Author: P. G. Burke
Publisher: Elsevier
ISBN: 1483163814
Category : Science
Languages : en
Pages : 544
Book Description
Atomic Processes and Applications is a collection of review articles that discusses major atomic and molecular processes and their applications to upper atmospheric physics and to astrophysics. The book also serves as a 60th birthday tribute to Dr. David R. Bates. The coverage of the text includes the overview of stratospheric aeronomy; upper atmosphere of the earth; and problems in atmospheric pollution. The book also deals with technical and highly specialized issues including photoionization of atomic systems; atomic structure and oscillator strengths; and atomic scattering computations. The text will be of great use to undergraduate students and researchers of nuclear, theoretical, and quantum physics.
Atomic Processes and Application
Author: P. G. Burke
Publisher: Elsevier
ISBN: 1483163814
Category : Science
Languages : en
Pages : 544
Book Description
Atomic Processes and Applications is a collection of review articles that discusses major atomic and molecular processes and their applications to upper atmospheric physics and to astrophysics. The book also serves as a 60th birthday tribute to Dr. David R. Bates. The coverage of the text includes the overview of stratospheric aeronomy; upper atmosphere of the earth; and problems in atmospheric pollution. The book also deals with technical and highly specialized issues including photoionization of atomic systems; atomic structure and oscillator strengths; and atomic scattering computations. The text will be of great use to undergraduate students and researchers of nuclear, theoretical, and quantum physics.
Publisher: Elsevier
ISBN: 1483163814
Category : Science
Languages : en
Pages : 544
Book Description
Atomic Processes and Applications is a collection of review articles that discusses major atomic and molecular processes and their applications to upper atmospheric physics and to astrophysics. The book also serves as a 60th birthday tribute to Dr. David R. Bates. The coverage of the text includes the overview of stratospheric aeronomy; upper atmosphere of the earth; and problems in atmospheric pollution. The book also deals with technical and highly specialized issues including photoionization of atomic systems; atomic structure and oscillator strengths; and atomic scattering computations. The text will be of great use to undergraduate students and researchers of nuclear, theoretical, and quantum physics.
Atom-Photon Interactions
Author: Claude Cohen-Tannoudji
Publisher: John Wiley & Sons
ISBN: 0471293369
Category : Science
Languages : en
Pages : 691
Book Description
Atom-Photon Interactions: Basic Processes and Applications allows the reader to master various aspects of the physics of the interaction between light and matter. It is devoted to the study of the interactions between photons and atoms in atomic and molecular physics, quantum optics, and laser physics. The elementary processes in which photons are emitted, absorbed, scattered, or exchanged between atoms are treated in detail and described using diagrammatic representation. The book presents different theoretical approaches, including: Perturbative methods The resolvent method Use of the master equation The Langevin equation The optical Bloch equations The dressed-atom approach Each method is presented in a self-contained manner so that it may be studied independently. Many applications of these approaches to simple and important physical phenomena are given to illustrate the potential and limitations of each method.
Publisher: John Wiley & Sons
ISBN: 0471293369
Category : Science
Languages : en
Pages : 691
Book Description
Atom-Photon Interactions: Basic Processes and Applications allows the reader to master various aspects of the physics of the interaction between light and matter. It is devoted to the study of the interactions between photons and atoms in atomic and molecular physics, quantum optics, and laser physics. The elementary processes in which photons are emitted, absorbed, scattered, or exchanged between atoms are treated in detail and described using diagrammatic representation. The book presents different theoretical approaches, including: Perturbative methods The resolvent method Use of the master equation The Langevin equation The optical Bloch equations The dressed-atom approach Each method is presented in a self-contained manner so that it may be studied independently. Many applications of these approaches to simple and important physical phenomena are given to illustrate the potential and limitations of each method.
R-Matrix Theory of Atomic Collisions
Author: Philip George Burke
Publisher: Springer Science & Business Media
ISBN: 3642159311
Category : Science
Languages : en
Pages : 750
Book Description
Commencing with a self-contained overview of atomic collision theory, this monograph presents recent developments of R-matrix theory and its applications to a wide-range of atomic molecular and optical processes. These developments include the electron and photon collisions with atoms, ions and molecules which are required in the analysis of laboratory and astrophysical plasmas, multiphoton processes required in the analysis of superintense laser interactions with atoms and molecules and positron collisions with atoms and molecules required in antimatter studies of scientific and technologial importance. Basic mathematical results and general and widely used R-matrix computer programs are summarized in the appendices.
Publisher: Springer Science & Business Media
ISBN: 3642159311
Category : Science
Languages : en
Pages : 750
Book Description
Commencing with a self-contained overview of atomic collision theory, this monograph presents recent developments of R-matrix theory and its applications to a wide-range of atomic molecular and optical processes. These developments include the electron and photon collisions with atoms, ions and molecules which are required in the analysis of laboratory and astrophysical plasmas, multiphoton processes required in the analysis of superintense laser interactions with atoms and molecules and positron collisions with atoms and molecules required in antimatter studies of scientific and technologial importance. Basic mathematical results and general and widely used R-matrix computer programs are summarized in the appendices.
