An Approach to Test Pattern Generation for Synchronous Sequential Circuits PDF Download
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Author: Robert Stewart Lewis
Publisher:
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Category :
Languages : en
Pages :
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Author: Robert Stewart Lewis
Publisher:
ISBN:
Category :
Languages : en
Pages :
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Author: Marinus Hendrik Konijnenburg
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ISBN: 9789090120966
Category :
Languages : en
Pages : 226
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Author: Anna Rannaste
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ISBN: 9789949230419
Category :
Languages : en
Pages : 127
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Author: Kee Sup Kim
Publisher:
ISBN:
Category :
Languages : en
Pages : 386
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Author: Seong Yeon Choi
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ISBN:
Category : Fault-tolerant computing
Languages : en
Pages : 240
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In this thesis, the detection of permanent faults in sequential circuits by random testing is analyzed utilizing the circuit partitioning approach together with a continuous parameter Markov model. Given a large decomposable sequential circuit, it is partitioned into several smaller partitions using either serial or parallel decomposition. For each partition with certain stuck faults specified, the original state table and its error version are derived from an analysis of the partition under fault-free and faulty conditions, respectively. Then by simulation of these two tables on a computer, the parameters of the desired Markov model are obtained. For a specified degree of confidence, it is easy to derive the parameters of the Markov model and to calculate the required lengths of random test patterns.
Author: Bogdan Madzar
Publisher:
ISBN:
Category : Integrated circuits
Languages : en
Pages : 228
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Author: Venkat N. Koripalli
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ISBN:
Category :
Languages : en
Pages : 74
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The increase in speed and the shrinking of technology has led to modern day ICs becoming more sensitive to timing related defects. These defects must be rectified to prevent hazards in the circuit. The timing related defects can be identified with At-Speed Testing using the path delay fault model. A subset of the total number of paths known as critical paths cannot be sequentially activated i.e. we cannot find two successive vectors that activate a fault along the path. The elimination of untestable paths helps us to save a lot of time. In this report a new method, called the Launch-on-Shift is used to determine the testability of critical paths. The method uses a vector pair in which the first vector is the scan in steady state vector and the second vector is the function of the first vector.
Author: Heinrich Theodor Vierhaus
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ISBN:
Category :
Languages : de
Pages : 19
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Author: Jessica L. Handy
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ISBN:
Category :
Languages : en
Pages : 156
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Author: Yü Feng
Publisher:
ISBN:
Category : Integrated circuits
Languages : en
Pages : 48
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