An Implementation of Constrained Quadratic O-1 Programming for Automatic Test Pattern Generation for VLSI Circuits PDF Download
Are you looking for read ebook online? Search for your book and save it on your Kindle device, PC, phones or tablets. Download An Implementation of Constrained Quadratic O-1 Programming for Automatic Test Pattern Generation for VLSI Circuits PDF full book. Access full book title An Implementation of Constrained Quadratic O-1 Programming for Automatic Test Pattern Generation for VLSI Circuits by Andrew Chang. Download full books in PDF and EPUB format.
Author: Andrew Chang
Publisher:
ISBN:
Category :
Languages : en
Pages : 192
Get Book Here
Book Description
Author: Andrew Chang
Publisher:
ISBN:
Category :
Languages : en
Pages : 192
Get Book Here
Book Description
Author: Nicola Nicolici
Publisher: Springer Science & Business Media
ISBN: 140207235X
Category : Computers
Languages : en
Pages : 182
Get Book Here
Book Description
This text focuses on techniques for minimizing power dissipation during test application at logic and register-transfer levels of abstraction of the VLSI design flow. It surveys existing techniques and presents several test automation techniques for reducing power in scan-based sequential circuits and BIST data paths.
Author: Kuljit S. Bains
Publisher:
ISBN:
Category : Integrated circuits
Languages : en
Pages : 310
Get Book Here
Book Description
Author: Ruey-sing Wei
Publisher:
ISBN:
Category :
Languages : en
Pages : 548
Get Book Here
Book Description
Author: Thomas E. Marchok
Publisher:
ISBN:
Category : Computer engineering
Languages : en
Pages : 138
Get Book Here
Book Description
Abstract: "Several manufacturing challenges have accompanied the explosive growth in the scale of integration for VLSI circuits. One of these is the increased difficulty of generating manufacturing test sets, which has resulted from the vast increase in the ratio of the number of transistors to the number of I/O pins. The difficulty of test generation is crucial since it impacts both the resultant product quality and time to market, both of which continue to gain importance in the present day semiconductor industry. Design for testability (DFT) techniques can be used to offset this difficulty. The mechanics of such techniques are well understood. DFT techniques are also known to increase other manufacturing costs and to decrease performance. Thus the relevant issue facing designers is not how to use DFT, but rather if such techniques should be applied. The correct decision is a matter of economics. Integrated circuit (IC) designers must balance manufacturing costs, performance, time to market, and product quality concerns. Achieving the desired balance requires the ability to quantify trade-offs in the different manufacturing costs which various DFT techniques would affect. Unfortunately, test generation cost is among the least predictable of these affected costs, even though the principal reason that DFT techniques are often applied is to reduce the difficulty of test generation. Furthermore, there does not exist a complete understanding of which circuit attributes influence the difficulty of test generation. In this thesis, a model is developed which predicts the difficulty of automatic test generation for non-scan sequential circuits. This model is based on a newly recognized circuit attribute, termed density of encoding, which differs from those notions which have been used to describe this difficulty in the past. This thesis also discusses how the concept of the density of encoding can be applied to devise more powerful sequential automatic test pattern generation algorithms, more efficient DFT techniques, and more effective synthesis for testability schemes."
Author: Ilker Hamzaoglu
Publisher:
ISBN:
Category :
Languages : en
Pages : 276
Get Book Here
Book Description
Author: Donald E. Edenfeld
Publisher:
ISBN:
Category :
Languages : en
Pages : 282
Get Book Here
Book Description
Author: Kyuchull Kim
Publisher:
ISBN:
Category :
Languages : en
Pages : 348
Get Book Here
Book Description
Author:
Publisher:
ISBN:
Category : Dissertations, Academic
Languages : en
Pages : 1116
Get Book Here
Book Description
Author: Wade H. Shafer
Publisher: Springer Science & Business Media
ISBN: 1461305993
Category : Science
Languages : en
Pages : 411
Get Book Here
Book Description
Masters Theses in the Pure and Applied Sciences was first conceived, published, and disseminated by the Center for Information and Numerical Data Analysis and Synthesis (CINDAS) * at Purdue University in 1 957, starting its coverage of theses with the academic year 1955. Beginning with Volume 13, the printing and dissemination phases of the activity were transferred to University Microfilms/Xerox of Ann Arbor, Michigan, with the thought that such an arrangement would be more beneficial to the academic and general scientific and technical community. After five years of this joint undertaking we had concluded that it was in the interest of all con cerned if the printing and distribution of the volumes were handled by an interna tional publishing house to assure improved service and broader dissemination. Hence, starting with Volume 18, Masters Theses in the Pure and Applied Sciences has been disseminated on a worldwide basis by Plenum Publishing Cor poration of New York, and in the same year the coverage was broadened to include Canadian universities. All back issues can also be ordered from Plenum. We have reported in Volume 32 (thesis year 1987) a total of 12,483 theses titles from 22 Canadian and 176 United States universities. We are sure that this broader base for these titles reported will greatly enhance the value of this important annual reference work. While Volume 32 reports theses submitted in 1987, on occasion, certain univer sities do report theses submitted in previous years but not reported at the time.
