Advanced Mathematical And Computational Tools In Metrology Vi PDF Download
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Author: Patrizia Ciarlini
Publisher: World Scientific
ISBN: 9814482412
Category : Computers
Languages : en
Pages : 367
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Book Description
This volume collects refereed contributions based on the presentations made at the Sixth Workshop on Advanced Mathematical and Computational Tools in Metrology, held at the Istituto di Metrologia “G. Colonnetti” (IMGC), Torino, Italy, in September 2003. It provides a forum for metrologists, mathematicians and software engineers that will encourage a more effective synthesis of skills, capabilities and resources, and promotes collaboration in the context of EU programmes, EUROMET and EA projects, and MRA requirements. It contains articles by an important, worldwide group of metrologists and mathematicians involved in measurement science and, together with the five previous volumes in this series, constitutes an authoritative source for the mathematical, statistical and software tools necessary to modern metrology.The proceedings have been selected for coverage in:Index to Scientific & Technical Proceedings® (ISTP® / ISI Proceedings)Index to Scientific & Technical Proceedings (ISTP CDROM version / ISI Proceedings)CC Proceedings — Engineering & Physical Sciences
Author: Patrizia Ciarlini
Publisher: World Scientific
ISBN: 9814482412
Category : Computers
Languages : en
Pages : 367
Get Book Here
Book Description
This volume collects refereed contributions based on the presentations made at the Sixth Workshop on Advanced Mathematical and Computational Tools in Metrology, held at the Istituto di Metrologia “G. Colonnetti” (IMGC), Torino, Italy, in September 2003. It provides a forum for metrologists, mathematicians and software engineers that will encourage a more effective synthesis of skills, capabilities and resources, and promotes collaboration in the context of EU programmes, EUROMET and EA projects, and MRA requirements. It contains articles by an important, worldwide group of metrologists and mathematicians involved in measurement science and, together with the five previous volumes in this series, constitutes an authoritative source for the mathematical, statistical and software tools necessary to modern metrology.The proceedings have been selected for coverage in:Index to Scientific & Technical Proceedings® (ISTP® / ISI Proceedings)Index to Scientific & Technical Proceedings (ISTP CDROM version / ISI Proceedings)CC Proceedings — Engineering & Physical Sciences
Author: Franco Pavese
Publisher: World Scientific
ISBN: 9812839526
Category : Technology & Engineering
Languages : en
Pages : 419
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Book Description
The main theme of the AMCTM 2008 conference, reinforced by the establishment of IMEKO TC21, was to provide a central opportunity for the metrology and testing community worldwide to engage with applied mathematicians, statisticians and software engineers working in the relevant fields. This review volume consists of reviewed papers prepared on the basis of the oral and poster presentations of the Conference participants. It covers all the general matters of advanced statistical modeling (e.g. uncertainty evaluation, experimental design, optimization, data analysis and applications, multiple measurands, correlation, etc.), metrology software (e.g. engineering aspects, requirements or specification, risk assessment, software development, software examination, software tools for data analysis, visualization, experiment control, best practice, standards, etc.), numerical methods (e.g. numerical data analysis, numerical simulations, inverse problems, uncertainty evaluation of numerical algorithms, applications, etc.), and data fusion techniques and design and analysis of inter-laboratory comparisons.
Author: P. Ciarlini
Publisher: World Scientific
ISBN: 9812566740
Category : Computers
Languages : en
Pages : 386
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Book Description
This volume collects the refereed contributions based on the presentations made at the Seventh Workshop on Advanced Mathematical and Computational Tools in Metrology, a forum for metrologists, mathematicians and software engineers that will encourage a more effective synthesis of skills, capabilities and resources. The volume contains articles by world renowned metrologists and mathematicians involved in measurement science and, together with the six previous volumes in this series, constitutes an authoritative source of the mathematical, statistical and software tools necessary in modern metrology. Contents: Modeling Measurement Processes in Complex Systems with Partial Differential Equations: From Heat Conduction to the Heart (M Baer et al.); Mereotipological Approach for Measurement Software (E Benoit & R Dapoigny); Data Evaluation of Key Comparisons Involving Several Artefacts (M G Cox et al.); Box-Cox Transformations Versus Robust Control Charts in Statistical Process Control (M I Gomes & F O Figueiredo); Decision Making Using Sensor's Data Fusion and Kohonen Self Organizing Maps (P S Girao et al.); Generic System Design for Measurement Databases Applied to Calibrations in Vacuum Metrology, Bio-Signals and a Template System (H Gro et al.); Repeated Measurements: Evaluation of Their Uncertainty from the Viewpoints of Classical and Bayesian Statistics (I Lira & W Woger); Detection of Outliers in Interlaboratory Testing and Some Thoughts About Multivariate Precision (C Perruchet); On Appropriate Methods for the Validation of Metrological Software (D Richter et al.); Data Analysis-A Dialogue (D S Sivia); Validation of a Virtual Sensor for Monitoring Ambient Parameters (P Ciarlini et al.); Evaluation of Standard Uncertainties in Nested Structures (E Filipe); Linking GUM and ISO 5725 (A B Forbes); Monte Carlo Study on Logical and Statistical Correlation (B Siebert et al.); Some Problems Concerning the Estimate of the Uncertainty of the Degree of Equivalence in MRA Key Comparisons (F Pavese); Preparing for a European Research Area Network in Metrology: Where are We Now? (M Kuhne et al.); and other papers. Readership: Researchers, graduate students, academics and professionals in metrology.
