Analog IC Reliability in Nanometer CMOS PDF Download
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Author: Elie Maricau
Publisher: Springer Science & Business Media
ISBN: 1461461634
Category : Technology & Engineering
Languages : en
Pages : 208
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Book Description
This book focuses on modeling, simulation and analysis of analog circuit aging. First, all important nanometer CMOS physical effects resulting in circuit unreliability are reviewed. Then, transistor aging compact models for circuit simulation are discussed and several methods for efficient circuit reliability simulation are explained and compared. Ultimately, the impact of transistor aging on analog circuits is studied. Aging-resilient and aging-immune circuits are identified and the impact of technology scaling is discussed. The models and simulation techniques described in the book are intended as an aid for device engineers, circuit designers and the EDA community to understand and to mitigate the impact of aging effects on nanometer CMOS ICs.
Author: Elie Maricau
Publisher: Springer Science & Business Media
ISBN: 1461461634
Category : Technology & Engineering
Languages : en
Pages : 208
Get Book Here
Book Description
This book focuses on modeling, simulation and analysis of analog circuit aging. First, all important nanometer CMOS physical effects resulting in circuit unreliability are reviewed. Then, transistor aging compact models for circuit simulation are discussed and several methods for efficient circuit reliability simulation are explained and compared. Ultimately, the impact of transistor aging on analog circuits is studied. Aging-resilient and aging-immune circuits are identified and the impact of technology scaling is discussed. The models and simulation techniques described in the book are intended as an aid for device engineers, circuit designers and the EDA community to understand and to mitigate the impact of aging effects on nanometer CMOS ICs.
Author: Harish Garg
Publisher: Springer Nature
ISBN: 9811999090
Category : Mathematics
Languages : en
Pages : 415
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Book Description
This book collects select chapters on modern industrial problems related to uncertainties and vagueness in the expert domain of knowledge. The book further provides the knowledge related to application of various mathematical and statistical tools in these areas. The results presented in the book help the researchers and scientists in handling complicated projects in their domains. Useful to industrialists, academicians, researchers and students alike, the book aims to help managers and technical specialists in designing and implementation of reliability and risk programs as below: Ensure the system safety and risk informed asset management Follow a proper strategy to maintain the mechanical components of the system Schedule the proper actions throughout the product life cycle Understand the structure and cost of a complex system Plan the proper schedule to improve the reliability and life of the system Identify unwanted failures and set up preventive and correction action
Author: Valentijn De Smedt
Publisher: Springer
ISBN: 3319090038
Category : Technology & Engineering
Languages : en
Pages : 422
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Book Description
This book investigates the possible circuit solutions to overcome the temperature and supply voltage-sensitivity of fully-integrated time references for ultra-low-power communication in wireless sensor networks. The authors provide an elaborate theoretical introduction and literature study to enable full understanding of the design challenges and shortcomings of current oscillator implementations. Furthermore, a closer look to the short-term as well as the long-term frequency stability of integrated oscillators is taken. Next, a design strategy is developed and applied to 5 different oscillator topologies and 1 sensor interface. All 6 implementations are subject to an elaborate study of frequency stability, phase noise and power consumption. In the final chapter all blocks are compared to the state of the art.
Author: ASM International
Publisher: ASM International
ISBN: 1627080996
Category : Technology & Engineering
Languages : en
Pages : 593
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Book Description
The International Symposium for Testing and Failure Analysis (ISTFA) 2018 is co-located with the International Test Conference (ITC) 2018, October 28 to November 1, in Phoenix, Arizona, USA at the Phoenix Convention Center. The theme for the November 2018 conference is "Failures Worth Analyzing." While technology advances fast and the market demands the latest and the greatest, successful companies strive to stay competitive and remain profitable.
Author: Esteban Tlelo-Cuautle
Publisher: BoD – Books on Demand
ISBN: 9533073233
Category : Technology & Engineering
Languages : en
Pages : 384
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Book Description
This book highlights key design issues and challenges to guarantee the development of successful applications of analog circuits. Researchers around the world share acquired experience and insights to develop advances in analog circuit design, modeling and simulation. The key contributions of the sixteen chapters focus on recent advances in analog circuits to accomplish academic or industrial target specifications.
Author: Esteban Tlelo-Cuautle
Publisher: Springer Science & Business Media
ISBN: 1461413834
Category : Technology & Engineering
Languages : en
Pages : 327
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Book Description
This book presents theory, design methods and novel applications for integrated circuits for analog signal processing. The discussion covers a wide variety of active devices, active elements and amplifiers, working in voltage mode, current mode and mixed mode. This includes voltage operational amplifiers, current operational amplifiers, operational transconductance amplifiers, operational transresistance amplifiers, current conveyors, current differencing transconductance amplifiers, etc. Design methods and challenges posed by nanometer technology are discussed and applications described, including signal amplification, filtering, data acquisition systems such as neural recording, sensor conditioning such as biomedical implants, actuator conditioning, noise generators, oscillators, mixers, etc. Presents analysis and synthesis methods to generate all circuit topologies from which the designer can select the best one for the desired application; Includes design guidelines for active devices/elements with low voltage and low power constraints; Offers guidelines for selecting the right active devices/elements in the design of linear and nonlinear circuits; Discusses optimization of the active devices/elements for process and manufacturing issues of nanometer technology.
