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Author: Wolfgang Braun
Publisher: Springer Science & Business Media
ISBN: 9783540651994
Category : Science
Languages : en
Pages : 240
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Book Description
The book describes RHEED (reflection high-energy electron diffraction) used as a tool for crystal growth. New methods using RHEED to characterize surfaces and interfaces during crystal growth by MBE (molecular beam epitaxy) are presented. Special emphasis is put on RHEED intensity oscillations, segregation phenomena, electron energy-loss spectroscopy and RHEED with rotating substrates.
Author: Wolfgang Braun
Publisher: Springer Science & Business Media
ISBN: 9783540651994
Category : Science
Languages : en
Pages : 240
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Book Description
The book describes RHEED (reflection high-energy electron diffraction) used as a tool for crystal growth. New methods using RHEED to characterize surfaces and interfaces during crystal growth by MBE (molecular beam epitaxy) are presented. Special emphasis is put on RHEED intensity oscillations, segregation phenomena, electron energy-loss spectroscopy and RHEED with rotating substrates.
Author: Henryk Morawiec
Publisher: World Scientific
ISBN: 9812387617
Category : Science
Languages : en
Pages : 440
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Book Description
This book aims to propagate the newest achievements of applied crystallography among crystallographers, solid state physicists and materials scientists. It presents application of structural studies to materials used in industrial practice rather than those associated with the crystal structure determination only.The proceedings have been selected for coverage in: ? Materials Science Citation Index?? Index to Scientific & Technical Proceedings? (ISTP? / ISI Proceedings)? Index to Scientific & Technical Proceedings (ISTP CDROM version / ISI Proceedings)? CC Proceedings ? Engineering & Physical Sciences
Author: Paul Seidel
Publisher: John Wiley & Sons
ISBN: 3527670661
Category : Technology & Engineering
Languages : en
Pages : 1336
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Book Description
This wide-ranging presentation of applied superconductivity, from fundamentals and materials right up to the details of many applications, is an essential reference for physicists and engineers in academic research as well as in industry. Readers looking for a comprehensive overview on basic effects related to superconductivity and superconducting materials will expand their knowledge and understanding of both low and high Tc superconductors with respect to their application. Technology, preparation and characterization are covered for bulk, single crystals, thins fi lms as well as electronic devices, wires and tapes. The main benefit of this work lies in its broad coverage of significant applications in magnets, power engineering, electronics, sensors and quantum metrology. The reader will find information on superconducting magnets for diverse applications like particle physics, fusion research, medicine, and biomagnetism as well as materials processing. SQUIDs and their usage in medicine or geophysics are thoroughly covered, as are superconducting radiation and particle detectors, aspects on superconductor digital electronics, leading readers to quantum computing and new devices.
Author: Antonello Andreone
Publisher: CRC Press
ISBN: 9780750309813
Category : Science
Languages : en
Pages : 344
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Book Description
According to its tradition, the EUCAS Conference focused on the role of superconductivity in bridging various aspects of research with a variety of concrete advanced applications. The wide interactions among scientists operating worldwide in the field of superconductivity and the sharing of their knowledge and experience represented the main result of the event. The EUCAS Conference has been an ideal forum for presentation and discussion of recent developments in the field of applied superconductivity in the area of power and electronic applications. Great emphasis has been given to materials research directly connected to such applications. For this conference, 515 plenary, invited, and contributed papers were accepted, covering different areas of applications that strongly benefit from the use of superconductivity, such as energy transportation, large magnet systems, biomedical instrumentation, digital electronics, wireless communications, and quantum computing. Forty-two plenary and invited papers are included in Applied Superconductivity 2003, along with a CD-ROM that contains PDF files of all the contributed papers linked from contents lists (and, for completeness, plenary and invited papers). These proceedings are addressed to international physicists, electrotechnical and electronic engineers, material scientists, and chemists interested in the most recent and exciting advances in the field of applied superconductivity.
Author: Manuel Cardona
Publisher: Springer Science & Business Media
ISBN: 3642825354
Category : Science
Languages : en
Pages : 343
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Book Description
Author: Vladimir Ivanovitch Kodolov
Publisher: CRC Press
ISBN: 1771883510
Category : Science
Languages : en
Pages : 368
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Book Description
This important book presents a collection of scientific papers on recent theoretical and practical advances in nanostructures, nanomaterials, and nanotechnologies. Highlighting some of the latest developments and trends in the field, the volume presents the developments of advanced nanostructured materials and the respective tools to characterize and predict their properties and behavior.
Author: Ayahiko Ichimiya
Publisher: Cambridge University Press
ISBN: 9780521453738
Category : Science
Languages : en
Pages : 370
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Book Description
Publisher Description
Author: W. Schommers
Publisher: Springer Science & Business Media
ISBN: 3642465749
Category : Technology & Engineering
Languages : en
Pages : 290
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Book Description
During the last decade, surface research has clearly shifted its interest from the macroscopic to the microscopic scale; a wealth of novel experimental techniques and theoretical methods have been applied and developed successfully. The Topics volume at hand gives an account of this tendency. For the understanding of surface phenomena and their exploitation in tech nical applications, the theoretical and experimental analysis at the microscopic level is of particular interest. In heterogeneous catalysis, for example, a chemical reaction takes place at the interface of two phases, and the process occurring at the surface is composed of a sequence of individual microscopic steps. These individual steps include adsorption, desorption, surface diffusion, and reaction on the surface. These elementary steps are greatly influenced by the structure and the dynamics of the surface region. Especially the catalytic activity may strongly depend on the structure of the catalyst's surface. The necessity of per forming surface investigations on a microscopic scale is also reflected clearly in research work relating to metal-semiconductor interfaces which determine es sentially the properties of electronic device materials. The experimental probe on the atomic scale, coupled with parallel theoretical calculations, showed that the electronic properties of a metal-semiconductor interface strongly depend on the crystallographic structure of the semiconductor; in particular, it is im portant to know in this context the modification of the atomic arrangement in the surface region caused by the termination of the crystal by the surface.
Author: Gertjan Koster
Publisher: Elsevier
ISBN: 0857094955
Category : Technology & Engineering
Languages : en
Pages : 295
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Book Description
Advanced techniques for characterizing thin film growth in situ help to develop improved understanding and faster diagnosis of issues with the process. In situ characterization of thin film growth reviews current and developing techniques for characterizing the growth of thin films, covering an important gap in research.Part one covers electron diffraction techniques for in situ study of thin film growth, including chapters on topics such as reflection high-energy electron diffraction (RHEED) and inelastic scattering techniques. Part two focuses on photoemission techniques, with chapters covering ultraviolet photoemission spectroscopy (UPS), X-ray photoelectron spectroscopy (XPS) and in situ spectroscopic ellipsometry for characterization of thin film growth. Finally, part three discusses alternative in situ characterization techniques. Chapters focus on topics such as ion beam surface characterization, real time in situ surface monitoring of thin film growth, deposition vapour monitoring and the use of surface x-ray diffraction for studying epitaxial film growth.With its distinguished editors and international team of contributors, In situ characterization of thin film growth is a standard reference for materials scientists and engineers in the electronics and photonics industries, as well as all those with an academic research interest in this area. - Chapters review electron diffraction techniques, including the methodology for observations and measurements - Discusses the principles and applications of photoemission techniques - Examines alternative in situ characterisation techniques
Author: Abdelhamid Abdelrehim Mahmoud Elshaer
Publisher: Cuvillier Verlag
ISBN: 386727701X
Category :
Languages : en
Pages : 143
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Book Description
