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Author:
Publisher:
ISBN:
Category : Electronic circuits
Languages : en
Pages : 526
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Book Description
Author:
Publisher:
ISBN:
Category : Electronic circuits
Languages : en
Pages : 526
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Book Description
Author:
Publisher: IEEE Computer Society Press
ISBN:
Category : Computers
Languages : en
Pages : 464
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Book Description
Held in Guam in November of 2002, the symposium on the test technologies and research issues related to silicon chip production, resulted in the 74 papers presented here. The papers are organized into sections related to the symposium sessions on test generation, on-line testing, analog and mixed si
Author:
Publisher:
ISBN:
Category : Technology & Engineering
Languages : en
Pages : 400
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Book Description
Author:
Publisher: Institute of Electrical & Electronics Engineers(IEEE)
ISBN: 9780769519517
Category : Computers
Languages : en
Pages : 544
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Book Description
The Asian Test Symposium provides an international forum for engineers and researchers from all countries of the World, especially from Asia, to present and discuss various aspects of system, board and device testing with design, manufacturing and field considerations in mind. ATS 2003's papers shares state-of-the-art ideas and technologies in testing.
Author: Zuber Patel
Publisher: Springer Nature
ISBN: 9811562296
Category : Technology & Engineering
Languages : en
Pages : 306
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Book Description
This book presents select peer-reviewed proceedings of the International Conference on Advances in VLSI and Embedded Systems (AVES 2019) held at SVNIT, Surat, Gujarat, India. The book covers cutting-edge original research in VLSI design, devices and emerging technologies, embedded systems, and CAD for VLSI. With an aim to address the demand for complex and high-functionality systems as well as portable consumer electronics, the contents focus on basic concepts of circuit and systems design, fabrication, testing, and standardization. This book can be useful for students, researchers as well as industry professionals interested in emerging trends in VLSI and embedded systems.
Author: Ashutosh Kumar Singh
Publisher: Springer
ISBN: 9811388210
Category : Technology & Engineering
Languages : en
Pages : 268
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Book Description
The book compiles efficient design and test methodologies for the implementation of reversible logic circuits. The methodologies covered in the book are design approaches, test approaches, fault tolerance in reversible circuits and physical implementation techniques. The book also covers the challenges and the reversible logic circuits to meet these challenges stimulated during each stage of work cycle. The novel computing paradigms are being explored to serve as a basis for fast and low power computation.
Author: Patrick Girard
Publisher: Springer Science & Business Media
ISBN: 1441909281
Category : Technology & Engineering
Languages : en
Pages : 376
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Book Description
Managing the power consumption of circuits and systems is now considered one of the most important challenges for the semiconductor industry. Elaborate power management strategies, such as dynamic voltage scaling, clock gating or power gating techniques, are used today to control the power dissipation during functional operation. The usage of these strategies has various implications on manufacturing test, and power-aware test is therefore increasingly becoming a major consideration during design-for-test and test preparation for low power devices. This book explores existing solutions for power-aware test and design-for-test of conventional circuits and systems, and surveys test strategies and EDA solutions for testing low power devices.
Author: Patrick Girard
Publisher: Springer Nature
ISBN: 3031196392
Category : Technology & Engineering
Languages : en
Pages : 320
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Book Description
This book provides a state-of-the-art guide to Machine Learning (ML)-based techniques that have been shown to be highly efficient for diagnosis of failures in electronic circuits and systems. The methods discussed can be used for volume diagnosis after manufacturing or for diagnosis of customer returns. Readers will be enabled to deal with huge amount of insightful test data that cannot be exploited otherwise in an efficient, timely manner. After some background on fault diagnosis and machine learning, the authors explain and apply optimized techniques from the ML domain to solve the fault diagnosis problem in the realm of electronic system design and manufacturing. These techniques can be used for failure isolation in logic or analog circuits, board-level fault diagnosis, or even wafer-level failure cluster identification. Evaluation metrics as well as industrial case studies are used to emphasize the usefulness and benefits of using ML-based diagnosis techniques.
Author: Bhaveshkumar Choithram Dharman
Publisher: CRC Press
ISBN: 1040132596
Category : Computers
Languages : en
Pages : 819
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Book Description
ICICS is a series of conferences initiated by School of Electronics and Electrical Engineering at Lovely Professional University. Looking at the response to the conference, the bi-annual conference now onwards will be annual. The 5th International Conference on Intelligent Circuits and Systems (ICICS 2023) will be focusing on intelligent circuits and systems for achieving the targets in Sustainable Development Goal (SDG) 3, identified as ‘Good Health and Wellbeing’ by United Nations (Refs: https://sdgs.un.org/goals/goal3, https://sdg-tracker.org/).
Author: Xiao Liu
Publisher: Springer Science & Business Media
ISBN: 3319005332
Category : Technology & Engineering
Languages : en
Pages : 118
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Book Description
This book first provides a comprehensive coverage of state-of-the-art validation solutions based on real-time signal tracing to guarantee the correctness of VLSI circuits. The authors discuss several key challenges in post-silicon validation and provide automated solutions that are systematic and cost-effective. A series of automatic tracing solutions and innovative design for debug (DfD) techniques are described, including techniques for trace signal selection for enhancing visibility of functional errors, a multiplexed signal tracing strategy for improving functional error detection, a tracing solution for debugging electrical errors, an interconnection fabric for increasing data bandwidth and supporting multi-core debug, an interconnection fabric design and optimization technique to increase transfer flexibility and a DfD design and associated tracing solution for improving debug efficiency and expanding tracing window. The solutions presented in this book improve the validation quality of VLSI circuits, and ultimately enable the design and fabrication of reliable electronic devices.
