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Author:
Publisher:
ISBN:
Category :
Languages : en
Pages : 45
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Book Description
A non-contact probe has been invented and developed for time resolved measurement of electrical waveforms with features as fast as one picosecond. The technique is based on atomic force microscopy modified for electrical sampling. Two generations of probe heads were designed, built, and tested. The fundamental limits of the system, including spatial, temporal, and voltage resolution, have been investigated. State of the art integrated circuits from Intel and National Semiconductor were tested with nanosecond resolution to show that the instrument has potential industrial application. U.S. Patents 5,381,101 and 5,488,305 were granted to Stanford University and licensed to industry. A GaAs nonlinear transmission line was monolithically integrated with a specially designed high speed cantilever and used to probe transients less than one picosecond in duration. Harmonic mixing frequencies as high as 333 GHz were measured.
Author:
Publisher:
ISBN:
Category :
Languages : en
Pages : 45
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Book Description
A non-contact probe has been invented and developed for time resolved measurement of electrical waveforms with features as fast as one picosecond. The technique is based on atomic force microscopy modified for electrical sampling. Two generations of probe heads were designed, built, and tested. The fundamental limits of the system, including spatial, temporal, and voltage resolution, have been investigated. State of the art integrated circuits from Intel and National Semiconductor were tested with nanosecond resolution to show that the instrument has potential industrial application. U.S. Patents 5,381,101 and 5,488,305 were granted to Stanford University and licensed to industry. A GaAs nonlinear transmission line was monolithically integrated with a specially designed high speed cantilever and used to probe transients less than one picosecond in duration. Harmonic mixing frequencies as high as 333 GHz were measured.
Author: Klaus D. Sattler
Publisher: CRC Press
ISBN: 1466505109
Category : Science
Languages : en
Pages : 754
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Book Description
Ushering in the next technological era, this state-of-the-art book focuses on the instrumentation and experiments emerging at the picometer scale. International scientists and researchers at the forefront of the field address the key challenges in developing new instrumentation and techniques to visualize and measure structures at this sub-nanometer level. The book helps you understand how picoscience is an extension of nanoscience, determine which experimental technique to use in your research, and connect basic studies to the development of next-generation picoelectronic devices.
Author: Kong-Thon Tsen
Publisher: Springer Science & Business Media
ISBN: 9783540402398
Category : Technology & Engineering
Languages : en
Pages : 424
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Book Description
An international team of experts describes the optical and electronic properties of semiconductors and semiconductor nanostructures at picosecond and femtosecond time scales. The contributions cover the latest research on a wide range of topics. In particular they include novel experimental techniques for studying and characterizing nanostructure materials. The contributions are written in a tutorial way so that not only researchers in the field but also researchers and graduate students outside the field can benefit.
Author: David Aaron Botkin
Publisher:
ISBN:
Category :
Languages : en
Pages : 320
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Book Description
Author: Massachusetts Institute of Technology. Research Laboratory of Electronics
Publisher:
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Category : Electronics
Languages : en
Pages : 540
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Category : Science
Languages : en
Pages : 634
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Category : Aeronautics
Languages : en
Pages : 994
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Category : Microwave communication systems
Languages : en
Pages : 52
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Category : Computers
Languages : en
Pages : 776
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Author: Bettina Anne Nechay
Publisher:
ISBN:
Category :
Languages : en
Pages : 274
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Book Description
