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Author: Bharat Bhushan
Publisher: Springer Science & Business Media
ISBN: 3540850392
Category : Technology & Engineering
Languages : en
Pages : 271
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Book Description
Crack initiation and growth are key issues when it comes to the mechanical reliab- ity of microelectronic devices and microelectromechanical systems (MEMS). Es- cially in organic electronics where exible substrates will play a major role these issues will become of utmost importance. It is therefore necessary to develop me- ods which in situ allow the experimental investigation of surface deformation and fracture processes in thin layers at a micro and nanometer scale. While scanning electron microscopy (SEM) might be used it is also associated with some major experimental drawbacks. First of all if polymers are investigated they usually have to be coated with a metal layer due to their commonly non-conductive nature. Additi- ally they might be damaged by the electron beam of the microscope or the vacuum might cause outgasing of solvents or evaporation of water and thus change material properties. Furthermore, for all kinds of materials a considerable amount of expe- mental effort is necessary to build a tensile testing machine that ts into the chamber. Therefore, a very promising alternative to SEM is based on the use of an atomic force microscope (AFM) to observe in situ surface deformation processes during straining of a specimen. First steps towards this goal were shown in the 1990s in [1–4] but none of these approaches truly was a microtensile test with sample thicknesses in the range of micrometers. To the authors’ knowledge, this was shown for the rst time by Hild et al. in [5]. 16.
Author: Bharat Bhushan
Publisher: Springer Science & Business Media
ISBN: 3540850392
Category : Technology & Engineering
Languages : en
Pages : 271
Get Book Here
Book Description
Crack initiation and growth are key issues when it comes to the mechanical reliab- ity of microelectronic devices and microelectromechanical systems (MEMS). Es- cially in organic electronics where exible substrates will play a major role these issues will become of utmost importance. It is therefore necessary to develop me- ods which in situ allow the experimental investigation of surface deformation and fracture processes in thin layers at a micro and nanometer scale. While scanning electron microscopy (SEM) might be used it is also associated with some major experimental drawbacks. First of all if polymers are investigated they usually have to be coated with a metal layer due to their commonly non-conductive nature. Additi- ally they might be damaged by the electron beam of the microscope or the vacuum might cause outgasing of solvents or evaporation of water and thus change material properties. Furthermore, for all kinds of materials a considerable amount of expe- mental effort is necessary to build a tensile testing machine that ts into the chamber. Therefore, a very promising alternative to SEM is based on the use of an atomic force microscope (AFM) to observe in situ surface deformation processes during straining of a specimen. First steps towards this goal were shown in the 1990s in [1–4] but none of these approaches truly was a microtensile test with sample thicknesses in the range of micrometers. To the authors’ knowledge, this was shown for the rst time by Hild et al. in [5]. 16.
Author: Bharat Bhushan
Publisher: Springer Science & Business Media
ISBN: 3540850376
Category : Technology & Engineering
Languages : en
Pages : 281
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Book Description
The volumes XI, XII and XIII examine the physical and technical foundation for recent progress in applied scanning probe techniques. These volumes constitute a timely comprehensive overview of SPM applications. Real industrial applications are included.
Author: Bharat Bhushan
Publisher: Springer Science & Business Media
ISBN: 354085049X
Category : Technology & Engineering
Languages : en
Pages : 284
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Book Description
The volumes XI, XII and XIII examine the physical and technical foundation for recent progress in applied scanning probe techniques. The first volume came out in January 2004, the second to fourth volumes in early 2006 and the fifth to seventh volumes in late 2006. The field is progressing so fast that there is a need for a set of volumes every 12 to 18 months to capture latest developments. These volumes constitute a timely comprehensive overview of SPM applications. After introducing scanning probe microscopy, including sensor technology and tip characterization, chapters on use in various industrial applications are presented. Industrial applications span topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. The chapters have been written by leading researchers and application scientists from all over the world and from various industries to provide a broader perspective.