Atomic Processes and Applications
Author: P. G. Burke
Publisher: North-Holland
ISBN:
Category : Biography & Autobiography
Languages : en
Pages : 552
Book Description
Publisher: North-Holland
ISBN:
Category : Biography & Autobiography
Languages : en
Pages : 552
Book Description
Atomic Force Microscopy in Process Engineering
Author: W. Richard Bowen
Publisher: Butterworth-Heinemann
ISBN: 0080949576
Category : Technology & Engineering
Languages : en
Pages : 300
Book Description
This is the first book to bring together both the basic theory and proven process engineering practice of AFM. It is presented in a way that is accessible and valuable to practising engineers as well as to those who are improving their AFM skills and knowledge, and to researchers who are developing new products and solutions using AFM. The book takes a rigorous and practical approach that ensures it is directly applicable to process engineering problems. Fundamentals and techniques are concisely described, while specific benefits for process engineering are clearly defined and illustrated. Key content includes: particle-particle, and particle-bubble interactions; characterization of membrane surfaces; the development of fouling resistant membranes; nanoscale pharmaceutical analysis; nanoengineering for cellular sensing; polymers on surfaces; micro and nanoscale rheometry. - Atomic force microscopy (AFM) is an important tool for process engineers and scientists as it enables improved processes and products - The only book dealing with the theory and practical applications of atomic force microscopy in process engineering - Provides best-practice guidance and experience on using AFM for process and product improvement
Publisher: Butterworth-Heinemann
ISBN: 0080949576
Category : Technology & Engineering
Languages : en
Pages : 300
Book Description
This is the first book to bring together both the basic theory and proven process engineering practice of AFM. It is presented in a way that is accessible and valuable to practising engineers as well as to those who are improving their AFM skills and knowledge, and to researchers who are developing new products and solutions using AFM. The book takes a rigorous and practical approach that ensures it is directly applicable to process engineering problems. Fundamentals and techniques are concisely described, while specific benefits for process engineering are clearly defined and illustrated. Key content includes: particle-particle, and particle-bubble interactions; characterization of membrane surfaces; the development of fouling resistant membranes; nanoscale pharmaceutical analysis; nanoengineering for cellular sensing; polymers on surfaces; micro and nanoscale rheometry. - Atomic force microscopy (AFM) is an important tool for process engineers and scientists as it enables improved processes and products - The only book dealing with the theory and practical applications of atomic force microscopy in process engineering - Provides best-practice guidance and experience on using AFM for process and product improvement
Atomic and Molecular Spectroscopy
Author: Sune Svanberg
Publisher: Springer Science & Business Media
ISBN: 3642973981
Category : Science
Languages : en
Pages : 418
Book Description
A wide-ranging review of modern techniques in atomic and molecular spectroscopy. A brief description of atomic and molecular structure is followed by the relevant energy structure expressions. A discussion of radiative properties and the origin of spectra leads into coverage of X-ray and photoelectron spectroscopy, optical spectroscopy, and radiofrequency and microwave techniques. The treatment of laser spectroscopy investigates various tunable sources and a wide range of techniques characterized by high sensitivity and high resolution. Throughout this book, the relation between fundamental and applied aspects is shown, in particular by descriptions of applications to chemical analysis, photochemistry, surface characterisation, environmental and medical diagnostics, remote sensing and astrophysics.
Publisher: Springer Science & Business Media
ISBN: 3642973981
Category : Science
Languages : en
Pages : 418
Book Description
A wide-ranging review of modern techniques in atomic and molecular spectroscopy. A brief description of atomic and molecular structure is followed by the relevant energy structure expressions. A discussion of radiative properties and the origin of spectra leads into coverage of X-ray and photoelectron spectroscopy, optical spectroscopy, and radiofrequency and microwave techniques. The treatment of laser spectroscopy investigates various tunable sources and a wide range of techniques characterized by high sensitivity and high resolution. Throughout this book, the relation between fundamental and applied aspects is shown, in particular by descriptions of applications to chemical analysis, photochemistry, surface characterisation, environmental and medical diagnostics, remote sensing and astrophysics.
Atomic Force Microscopy
Author: Pier Carlo Braga
Publisher: Springer Science & Business Media
ISBN: 1592596479
Category : Science
Languages : en
Pages : 388
Book Description
The natural, biological, medical, and related sciences would not be what they are today without the microscope. After the introduction of the optical microscope, a second breakthrough in morphostructural surface analysis occurred in the 1940s with the development of the scanning electron microscope (SEM), which, instead of light (i. e. , photons) and glass lenses, uses electrons and electromagnetic lenses (magnetic coils). Optical and scanning (or transmission) electron microscopes are called “far-field microscopes” because of the long distance between the sample and the point at which the image is obtained in comparison with the wavelengths of the photons or electrons involved. In this case, the image is a diffraction pattern and its resolution is wavelength limited. In 1986, a completely new type of microscopy was proposed, which, without the use of lenses, photons, or electrons, directly explores the sample surface by means of mechanical scanning, thus opening up unexpected possibilities for the morphostructural and mechanical analysis of biological specimens. These new scanning probe microscopes are based on the concept of near-field microscopy, which overcomes the problem of the limited diffraction-related resolution inherent in conventional microscopes. Located in the immediate vicinity of the sample itself (usually within a few nanometers), the probe records the intensity, rather than the interference signal, thus significantly improving resolution. Since the most we- known microscopes of this type operate using atomic forces, they are frequently referred to as atomic force microscopes (AFMs).
