodysheet materials, amorphous glassy materials, and more. Target readership for the book includes PhD students and academics, the casting industry, and those interested in new industrial opportunities and advanced products. - Includes detailed and specific information on the processing of aluminum alloys, including additive manufacturing and advanced casting techniques - Written for a broad ranging readership, from academics, to those in the industry who need to know about the latest techniques for working with aluminum - Comprehensive, up-to-date coverage, with the most recent advances in the industry
Author: Stephen J. Pennycook
Publisher: Springer Science & Business Media
ISBN: 1441972005
Category : Technology & Engineering
Languages : en
Pages : 764
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Book Description
Scanning transmission electron microscopy has become a mainstream technique for imaging and analysis at atomic resolution and sensitivity, and the authors of this book are widely credited with bringing the field to its present popularity. Scanning Transmission Electron Microscopy(STEM): Imaging and Analysis will provide a comprehensive explanation of the theory and practice of STEM from introductory to advanced levels, covering the instrument, image formation and scattering theory, and definition and measurement of resolution for both imaging and analysis. The authors will present examples of the use of combined imaging and spectroscopy for solving materials problems in a variety of fields, including condensed matter physics, materials science, catalysis, biology, and nanoscience. Therefore this will be a comprehensive reference for those working in applied fields wishing to use the technique, for graduate students learning microscopy for the first time, and for specialists in other fields of microscopy.
Author: Konstantin Sobolev
Publisher: Springer
ISBN: 3319170880
Category : Technology & Engineering
Languages : en
Pages : 491
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Book Description
Nanotechnology has already demonstrated surprising potential for improving the performance of construction materials and many of these recent developments were facilitated by NICOM symposia. The NICOM5 proceedings will cover the emerging opportunities and future use of nanotechnology in construction and will illustrate the broad potential for application of nanotechnology to challenging problems involving materials and infrastructure.
Author: Hans-Jürgen Christ
Publisher: Springer
ISBN: 365824531X
Category : Technology & Engineering
Languages : en
Pages : 624
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Book Description
This book represents the final reports of the scientific projects funded within the DFG-SPP1466 and, hence, provides the reader with the possibility to familiarize with the leading edge of VHCF research. It draws a balance on the existing knowledge and its enhancement by the joint research action of the priority program. Three different material classes are dealt with: structural metallic materials, long-fiber-reinforced polymers and materials used in micro-electro-mechanical systems. The project topics address the development of suitable experimental techniques for high-frequency testing and damage monitoring, the characterization of damage mechanisms and damage evolution, the development of mechanism-based models and the transfer of the obtained knowledge and understanding into engineering regulations and applications.
Author: L. Cook
Publisher: The Electrochemical Society
ISBN: 9781566774253
Category : Technology & Engineering
Languages : en
Pages : 362
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Book Description
