Atomic Force Microscopy

Atomic Force Microscopy PDF Author: Pier Carlo Braga
Publisher: Springer Science & Business Media
ISBN: 1592596479
Category : Science
Languages : en
Pages : 388

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Book Description
The natural, biological, medical, and related sciences would not be what they are today without the microscope. After the introduction of the optical microscope, a second breakthrough in morphostructural surface analysis occurred in the 1940s with the development of the scanning electron microscope (SEM), which, instead of light (i. e. , photons) and glass lenses, uses electrons and electromagnetic lenses (magnetic coils). Optical and scanning (or transmission) electron microscopes are called “far-field microscopes” because of the long distance between the sample and the point at which the image is obtained in comparison with the wavelengths of the photons or electrons involved. In this case, the image is a diffraction pattern and its resolution is wavelength limited. In 1986, a completely new type of microscopy was proposed, which, without the use of lenses, photons, or electrons, directly explores the sample surface by means of mechanical scanning, thus opening up unexpected possibilities for the morphostructural and mechanical analysis of biological specimens. These new scanning probe microscopes are based on the concept of near-field microscopy, which overcomes the problem of the limited diffraction-related resolution inherent in conventional microscopes. Located in the immediate vicinity of the sample itself (usually within a few nanometers), the probe records the intensity, rather than the interference signal, thus significantly improving resolution. Since the most we- known microscopes of this type operate using atomic forces, they are frequently referred to as atomic force microscopes (AFMs).

Atomic Force Microscopy

Atomic Force Microscopy PDF Author: Pier Carlo Braga
Publisher: Springer Science & Business Media
ISBN: 1592596479
Category : Science
Languages : en
Pages : 388

Get Book Here

Book Description
The natural, biological, medical, and related sciences would not be what they are today without the microscope. After the introduction of the optical microscope, a second breakthrough in morphostructural surface analysis occurred in the 1940s with the development of the scanning electron microscope (SEM), which, instead of light (i. e. , photons) and glass lenses, uses electrons and electromagnetic lenses (magnetic coils). Optical and scanning (or transmission) electron microscopes are called “far-field microscopes” because of the long distance between the sample and the point at which the image is obtained in comparison with the wavelengths of the photons or electrons involved. In this case, the image is a diffraction pattern and its resolution is wavelength limited. In 1986, a completely new type of microscopy was proposed, which, without the use of lenses, photons, or electrons, directly explores the sample surface by means of mechanical scanning, thus opening up unexpected possibilities for the morphostructural and mechanical analysis of biological specimens. These new scanning probe microscopes are based on the concept of near-field microscopy, which overcomes the problem of the limited diffraction-related resolution inherent in conventional microscopes. Located in the immediate vicinity of the sample itself (usually within a few nanometers), the probe records the intensity, rather than the interference signal, thus significantly improving resolution. Since the most we- known microscopes of this type operate using atomic forces, they are frequently referred to as atomic force microscopes (AFMs).

Atomic Force Microscopy in Biomedical Research

Atomic Force Microscopy in Biomedical Research PDF Author: Pier Carlo Braga
Publisher: Humana Press
ISBN: 9781493962792
Category : Medical
Languages : en
Pages : 508

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Book Description
With its ability to explore the surface of the sample by means of a local scanning probe and its use of dedicated software allows to be visualize results, atomic force microscopy (AFM) has revolutionized the study of the smallest aspects of life. Atomic Force Microscopy in Biomedical Research: Methods and Protocols proves that this technology is no longer simply just another form of microscopy but has given rise to a completely new way of using microscopy that fulfils the dreams of all microscopists: being able to touch, move, and interact with the sample while it is being examined, thus making it possible to discover not only morphological but also chemical and physical structural information. Covering such topics as molecule imaging, nanoscale surface analysis and cellular imaging, force-spectroscopy, investigating drug action, and AFM as a nanotool, this volume features the most up-to-date techniques currently in use. Written in the Methods in Molecular BiologyTM series format, chapters include introductions to their respective topics, lists of the necessary materials, step-by-step, readily reproducible protocols, and expert tips on troubleshooting and avoiding known pitfalls. Comprehensive and cutting-edge, Atomic Force Microscopy in Biomedical Research: Methods and Protocols brings together different types of applications in order to provide examples from diverse fields in the hope of inspiring researchers to apply their ingenuity in their own specialization and add significant originality to their varying studies.