Author: Sanjeet Dwivedi
Publisher: Springer Nature
ISBN: 9811905886
Category : Technology & Engineering
Languages : en
Pages : 642
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Book Description
This book compiles the refereed papers presented during the 2nd Flexible Electronics for Electric Vehicles (FlexEV - 2021). It presents the diligent work of the research community on flexible electronics applications in different allied fields of engineering - engineering materials to electrical engineering to electronics and communication engineering. The theoretical research concepts are supported with extensive reviews highlighting the trends in the possible and real-life applications of electric vehicles. This book will be useful for research scholars, electric vehicles professionals, driving system designers, and postgraduates from allied domains. This book incorporates economical and efficient electric vehicle driving and the latest innovations in electric vehicle technology with their paradigms and methods that employ knowledge in the research community.
Author: Harry J.M. Veendrick
Publisher: Springer
ISBN: 3319475975
Category : Technology & Engineering
Languages : en
Pages : 639
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Book Description
This textbook provides a comprehensive, fully-updated introduction to the essentials of nanometer CMOS integrated circuits. It includes aspects of scaling to even beyond 12nm CMOS technologies and designs. It clearly describes the fundamental CMOS operating principles and presents substantial insight into the various aspects of design implementation and application. Coverage includes all associated disciplines of nanometer CMOS ICs, including physics, lithography, technology, design, memories, VLSI, power consumption, variability, reliability and signal integrity, testing, yield, failure analysis, packaging, scaling trends and road blocks. The text is based upon in-house Philips, NXP Semiconductors, Applied Materials, ASML, IMEC, ST-Ericsson, TSMC, etc., courseware, which, to date, has been completed by more than 4500 engineers working in a large variety of related disciplines: architecture, design, test, fabrication process, packaging, failure analysis and software.
Author: Herman Casier
Publisher: Springer Science & Business Media
ISBN: 9400703910
Category : Technology & Engineering
Languages : en
Pages : 369
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Book Description
Analog Circuit Design contains the contribution of 18 tutorials of the 19th workshop on Advances in Analog Circuit Design. Each part discusses a specific to-date topic on new and valuable design ideas in the area of analog circuit design. Each part is presented by six experts in that field and state of the art information is shared and overviewed. This book is number 20 in this successful series of Analog Circuit Design, providing valuable information and excellent overviews of: Robust Design, chaired by Herman Casier, Consultant Sigma Delta Converters, chaired by Prof. Michiel Steyaert, Catholic University Leuven RFID, chaired by Prof. Arthur van Roermund, Eindhoven University of Technology Analog Circuit Design is an essential reference source for analog circuit designers and researchers wishing to keep abreast with the latest development in the field. The tutorial coverage also makes it suitable for use in an advanced design course.
Author: Soumya Pandit
Publisher: CRC Press
ISBN: 1466564288
Category : Technology & Engineering
Languages : en
Pages : 397
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Book Description
Reliability concerns and the limitations of process technology can sometimes restrict the innovation process involved in designing nano-scale analog circuits. The success of nano-scale analog circuit design requires repeat experimentation, correct analysis of the device physics, process technology, and adequate use of the knowledge database. Starting with the basics, Nano-Scale CMOS Analog Circuits: Models and CAD Techniques for High-Level Design introduces the essential fundamental concepts for designing analog circuits with optimal performances. This book explains the links between the physics and technology of scaled MOS transistors and the design and simulation of nano-scale analog circuits. It also explores the development of structured computer-aided design (CAD) techniques for architecture-level and circuit-level design of analog circuits. The book outlines the general trends of technology scaling with respect to device geometry, process parameters, and supply voltage. It describes models and optimization techniques, as well as the compact modeling of scaled MOS transistors for VLSI circuit simulation. • Includes two learning-based methods: the artificial neural network (ANN) and the least-squares support vector machine (LS-SVM) method • Provides case studies demonstrating the practical use of these two methods • Explores circuit sizing and specification translation tasks • Introduces the particle swarm optimization technique and provides examples of sizing analog circuits • Discusses the advanced effects of scaled MOS transistors like narrow width effects, and vertical and lateral channel engineering Nano-Scale CMOS Analog Circuits: Models and CAD Techniques for High-Level Design describes the models and CAD techniques, explores the physics of MOS transistors, and considers the design challenges involving statistical variations of process technology parameters and reliability constraints related to circuit design.
