Advanced X-ray Detector Technologies PDF Download
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Author: Krzysztof (Kris) Iniewski
Publisher: Springer Nature
ISBN: 3030642798
Category : Technology & Engineering
Languages : en
Pages : 297
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Book Description
This book offers readers an overview of some of the most recent advances in the field of detectors for X-ray imaging. Coverage includes both technology and applications, with an in-depth review of the research topics from leading specialists in the field. Emphasis is on high-Z materials like CdTe, CZT and perovskites, since they offer the best implementation possibilities for direct conversion X-ray detectors. Authors discuss material challenges, detector operation physics and technology and readout integrated circuits required to detect signals processes by high-Z sensors.
Author: Krzysztof (Kris) Iniewski
Publisher: Springer Nature
ISBN: 3030642798
Category : Technology & Engineering
Languages : en
Pages : 297
Get Book Here
Book Description
This book offers readers an overview of some of the most recent advances in the field of detectors for X-ray imaging. Coverage includes both technology and applications, with an in-depth review of the research topics from leading specialists in the field. Emphasis is on high-Z materials like CdTe, CZT and perovskites, since they offer the best implementation possibilities for direct conversion X-ray detectors. Authors discuss material challenges, detector operation physics and technology and readout integrated circuits required to detect signals processes by high-Z sensors.
Author: Krzysztof (Kris) Iniewski
Publisher: Springer Nature
ISBN: 3030764613
Category : Technology & Engineering
Languages : en
Pages : 357
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Book Description
This book offers readers an overview of some of the most recent advances in the field of advanced materials used for gamma and X-ray imaging. Coverage includes both technology and applications, with an in-depth review of the research topics from leading specialists in the field. Emphasis is on high-Z materials like CdTe, CZT and GaAs, as well as perovskite crystals, since they offer the best implementation possibilities for direct conversion X-ray detectors. Authors discuss material challenges, detector operation physics and technology and readout integrated circuits required to detect signals processes by high-Z sensors.
Author: National Academies of Sciences, Engineering, and Medicine
Publisher: National Academies Press
ISBN: 0309371333
Category : Technology & Engineering
Languages : en
Pages : 203
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Book Description
Passenger screening at commercial airports in the United States has gone through significant changes since the events of September 11, 2001. In response to increased concern over terrorist attacks on aircrafts, the Transportation Security Administration (TSA) has deployed security systems of advanced imaging technology (AIT) to screen passengers at airports. To date (December 2014), TSA has deployed AITs in U.S. airports of two different technologies that use different types of radiation to detect threats: millimeter wave and X-ray backscatter AIT systems. X-ray backscatter AITs were deployed in U.S. airports in 2008 and subsequently removed from all airports by June 2013 due to privacy concerns. TSA is looking to deploy a second-generation X-ray backscatter AIT equipped with privacy software to eliminate production of an image of the person being screened in order to alleviate these concerns. This report reviews previous studies as well as current processes used by the Department of Homeland Security and equipment manufacturers to estimate radiation exposures resulting from backscatter X-ray advanced imaging technology system use in screening air travelers. Airport Passenger Screening Using Backscatter X-Ray Machines examines whether exposures comply with applicable health and safety standards for public and occupational exposures to ionizing radiation and whether system design, operating procedures, and maintenance procedures are appropriate to prevent over exposures of travelers and operators to ionizing radiation. This study aims to address concerns about exposure to radiation from X-ray backscatter AITs raised by Congress, individuals within the scientific community, and others.
Author: Wanyi Nie
Publisher: Springer Nature
ISBN: 303126892X
Category : Technology & Engineering
Languages : en
Pages : 346
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Book Description
This book will provide readers with a good overview of some of most recent advances in the field of technology for perovskite materials. There will be a good mixture of general chapters in both technology and applications in opto-electronics, Xray detection and emerging transistor structures. The book will have an in-depth review of the research topics from world-leading specialists in the field. The authors build connections between the materials’ physical properties to the main applications such as photovoltaics, LED, FETs and X-ray sensors. They also discuss the similarities and main differences when using perovskites for those devices.
Author: Jiajun Wang
Publisher: Springer Nature
ISBN: 9811653283
Category : Technology & Engineering
Languages : en
Pages : 252
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Book Description
This book comprehensively outlines synchrotron-based X-ray imaging technologies and their associated applications in gaining fundamental insights into the physical and chemical properties as well as reaction mechanisms of energy materials. In this book the major X-ray imaging technologies utilised, depending on research goals and sample specifications, are discussed. With X-ray imaging techniques, the morphology, phase, lattice and strain information of energy materials in both 2D and 3D can be obtained in an intuitive way. In addition, due to the high penetration of X-rays, operando/in situ experiments can be designed to track the qualitative and quantitative changes of the samples during operation. This book will broader the reader’s view on X-ray imaging techniques and inspire new ideas and possibilities in energy materials research.
Author: Krzysztof (Kris) Iniewski
Publisher: Springer Nature
ISBN: 3030929892
Category : Technology & Engineering
Languages : en
Pages : 282
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Book Description
This book offers readers an overview of some of the most recent advances in the field of technology for X-ray medical imaging. Coverage includes both technology and applications in SPECT, PET and CT, with an in-depth review of the research topics from leading specialists in the field. Coverage includes conversion of the X-ray signal into analogue/digital value, as well as a review of CMOS chips for X-ray image sensors. Emphasis is on high-Z materials like CdTe, CZT and GaAs, since they offer the best implementation possibilities for direct conversion X-ray detectors. The discussion includes material challenges, detector operation physics and technology and readout integrated circuits required to detect signals processes by high-Z sensors. Authors contrast these emerging technologies with more established ones based on scintillator materials. This book is an excellent reference for people already working in the field as well as for people wishing to enter it.
Author: Tobias Reusch
Publisher: Universitätsverlag Göttingen
ISBN: 3863951271
Category :
Languages : en
Pages : 154
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Book Description
The main goal of this thesis was to extend and apply time resolved x-ray scattering experiments at in-house, synchrotron and free electron laser sources to soft matter sample systems, in particular aligned lipid multilayers on solid support. A special emphasis was placed on a characterization of the non-equilibrium fast time response of the multilamellar stack to shortly pulsed optical excitation as well as the acousto-electric field accompanying a surface acoustic wave (SAW). In addition to fundamental questions associated with non-equilibrium dynamics of soft matter films such as driven membrane undulations, this thesis addresses technological challenges of time resolved x-ray diffraction, in particular concerning the timing scheme that has been implemented at the synchrotron storage ring Petra III, DESY, Hamburg. Importantly, a conceptually new pulse resolved x-ray detection scheme, well exceeding the performance of present detector concepts, has been developed and is described in detail.
Author: United States. National Aeronautics and Space Administration
Publisher:
ISBN:
Category : Astronautics
Languages : en
Pages : 298
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Book Description
Author:
Publisher:
ISBN:
Category : Astronautics
Languages : en
Pages : 600
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Book Description
Author: Graham N. George
Publisher: Walter de Gruyter GmbH & Co KG
ISBN: 3110570572
Category : Science
Languages : en
Pages : 591
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Book Description
Targeted for chemists, the current textbook outlines the principles, experimental methods and data analysis in X-Ray Absorption Spectroscopy (XAS). The authors introduce EXAFS, Near-Edge XAS, X-Ray Imaging and many other advanced experimental techniques. A special section of the book is devoted to applications of XAS in chemistry, materials and environmental sciences.
