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Author: T.A. Ezquerra
Publisher: Springer
ISBN: 3540959688
Category : Technology & Engineering
Languages : en
Pages : 318
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Book Description
In a ?rst approximation, certainly rough, one can de?ne as non-crystalline materials those which are neither single-crystals nor poly-crystals. Within this category, we canincludedisorderedsolids,softcondensed matter,andlivesystemsamong others. Contrary to crystals, non-crystalline materials have in common that their intrinsic structures cannot be exclusively described by a discrete and periodical function but by a continuous function with short range of order. Structurally these systems have in common the relevance of length scales between those de?ned by the atomic and the macroscopic scale. In a simple ?uid, for example, mobile molecules may freely exchange their positions, so that their new positions are permutations of their old ones. By contrast, in a complex ?uid large groups of molecules may be interc- nected so that the permutation freedom within the group is lost, while the p- mutation between the groups is possible. In this case, the dominant characteristic length, which may de?ne the properties of the system, is not the molecular size but that of the groups. A central aspect of some non-crystalline materials is that they may self-organize. This is of particular importance for Soft-matter materials. Self-organization is characterized by the spontaneous creation of regular structures at different length scales which may exhibit a certain hierarchy that controls the properties of the system. X-ray scattering and diffraction have been for more than a hundred years an essential technique to characterize the structure of materials. Quite often scattering anddiffractionphenomenaexhibitedbynon-crystallinematerialshavebeenreferred to as non-crystalline diffraction.
Author: T.A. Ezquerra
Publisher: Springer
ISBN: 3540959688
Category : Technology & Engineering
Languages : en
Pages : 318
Get Book
Book Description
In a ?rst approximation, certainly rough, one can de?ne as non-crystalline materials those which are neither single-crystals nor poly-crystals. Within this category, we canincludedisorderedsolids,softcondensed matter,andlivesystemsamong others. Contrary to crystals, non-crystalline materials have in common that their intrinsic structures cannot be exclusively described by a discrete and periodical function but by a continuous function with short range of order. Structurally these systems have in common the relevance of length scales between those de?ned by the atomic and the macroscopic scale. In a simple ?uid, for example, mobile molecules may freely exchange their positions, so that their new positions are permutations of their old ones. By contrast, in a complex ?uid large groups of molecules may be interc- nected so that the permutation freedom within the group is lost, while the p- mutation between the groups is possible. In this case, the dominant characteristic length, which may de?ne the properties of the system, is not the molecular size but that of the groups. A central aspect of some non-crystalline materials is that they may self-organize. This is of particular importance for Soft-matter materials. Self-organization is characterized by the spontaneous creation of regular structures at different length scales which may exhibit a certain hierarchy that controls the properties of the system. X-ray scattering and diffraction have been for more than a hundred years an essential technique to characterize the structure of materials. Quite often scattering anddiffractionphenomenaexhibitedbynon-crystallinematerialshavebeenreferred to as non-crystalline diffraction.
Author: T.A. Ezquerra
Publisher: Springer Science & Business Media
ISBN: 354095967X
Category : Science
Languages : en
Pages : 331
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Book Description
In a ?rst approximation, certainly rough, one can de?ne as non-crystalline materials those which are neither single-crystals nor poly-crystals. Within this category, we canincludedisorderedsolids,softcondensed matter,andlivesystemsamong others. Contrary to crystals, non-crystalline materials have in common that their intrinsic structures cannot be exclusively described by a discrete and periodical function but by a continuous function with short range of order. Structurally these systems have in common the relevance of length scales between those de?ned by the atomic and the macroscopic scale. In a simple ?uid, for example, mobile molecules may freely exchange their positions, so that their new positions are permutations of their old ones. By contrast, in a complex ?uid large groups of molecules may be interc- nected so that the permutation freedom within the group is lost, while the p- mutation between the groups is possible. In this case, the dominant characteristic length, which may de?ne the properties of the system, is not the molecular size but that of the groups. A central aspect of some non-crystalline materials is that they may self-organize. This is of particular importance for Soft-matter materials. Self-organization is characterized by the spontaneous creation of regular structures at different length scales which may exhibit a certain hierarchy that controls the properties of the system. X-ray scattering and diffraction have been for more than a hundred years an essential technique to characterize the structure of materials. Quite often scattering anddiffractionphenomenaexhibitedbynon-crystallinematerialshavebeenreferred to as non-crystalline diffraction.
Author: Wolfram Schnabel
Publisher: John Wiley & Sons
ISBN: 3527677739
Category : Technology & Engineering
Languages : en
Pages : 361
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Book Description
This first book to cover the interaction of polymers with radiation from the entire electromagnetic spectrum adopts a multidisciplinary approach to bridge polymer chemistry and physics, photochemistry, photophysics and materials science. The text is equally unique in its scope, devoting equal amounts of attention to the three aspects of synthesis, characterization, and applications. The first part deals with the interaction of polymers with non-ionizing radiation in the frequency-range from sub-terahertz via infrared radiation to visible and ultraviolet light, while the second covers interaction with ionizing radiation from the extreme ultraviolet to ?-ray photons. The result is a systematic overview of how both types of radiation can be used for different polymerization approaches, spectroscopy methods and lithography techniques. Authored by a world-renowned researcher and teacher with over 40 years of experience in the field, this is a highly practical and authoritative guide.
