Applied Charged Particle Optics PDF Download
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Author: Helmut Liebl
Publisher: Springer Science & Business Media
ISBN: 3540719253
Category : Science
Languages : en
Pages : 131
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Book Description
Written by a pioneer in the field, this overview of charged particle optics provides a solid introduction to the subject area for all physicists wishing to design their own apparatus or better understand the instruments with which they work. It begins by introducing electrostatic lenses and fields used for acceleration, focusing and deflection of ions or electrons. Subsequent chapters give detailed descriptions of electrostatic deflection elements, uniform and non-uniform magnetic sector fields, image aberrations, and, finally, fringe field confinement.
Author: Helmut Liebl
Publisher: Springer Science & Business Media
ISBN: 3540719253
Category : Science
Languages : en
Pages : 131
Get Book Here
Book Description
Written by a pioneer in the field, this overview of charged particle optics provides a solid introduction to the subject area for all physicists wishing to design their own apparatus or better understand the instruments with which they work. It begins by introducing electrostatic lenses and fields used for acceleration, focusing and deflection of ions or electrons. Subsequent chapters give detailed descriptions of electrostatic deflection elements, uniform and non-uniform magnetic sector fields, image aberrations, and, finally, fringe field confinement.
Author: Albert L. Septier
Publisher:
ISBN:
Category : Electron optics
Languages : en
Pages : 426
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Book Description
Author:
Publisher:
ISBN:
Category :
Languages : en
Pages :
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Book Description
Author: Jon Orloff
Publisher: CRC Press
ISBN: 9780849325137
Category : Science
Languages : en
Pages : 532
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Book Description
This timely handbook contains chapters on the essential elements of high resolution charged particle optics and is written by many of the world's leading research scientists. It is a complete guide to understanding, designing, and using high resolution instrumentation such as transmission electron microscopes (TEMs), scanning electron microscopes (SEMs), scanning transmission electron microscopes (STEMs), and focused ion beam (FIB) systems. This handbook is evenly balanced between theory and application, and covers all the most important topics in this growing area. Handbook of High Resolution Charged Particle Optics explains how and why high resolution instruments work and how to apply this information when designing or using them.
Author: A. Septier
Publisher:
ISBN:
Category :
Languages : en
Pages :
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Book Description
Author: Albert Septier
Publisher:
ISBN:
Category :
Languages : en
Pages :
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Book Description
Author: A. Septier
Publisher:
ISBN:
Category :
Languages : en
Pages :
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Book Description
Author: Albert L. Septier
Publisher:
ISBN: 9780120145737
Category : Electron optics
Languages : en
Pages :
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Book Description
Author: A. Septier
Publisher:
ISBN:
Category :
Languages : en
Pages : 545
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Book Description
Author: Hermann Wollnik
Publisher: Academic Press
ISBN: 012821466X
Category : Science
Languages : en
Pages : 319
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Book Description
Optics of Charged Particles, 2nd edition, describes how charged particles move in the fields of magnetic and electrostatic dipoles, quadrupoles, higher order multipoles, and field-free regions. Since the first edition, published over 30 years ago, new technologies have emerged and have been used for new ion optical instruments like, for instance, time-of-flight mass analyzers, which are described now. Fully updated and revised, this new edition provides ways to design mass separators, spectrographs, and spectrometers, which are the key tools in organic chemistry and for drug developments, in environmental trace analyses and for investigations in nuclear physics like the search for super heavy elements as well as molecules in space science. The book discusses individual particle trajectories as well as particle beams in space and in phase-space, and it provides guidelines for the design of particle optical instruments. For experienced researchers, working in the field, it highlights the latest developments in new ion optical instruments and provides guidelines and examples for the design of new instruments for the transport of beams of charged particles and the mass/charge or energy/charge analyses of ions. Furthermore, it provides background knowledge required to accurately understand and analyze results, when developing ion-optical instruments. By providing a comprehensive overview of the field of charged particle optics, this edition of the book supports all those working, directly or indirectly, with charged-particle research or the development of ion- and electron-analyzing instruments. Provides enhanced, clear descriptions, and derivations making complex aspects of the general motion of charged particles understandable as well as features of charged particle analyzing instruments Assists the reader in applying insights obtained from the principles of charged particle optics to the design of new transporting and mass- or energy-analyzing instruments for ions Discusses new applications and newly occurring issues, which have arisen since the first edition
