Analysis of Silicates and Ceramic Products by X-ray Fluorescence Spectrometry PDF Download
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Author: A. Boix
Publisher:
ISBN:
Category :
Languages : en
Pages : 23
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Author: A. Boix
Publisher:
ISBN:
Category :
Languages : en
Pages : 23
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Author: Harry Stoch
Publisher:
ISBN:
Category : Silicates
Languages : en
Pages : 26
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Author: Mary Kate Donais
Publisher: Momentum Press
ISBN: 1944749306
Category : Technology & Engineering
Languages : en
Pages : 217
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Book Description
This book serves as a practical guide for applications of X-ray fluorescence spectrometry, a nondestructive elemental analysis technique, to the study and understanding of archaeology. Descriptions of XRF theory and instrumentation and an introduction to field applications and practical aspects of archaeology provide new users to XRF and/or new to archaeology with a solid foundation on which to base further study. Considering recent trends within field archaeology, information specific to portable instrumentation also is provided. Discussions of qualitative and quantitative approaches and applications of statistical methods relate back to types of archaeological questions answerable through XRF analysis. Numerous examples, figures, and spectra from the authors’ field work are provided including chapters specific to pigments, ceramics, glass, construction materials, and metallurgical materials.
Author: Hak Jo Sang
Publisher:
ISBN:
Category :
Languages : en
Pages : 18
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Author:
Publisher:
ISBN:
Category :
Languages : en
Pages : 8
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The recommended procedure is applicable to a wide range of samples. Mineralogical effects are eliminated by fusion and grinding of the samples; this avoids the difficulties often encountered in the preparation of glass beads with flat surfaces. Matrix effects are reduced to an insignificant level by the addition of a heavy absorber in the form of lanthanum oxide. The calibrations are linear over wide ranges of concentrations, and the calibration standards are interchangeable. The accuracy has been assessed as good relative to chemical analyses and to the analysis of reference materials. Relative standard deviations, sr, range from 0,050 (at concentrations of 0,5) to 0,005 per cent (at concentrations greater than 20 per cent). The measurements are made on a Siemens MRS 400MP simultaneous X-ray-fluorescence spectrometer, the high sensitivity enabling limits of determination between 0,02 and 0,05 per cent in the sample to be achieved. Alternatively, a Siemens SRS 200 sequential X-ray-fluorescence spectrometer or an equivalent spectrometer can be used.
Author: Institute of Geological Sciences (Great Britain). Analytical and Ceramic Unit
Publisher:
ISBN:
Category :
Languages : en
Pages :
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Author: C. E. Austen
Publisher:
ISBN: 9780869990056
Category :
Languages : en
Pages : 16
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Author: Anton I. Mikhailov
Publisher: Cambridge Scholars Publishing
ISBN: 1527543897
Category : Science
Languages : en
Pages : 250
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Book Description
This book presents a complex approach to material composition determination based on the analysis of the joint X-ray spectrum, including fluorescence, scattering, and diffraction reflections. It considers fluorescence, scattered, and diffracted radiations within the common problem of analytical spectrum formation. The complex methods for analyzing the material composition by joint spectra of fluorescence, Compton scattering and diffraction proposed here allow for a widening of the area of the application of X-ray methods. The book will be useful for specialists in the field of solid state physics, as well as advanced and post-graduate students.
Author:
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ISBN:
Category :
Languages : en
Pages :
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An automated wavelength-dispersive x-ray fluorescence spectrometer is operational for analysis of major elements in rocks and minerals. Procedures for trace-element analysis are being developed. Sample preparation methods and analytical techniques are similar to those commonly used elsewhere, but data reduction is conducted by the Fundamental Parameters program developed by Criss. Unlike empirically derived calibration curves, this data reduction method considers x-ray absorption and secondary fluorescence, which vary with differences in sample composition. X-ray intensities for each element from several standards are averaged to develop a theoretical standard for comparison with samples of unknown composition. Accurate data for samples with wide compositional ranges result from these data reduction and standardization techniques.
Author: C. E. Austen
Publisher:
ISBN:
Category : X-ray spectroscopy
Languages : en
Pages : 16
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