Author: Chunhai Fan
Publisher: John Wiley & Sons
ISBN: 352769708X
Category : Technology & Engineering
Languages : en
Pages : 265
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Book Description
Meeting the long-felt need for in-depth information on one of the most advanced material characterization methods, a top team of editors and authors from highly prestigious facilities and institutions covers a range of synchrotron techniques that have proven useful for materials research. Following an introduction to synchrotron radiation and its sources, the second part goes on to describe the various techniques that benefit from this especially bright light, including X-ray absorption, diffraction, scattering, imaging, and lithography. The thrid and final part provides an overview of the applications of synchrotron radiation in materials science. bridging the gap between specialists in synchrotron research and material scientists, this is a unique and indispensable resource for academic and industrial researchers alike.
Author: Ian W. Hamley
Publisher: John Wiley & Sons
ISBN: 1119768330
Category : Technology & Engineering
Languages : en
Pages : 288
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Book Description
SMALL-ANGLE SCATTERING A comprehensive and timely volume covering contemporary research, practical techniques, and theoretical approaches to SAXS and SANS Small-Angle Scattering: Theory, Instrumentation, Data, and Applications provides authoritative coverage of both small-angle X-ray scattering (SAXS), small-angle neutron scattering (SANS) and grazing incidence small-angle scattering (GISAS) including GISAXS and GISANS. This single-volume resource offers readers an up-to-date view of the state of the field, including the theoretical foundations, experimental methods, and practical applications of small-angle scattering (SAS) techniques including laboratory and synchrotron SAXS and reactor/spallation SANS. Organized into six chapters, the text first describes basic theory, instrumentation, and data analysis. The following chapters contain in-depth discussion on various applications of SAXS and SANS and GISAXS and GISANS, and on specific techniques for investigating structure and order in soft materials, biomolecules, and inorganic and magnetic materials. Author Ian Hamley draws from his more than thirty years’ experience working with many systems, instruments, and types of small-angle scattering experiments across most European facilities to present the most complete introduction to the field available. This book: Presents uniquely broad coverage of practical and theoretical approaches to SAXS and SANS Includes practical information on instrumentation and data analysis Offers useful examples and an accessible and concise presentation of topics Covers new developments in the techniques of SAXS and SANS, including GISAXS and GISANS Small-Angle Scattering: Theory, Instrumentation, Data, and Applications is a valuable source of detailed information for researchers and postgraduate students in the field, as well as other researchers using X-ray and neutron scattering to investigate soft materials, other nanostructured materials and biomolecules such as proteins.
Author: Chunhai Fan
Publisher: John Wiley & Sons
ISBN: 3527339868
Category : Technology & Engineering
Languages : en
Pages : 846
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Book Description
Meeting the long-felt need for in-depth information on one of the most advanced material characterization methods, a top team of editors and authors from highly prestigious facilities and institutions covers a range of synchrotron techniques that have proven useful for materials research. Following an introduction to synchrotron radiation and its sources, the second part goes on to describe the various techniques that benefit from this especially bright light, including X-ray absorption, diffraction, scattering, imaging, and lithography. The thrid and final part provides an overview of the applications of synchrotron radiation in materials science. bridging the gap between specialists in synchrotron research and material scientists, this is a unique and indispensable resource for academic and industrial researchers alike.
Author: John R. Reynolds
Publisher: CRC Press
ISBN: 0429524420
Category : Technology & Engineering
Languages : en
Pages : 909
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Book Description
This book covers properties, processing, and applications of conducting polymers. It discusses properties and characterization, including photophysics and transport. It then moves to processing and morphology of conducting polymers, covering such topics as printing, thermal processing, morphology evolution, conducting polymer composites, thin films
Author: Manuel Ross
Publisher: Springer
ISBN: 3319286463
Category : Science
Languages : en
Pages : 111
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Book Description
This thesis provides the first successful study of jump diffusion processes in glasses on the atomic scale, utilizing a novel coherent technique. This new method, called atomic-scale X-ray Photon Correlation Spectroscopy or aXPCS, has only recently been proven to be able to capture diffusion processes with atomic resolution in crystal systems. With this new toolkit for studying atomic diffusion in amorphous systems, new insight into basic processes in a wide range of technically relevant materials, like fast ionic conductors, can be obtained.
Author: Sunil K Sinha
Publisher: World Scientific
ISBN: 9811231524
Category : Science
Languages : en
Pages : 430
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Book Description
Advanced Characterization of Nanostructured Materials — Probing the Structure and Dynamics with Synchrotron X-Rays and Neutrons is a collection of chapters which review the characterization of the structure and internal dynamics of a wide variety of nanostructured materials using various synchrotron X-ray and neutron scattering techniques. It is intended for graduate students and researchers who might be interested in learning about and applying these methods. The authors are well-known practitioners in their fields of research who provide detailed and authoritative accounts of how these techniques have been applied to study systems ranging from thin films and monolayers on solid surfaces and at liquid-air, liquid-liquid and solid-liquid interfaces; nanostructured composite materials; battery materials, and catalytic materials. While there have been a great many books published on nanoscience, there are relatively few that have discussed in one volume detailed synchrotron X-ray and neutron methods for advanced characterization of nanomaterials in thin films, composite materials, catalytic and battery materials and at interfaces. This book should provide an incentive and a reference for researchers in nanomaterials for using these techniques as a powerful way to characterize their samples. It should also help to popularize the use of synchrotron and neutron facilities by the nanoscience community.
Author: Oliver H. Seeck
Publisher: CRC Press
ISBN: 9814303607
Category : Science
Languages : en
Pages : 438
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Book Description
High-resolution x-ray diffraction and scattering is a key tool for structure analysis not only in bulk materials but also at surfaces and buried interfaces from the sub-nanometer range to micrometers. This book offers an overview of diffraction and scattering methods currently available at modern synchrotron sources and illustrates bulk and interface investigations of solid and liquid matter with up-to-date research examples. It presents important characteristics of the sources, experimental set-up, and new detector developments. The book also considers future exploitation of x-ray free electron lasers for diffraction applications.