Techniques In Microscopy For Biomedical Applications

Techniques In Microscopy For Biomedical Applications PDF Author: Terje Dokland
Publisher: World Scientific Publishing Company
ISBN: 9813101954
Category : Technology & Engineering
Languages : en
Pages : 422

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Book Description
The second volume of the series Manuals in Biomedical Research, this book is aimed to be both a concise introduction to the diverse field of microscopy and a practical guide those who require the use of microscopic for methods in their research. It provides young as well as experienced scientists a state-of-the-art multidisciplinary overview of microscopic techniques, covering all the major microscopy fields in biomedical sciences and showing their application in evaluating samples ranging from molecules to cells and tissues.Microscopy has revolutionized our understanding of biological events. Within the last two decades, microscopic techniques have provided insights into the dynamics of biological processes that regulate such events. Biological discovery, to a large extent, depends on advances in imaging techniques and various microscopic techniques have emerged as central and indispensable tools in the biomedical sciences.The four authors bring with them extensive experiences spanning across disciplines such as Microbiology, Molecular and Cell Biology, Tissue Engineering, Biomedical and Regenerative Medicine and so forth, reinforcing the fact that microscopy has proven useful in countless investigations into the mysteries of life.

Intermolecular and Surface Forces

Intermolecular and Surface Forces PDF Author: Jacob N. Israelachvili
Publisher: Academic Press
ISBN: 0123919339
Category : Science
Languages : en
Pages : 708

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Book Description
Intermolecular and Surface Forces describes the role of various intermolecular and interparticle forces in determining the properties of simple systems such as gases, liquids and solids, with a special focus on more complex colloidal, polymeric and biological systems. The book provides a thorough foundation in theories and concepts of intermolecular forces, allowing researchers and students to recognize which forces are important in any particular system, as well as how to control these forces. This third edition is expanded into three sections and contains five new chapters over the previous edition. - Starts from the basics and builds up to more complex systems - Covers all aspects of intermolecular and interparticle forces both at the fundamental and applied levels - Multidisciplinary approach: bringing together and unifying phenomena from different fields - This new edition has an expanded Part III and new chapters on non-equilibrium (dynamic) interactions, and tribology (friction forces)

Atomic Force Microscopy

Atomic Force Microscopy PDF Author: Greg Haugstad
Publisher: John Wiley & Sons
ISBN: 0470638826
Category : Science
Languages : en
Pages : 496

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Book Description
This book enlightens readers on the basic surface properties and distance-dependent intersurface forces one must understand to obtain even simple data from an atomic force microscope (AFM). The material becomes progressively more complex throughout the book, explaining details of calibration, physical origin of artifacts, and signal/noise limitations. Coverage spans imaging, materials property characterization, in-liquid interfacial analysis, tribology, and electromagnetic interactions. “Supplementary material for this book can be found by entering ISBN 9780470638828 on booksupport.wiley.com”

Atomic Force Microscopy

Atomic Force Microscopy PDF Author: Peter Eaton
Publisher: Oxford University Press
ISBN: 0199570450
Category : Science
Languages : en
Pages : 257

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Book Description
Atomic force microscopes are very important tools for the advancement of science and technology. This book provides an introduction to the microscopes so that scientists and engineers can learn both how to use them, and what they can do.

Spectroscopy for Materials Characterization

Spectroscopy for Materials Characterization PDF Author: Simonpietro Agnello
Publisher: John Wiley & Sons
ISBN: 1119697328
Category : Technology & Engineering
Languages : en
Pages : 500

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Book Description
SPECTROSCOPY FOR MATERIALS CHARACTERIZATION Learn foundational and advanced spectroscopy techniques from leading researchers in physics, chemistry, surface science, and nanoscience In Spectroscopy for Materials Characterization, accomplished researcher Simonpietro Agnello delivers a practical and accessible compilation of various spectroscopy techniques taught and used to today. The book offers a wide-ranging approach taught by leading researchers working in physics, chemistry, surface science, and nanoscience. It is ideal for both new students and advanced researchers studying and working with spectroscopy. Topics such as confocal and two photon spectroscopy, as well as infrared absorption and Raman and micro-Raman spectroscopy, are discussed, as are thermally stimulated luminescence and spectroscopic studies of radiation effects on optical materials. Each chapter includes a basic introduction to the theory necessary to understand a specific technique, details about the characteristic instrumental features and apparatuses used, including tips for the appropriate arrangement of a typical experiment, and a reproducible case study that shows the discussed techniques used in a real laboratory. Readers will benefit from the inclusion of: Complete and practical case studies at the conclusion of each chapter to highlight the concepts and techniques discussed in the material Citations of additional resources ideal for further study A thorough introduction to the basic aspects of radiation matter interaction in the visible-ultraviolet range and the fundamentals of absorption and emission A rigorous exploration of time resolved spectroscopy at the nanosecond and femtosecond intervals Perfect for Master and Ph.D. students and researchers in physics, chemistry, engineering, and biology, Spectroscopy for Materials Characterization will also earn a place in the libraries of materials science researchers and students seeking a one-stop reference to basic and advanced spectroscopy techniques.