Author: Valery A. Slaev
Publisher: Walter de Gruyter GmbH & Co KG
ISBN: 3110652501
Category : Science
Languages : en
Pages : 558
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Book Description
Metrology is the science of measurements. As such, it deals with the problem of obtaining knowledge of physical reality through its quantifiable properties. The problems of measurement and of measurement accuracy are central to all natural and technical sciences. Now in its second edition, this monograph conveys the fundamental theory of measurement and provides some algorithms for result testing and validation.
Author: Berardino D'acunto
Publisher: World Scientific Publishing Company
ISBN: 9813106417
Category : Mathematics
Languages : en
Pages : 300
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Book Description
This book provides a good introduction to modern computational methods for Partial Differential Equations in Mechanics. Finite-difference methods for parabolic, hyperbolic as well as elliptic partial differential equations are discussed.A gradual and inductive approach to the numerical concepts has been used, such that the presentation of the theory is easily accessible to upper-level undergraduate and graduate students. Special attention has been given to the applications, with many examples and exercises provided along with solutions. For each type of equation, physical models are carefully derived and presented in full details.Windows programs developed in C++ language have been included in the accompanying CD-ROM. These programs can be easily modified to solve different problems, and the reader is encouraged to take full advantage of the innovative features of this powerful development tool.
Author: Franco Pavese
Publisher: Springer Science & Business Media
ISBN: 0817648046
Category : Mathematics
Languages : en
Pages : 499
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Book Description
This book provide a comprehensive set of modeling methods for data and uncertainty analysis, taking readers beyond mainstream methods and focusing on techniques with a broad range of real-world applications. The book will be useful as a textbook for graduate students, or as a training manual in the fields of calibration and testing. The work may also serve as a reference for metrologists, mathematicians, statisticians, software engineers, chemists, and other practitioners with a general interest in measurement science.
Author: Franco Pavese
Publisher: World Scientific Publishing Company
ISBN: 9789811242373
Category : Metrology
Languages : en
Pages : 0
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Book Description
"Description of state-of-the-art techniques for modeling measurement systems and analyzing measurement data. Written by researchers active in institutions developing world-leading measurement capabilities. Provides a multi-disciplinary approach to addressing measurement challenges in a wide range of application domains"--
Author: Patrizia Ciarlini
Publisher: World Scientific
ISBN: 9814493635
Category : Mathematics
Languages : en
Pages : 334
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Book Description
Advances in metrology depend on improvements in scientific and technical knowledge and in instrumentation quality, as well as better use of advanced mathematical tools and development of new ones. In this volume, scientists from both the mathematical and the metrological fields exchange their experiences. Industrial sectors, such as instrumentation and software, are likely to benefit from this exchange, since metrology has a high impact on the overall quality of industrial products, and applied mathematics is becoming more and more important in industrial processes.This book is of interest to people in universities, research centers and industries who are involved in measurements and need advanced mathematical tools to solve their problems, and to those developing such mathematical tools.
Author: Pierluigi Colli
Publisher: World Scientific
ISBN: 9812566503
Category : Mathematics
Languages : en
Pages : 321
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Book Description
Phase transition phenomena arise in a variety of relevant real world situations, such as melting and freezing in a solid-liquid system, evaporation, solid-solid phase transitions in shape memory alloys, combustion, crystal growth, damage in elastic materials, glass formation, phase transitions in polymers, and plasticity.The practical interest of such phenomenology is evident and has deeply influenced the technological development of our society, stimulating intense mathematical research in this area.This book analyzes and approximates some models and related partial differential equation problems that involve phase transitions in different contexts and include dissipation effects.
Author: Martin Galler
Publisher: World Scientific
ISBN: 9812563555
Category : Philosophy
Languages : en
Pages : 247
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Book Description
Deterministic simulation of the particle transport in semiconductor devices is an interesting alternative to the common Monte Carlo approach. In this book, a state-of-the-art technique called the multigroup approach is presented and applied to a variety of transport problems in bulk semiconductors and semiconductor devices. High-field effects as well as hot-phonon phenomena in polar semiconductors are studied in detail. The mathematical properties of the presented numerical method are studied, and the method is applied to simulating the transport of a two-dimensional electron gas formed at a semiconductor heterostructure. Concerning semiconductor device simulation, several diodes and transistors fabricated of silicon and gallium arsenide are investigated. For all of these simulations, the numerical techniques employed are discussed in detail.This unique study of the application of direct methods for semiconductor device simulation provides the interested reader with an indispensable reference on this growing research area.