Publisher: Springer Science & Business Media
ISBN: 1592596479
Category : Science
Languages : en
Pages : 388
Book Description
The natural, biological, medical, and related sciences would not be what they are today without the microscope. After the introduction of the optical microscope, a second breakthrough in morphostructural surface analysis occurred in the 1940s with the development of the scanning electron microscope (SEM), which, instead of light (i. e. , photons) and glass lenses, uses electrons and electromagnetic lenses (magnetic coils). Optical and scanning (or transmission) electron microscopes are called “far-field microscopes” because of the long distance between the sample and the point at which the image is obtained in comparison with the wavelengths of the photons or electrons involved. In this case, the image is a diffraction pattern and its resolution is wavelength limited. In 1986, a completely new type of microscopy was proposed, which, without the use of lenses, photons, or electrons, directly explores the sample surface by means of mechanical scanning, thus opening up unexpected possibilities for the morphostructural and mechanical analysis of biological specimens. These new scanning probe microscopes are based on the concept of near-field microscopy, which overcomes the problem of the limited diffraction-related resolution inherent in conventional microscopes. Located in the immediate vicinity of the sample itself (usually within a few nanometers), the probe records the intensity, rather than the interference signal, thus significantly improving resolution. Since the most we- known microscopes of this type operate using atomic forces, they are frequently referred to as atomic force microscopes (AFMs).
Fundamental Processes And Applications Of Atoms And Ions, Review Of
Author: Chii-dong Lin
Publisher: World Scientific
ISBN: 9814502723
Category : Science
Languages : en
Pages : 629
Book Description
This book reviews the major progress made in the fields of atomic, molecular and optical physics in the last decade. It contains eleven chapters in which contributors have highlighted the major accomplishments made in a given subfield. Each chapter is not a comprehensive review, but rather a succinct survey of the most interesting developments achieved in recent years. This book contains information on many AMO subfields and can be used as a textbook for graduate students interested in entering AMO physics. It may also serve researchers who wish to familiarize themselves with other AMO subfields.
Publisher: World Scientific
ISBN: 9814502723
Category : Science
Languages : en
Pages : 629
Book Description
This book reviews the major progress made in the fields of atomic, molecular and optical physics in the last decade. It contains eleven chapters in which contributors have highlighted the major accomplishments made in a given subfield. Each chapter is not a comprehensive review, but rather a succinct survey of the most interesting developments achieved in recent years. This book contains information on many AMO subfields and can be used as a textbook for graduate students interested in entering AMO physics. It may also serve researchers who wish to familiarize themselves with other AMO subfields.
Chemical Vapour Deposition
Author: Anthony C. Jones
Publisher: Royal Society of Chemistry
ISBN: 0854044655
Category : Science
Languages : en
Pages : 600
Book Description
"The book is one of the most comprehensive overviews ever written on the key aspects of chemical vapour deposition processes and it is more comprehensive, technically detailed and up-to-date than other books on CVD. The contributing authors are all practising CVD technologists and are leading international experts in the field of CVD. It presents a logical and progressive overview of the various aspects of CVD processes. Basic concepts, such as the various types of CVD processes, the design of CVD reactors, reaction modelling and CVD precursor chemistry are covered in the first few"--Jacket
Publisher: Royal Society of Chemistry
ISBN: 0854044655
Category : Science
Languages : en
Pages : 600
Book Description
"The book is one of the most comprehensive overviews ever written on the key aspects of chemical vapour deposition processes and it is more comprehensive, technically detailed and up-to-date than other books on CVD. The contributing authors are all practising CVD technologists and are leading international experts in the field of CVD. It presents a logical and progressive overview of the various aspects of CVD processes. Basic concepts, such as the various types of CVD processes, the design of CVD reactors, reaction modelling and CVD precursor chemistry are covered in the first few"--Jacket
Atomic-Molecular Ionization by Electron Scattering
Author: K. N. Joshipura
Publisher: Cambridge University Press
ISBN: 1108498906
Category : Science
Languages : en
Pages : 286
Book Description
Covers quantum scattering theories, experimental and theoretical calculations and applications in a comprehensive manner.
Publisher: Cambridge University Press
ISBN: 1108498906
Category : Science
Languages : en
Pages : 286
Book Description
Covers quantum scattering theories, experimental and theoretical calculations and applications in a comprehensive manner.