Fundamentals and Application of Atomic Force Microscopy for Food Research

Fundamentals and Application of Atomic Force Microscopy for Food Research PDF Author: Jian Zhong
Publisher: Academic Press
ISBN: 0128241322
Category : Technology & Engineering
Languages : en
Pages : 385

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Book Description
Fundamentals and Application of Atomic Force Microscopy for Food Research explains how to get reliable AFM data and current application progress of AFM in different food substances. Sections focus on an Introduction to AFM for food research and Applications of AFM for different types of food substances. Edited by 3 experts in the field of nanotechnology and food science, this book reduces the difficulty of AFM application and shortens the learning time for new hands. Until now, no such book has systematically described the application of Atomic Force Microscopy (AFM) for food research. Many scientists in the field of food science and engineering need to evaluate their developed foods and food contact surfaces at nanoscale. However, there is a steep learning curve for new hands, hence the need for this comprehensive resource. - Describes the application of AFM for food research - Covers applications of AFM for different types of food substances - Addresses future uses and perspectives of AFM for the development of food nanotechnology

Atomic Force Microscopy in Process Engineering

Atomic Force Microscopy in Process Engineering PDF Author: W. Richard Bowen
Publisher: Butterworth-Heinemann
ISBN: 0080949576
Category : Technology & Engineering
Languages : en
Pages : 300

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Book Description
This is the first book to bring together both the basic theory and proven process engineering practice of AFM. It is presented in a way that is accessible and valuable to practising engineers as well as to those who are improving their AFM skills and knowledge, and to researchers who are developing new products and solutions using AFM. The book takes a rigorous and practical approach that ensures it is directly applicable to process engineering problems. Fundamentals and techniques are concisely described, while specific benefits for process engineering are clearly defined and illustrated. Key content includes: particle-particle, and particle-bubble interactions; characterization of membrane surfaces; the development of fouling resistant membranes; nanoscale pharmaceutical analysis; nanoengineering for cellular sensing; polymers on surfaces; micro and nanoscale rheometry. - Atomic force microscopy (AFM) is an important tool for process engineers and scientists as it enables improved processes and products - The only book dealing with the theory and practical applications of atomic force microscopy in process engineering - Provides best-practice guidance and experience on using AFM for process and product improvement

Atomic Force Microscopy (AFM)

Atomic Force Microscopy (AFM) PDF Author: Hongshun Yang
Publisher: Nova Science Publishers
ISBN: 9781631171727
Category : Atomic force microscopes
Languages : en
Pages : 0

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Book Description
With the wide application of nanotechnology in scientific research as well as in industrial product development, it is urgent to develop appropriate tools for investigating and manipulating molecules, especially macromolecules at the nanoscale level. Different microscopes are typical equipment. Due to the high resolution, being maximally close to samples' original status and the low requirement of sample preparation, atomic force microscopy (AFM) has been applied as a nanotechnology tool since it was invented in 1986. As this equipment utilises the force between the sample and scanning tip rather than the light signal as used by many other microscopes, samples with different optical properties can be investigated with AFM without limitations. AFM has many modes including contact mode and non-contact mode, which can be applied for achieving different purposes depending on the samples' properties and final purposes. Recent force spectroscopy can measure the interaction forces of the tip-sample, which is a function of distance between the tip and the sample, thus called a force-distance curve. Force spectroscopy can also be conducted with static or dynamic modes, which has been widely applied in many fields, especially in biophysics for measuring mechanical properties of living organisms or cells. This book focuses on the research on AFM principles, modes of operation and limitation and they are discussed with detailed examples in various fields, ranging from inorganic materials in physics to organic materials in food science, biomedical science, chemistry and others.