Author: Susana Moreno-Flores
Publisher: CRC Press
ISBN: 1439871019
Category : Science
Languages : en
Pages : 366
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Book Description
Many books and reviews about scanning probe microscopies (SPM) cover the basics of their performance, novel developments, and state-of-the-art applications. Taking a different approach, Hybridizing Surface Probe Microscopies: Towards a Full Description of the Meso- and Nanoworlds encompasses the technical efforts in combining SPM with spectroscopic and optical complementary techniques that, altogether, provide a complete description of nanoscale and mesoscale systems and processes from corrosion to enzymatic reactions. The book is organized into eight chapters, following a general scheme that revolves around the two main capabilities of SPM: imaging and measuring interactions. Each chapter introduces key theoretical concepts and basic equations of the particular stand-alone technique with which the scanning probe microscopies are combined. Chapters end with the SPM-technique combination and some real-world examples in which the combination has been devised or used. Most chapters include a historical review of the techniques and numerous illustrations to support key ideas and provide the reader with intuitive understanding. To understand the limitations of any technique also means to understand how this technique works. This book has devoted a considerable amount of space in explaining the basics of each technique as they are being introduced. At the same time, it avoids explaining the particularities of each SPM-based technique and opts for a rather generalized approach. In short, the book’s focus is not on what SPM can do, but rather on what SPM cannot do and, most specifically, on presenting the experimental approaches that circumvent these limitations.
Author: Bharat Bhushan
Publisher: Springer Science & Business Media
ISBN: 3642025250
Category : Technology & Engineering
Languages : en
Pages : 1968
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Book Description
Since 2004 and with the 2nd edition in 2006, the Springer Handbook of Nanotechnology has established itself as the definitive reference in the nanoscience and nanotechnology area. It integrates the knowledge from nanofabrication, nanodevices, nanomechanics, Nanotribology, materials science, and reliability engineering in just one volume. Beside the presentation of nanostructures, micro/nanofabrication, and micro/nanodevices, special emphasis is on scanning probe microscopy, nanotribology and nanomechanics, molecularly thick films, industrial applications and microdevice reliability, and on social aspects. In its 3rd edition, the book grew from 8 to 9 parts now including a part with chapters on biomimetics. More information is added to such fields as bionanotechnology, nanorobotics, and (bio)MEMS/NEMS, bio/nanotribology and bio/nanomechanics. The book is organized by an experienced editor with a universal knowledge and written by an international team of over 150 distinguished experts. It addresses mechanical and electrical engineers, materials scientists, physicists and chemists who work either in the nano area or in a field that is or will be influenced by this new key technology.
Author: Bharat Bhushan
Publisher: Springer Science & Business Media
ISBN: 364235792X
Category : Technology & Engineering
Languages : en
Pages : 485
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Book Description
Examining the physical and technical foundation for recent progress with this technique, Applied Scanning Probe Methods offers a timely and comprehensive overview of SPM applications, now that industrial applications span topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. First it lays the theoretical background of static and dynamic force microscopies, including sensor technology and tip characterization, contributions detail applications such as macro- and nanotribology, polymer surfaces, and roughness investigations. The final part on industrial research addresses special applications of scanning force nanoprobes such as atomic manipulation and surface modification, as well as single electron devices based on SPM.
Author: Bharat Bhushan
Publisher: Springer Science & Business Media
ISBN: 3540740805
Category : Technology & Engineering
Languages : en
Pages : 512
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Book Description
The volumes VIII, IX and X examine the physical and technical foundation for recent progress in applied scanning probe techniques. This is the first book to summarize the state-of-the-art of this technique. The field is progressing so fast that there is a need for a set of volumes every 12 to 18 months to capture latest developments. These volumes constitute a timely comprehensive overview of SPM applications.
Author: Bharat Bhushan
Publisher: Springer Science & Business Media
ISBN: 3540740856
Category : Technology & Engineering
Languages : en
Pages : 475
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Book Description
The volumes VIII, IX and X examine the physical and technical foundation for recent progress in applied scanning probe techniques. This is the first book to summarize the state-of-the-art of this technique. The field is progressing so fast that there is a need for a set of volumes every 12 to 18 months to capture latest developments. These volumes constitute a timely comprehensive overview of SPM applications.
Author: Bharat Bhushan
Publisher: Springer Science & Business Media
ISBN: 354074083X
Category : Technology & Engineering
Languages : en
Pages : 436
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Book Description
The volumes VIII, IX and X examine the physical and technical foundation for recent progress in applied scanning probe techniques. This is the first book to summarize the state-of-the-art of this technique. The field is progressing so fast that there is a need for a set of volumes every 12 to 18 months to capture latest developments. These volumes constitute a timely and comprehensive overview of SPM applications.
Author: Sergei V. Kalinin
Publisher: Springer Science & Business Media
ISBN: 0387286683
Category : Technology & Engineering
Languages : en
Pages : 1002
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Book Description
This volume will be devoted to the technical aspects of electrical and electromechanical SPM probes and SPM imaging on the limits of resolution, thus providing technical introduction into the field. This volume will also address the fundamental physical phenomena underpinning the imaging mechanism of SPMs.
