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Author: P Ciarlini
Publisher: World Scientific
ISBN: 9814482412
Category : Computers
Languages : en
Pages : 368
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Book Description
This volume collects refereed contributions based on the presentations made at the Sixth Workshop on Advanced Mathematical and Computational Tools in Metrology, held at the Istituto di Metrologia “G. Colonnetti” (IMGC), Torino, Italy, in September 2003. It provides a forum for metrologists, mathematicians and software engineers that will encourage a more effective synthesis of skills, capabilities and resources, and promotes collaboration in the context of EU programmes, EUROMET and EA projects, and MRA requirements. It contains articles by an important, worldwide group of metrologists and mathematicians involved in measurement science and, together with the five previous volumes in this series, constitutes an authoritative source for the mathematical, statistical and software tools necessary to modern metrology. The proceedings have been selected for coverage in: Index to Scientific & Technical Proceedings® (ISTP® / ISI Proceedings)Index to Scientific & Technical Proceedings (ISTP CDROM version / ISI Proceedings)CC Proceedings — Engineering & Physical Sciences Contents:Processing the Coherent Anomalies on Digitalized Surfaces in Wavelet Domain (P Ciarlini & M L Lo Cascio)Least Squares Adjustment in the Presence of Discrepant Data (M G Cox et al.)Some Differences between the Applied Statistical Approach for Measurement Uncertainty Theory and the Traditional Approach in Metrology and Testing (C Perruchet)Compound-Modelling of Metrological Data Series (F Pavese)Validation of Calibration Methods — A Practical Approach (E Filipe)A Hybrid Method for (ℓ1 Approximation (D Lei & J C Mason)A New Off-Line Gain Stabilisation Method Applied to Alpha-Particle Spectrometry (S Pommé & G Sibbens)Development of Software for ANOVA that Can Generate Expressions of Variance Expectations (H Tanaka et al.)Short Course on Uncertainty Evaluation (M G Cox)Software Requirements in Legal Metrology: Short Course Held Adjacent to the Conference (D Richter)and other articles Readership: Researchers, graduate students, academics, professionals and industrialists in metrology. Keywords:Metrology;Measurement Science;Statistics;Software ToolsKey Features:Promotes effective mathematical and computational tools in metrologyClarifies the modelling, statistical and computational requirements in metrologyAssists young researchers in metrology and related fieldsAddresses industrial requirements
Author: P Ciarlini
Publisher: World Scientific
ISBN: 9814482412
Category : Computers
Languages : en
Pages : 368
Get Book
Book Description
This volume collects refereed contributions based on the presentations made at the Sixth Workshop on Advanced Mathematical and Computational Tools in Metrology, held at the Istituto di Metrologia “G. Colonnetti” (IMGC), Torino, Italy, in September 2003. It provides a forum for metrologists, mathematicians and software engineers that will encourage a more effective synthesis of skills, capabilities and resources, and promotes collaboration in the context of EU programmes, EUROMET and EA projects, and MRA requirements. It contains articles by an important, worldwide group of metrologists and mathematicians involved in measurement science and, together with the five previous volumes in this series, constitutes an authoritative source for the mathematical, statistical and software tools necessary to modern metrology. The proceedings have been selected for coverage in: Index to Scientific & Technical Proceedings® (ISTP® / ISI Proceedings)Index to Scientific & Technical Proceedings (ISTP CDROM version / ISI Proceedings)CC Proceedings — Engineering & Physical Sciences Contents:Processing the Coherent Anomalies on Digitalized Surfaces in Wavelet Domain (P Ciarlini & M L Lo Cascio)Least Squares Adjustment in the Presence of Discrepant Data (M G Cox et al.)Some Differences between the Applied Statistical Approach for Measurement Uncertainty Theory and the Traditional Approach in Metrology and Testing (C Perruchet)Compound-Modelling of Metrological Data Series (F Pavese)Validation of Calibration Methods — A Practical Approach (E Filipe)A Hybrid Method for (ℓ1 Approximation (D Lei & J C Mason)A New Off-Line Gain Stabilisation Method Applied to Alpha-Particle Spectrometry (S Pommé & G Sibbens)Development of Software for ANOVA that Can Generate Expressions of Variance Expectations (H Tanaka et al.)Short Course on Uncertainty Evaluation (M G Cox)Software Requirements in Legal Metrology: Short Course Held Adjacent to the Conference (D Richter)and other articles Readership: Researchers, graduate students, academics, professionals and industrialists in metrology. Keywords:Metrology;Measurement Science;Statistics;Software ToolsKey Features:Promotes effective mathematical and computational tools in metrologyClarifies the modelling, statistical and computational requirements in metrologyAssists young researchers in metrology and related fieldsAddresses industrial requirements
Author: Franco Pavese
Publisher: World Scientific
ISBN: 9814397954
Category : Mathematics
Languages : en
Pages : 468
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Book Description
This volume contains original, refereed worldwide contributions. They were prompted by presentations made at the ninth AMCTM Conference held in Goteborg (Sweden) in June 2011 on the theme of advanced mathematical and computational tools in metrology and also, in the title of this book series, in testing. The themes in this volume reflect the importance of the mathematical, statistical and numerical tools and techniques in metrology and testing and, also in keeping the challenge promoted by the Metre Convention, to access a mutual recognition for the measurement standards.
Author: Patrizia Ciarlini
Publisher: World Scientific
ISBN: 981449190X
Category : Mathematics
Languages : en
Pages : 393
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Book Description
Advances in metrology depend on improvements in scientific and technical knowledge and in instrumentation quality, as well as on better use of advanced mathematical tools and development of new ones. In this volume, scientists from both the mathematical and the metrological fields exchange their experiences. Industrial sectors, such as instrumentation and software, will benefit from this exchange, since metrology has a high impact on the overall quality of industrial products, and applied mathematics is becoming more and more important in industrial processes.This book is of interest to people in universities, research centers and industries who are involved in measurements and need advanced mathematical tools to solve their problems, and also to those developing such mathematical tools.
Author: Alistair B Forbes
Publisher: World Scientific
ISBN: 981327431X
Category : Mathematics
Languages : en
Pages : 460
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Book Description
This volume contains original, refereed contributions by researchers from institutions and laboratories across the world that are involved in metrology and testing. They were adapted from presentations made at the eleventh edition of the Advanced Mathematical and Computational Tools in Metrology and Testing conference held at the University of Strathclyde, Glasgow, in September 2017, organized by IMEKO Technical Committee 21, the National Physical Laboratory, UK, and the University of Strathclyde. The papers present new modeling approaches, algorithms and computational methods for analyzing data from metrology systems and for evaluation of the measurement uncertainty, and describe their applications in a wide range of measurement areas.This volume is useful to all researchers, engineers and practitioners who need to characterize the capabilities of measurement systems and evaluate measurement data. Through the papers written by experts working in leading institutions, it covers the latest computational approaches and describes applications to current measurement challenges in engineering, environment and life sciences.
Author:
Publisher:
ISBN: 9814468517
Category :
Languages : en
Pages :
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Book Description
Author: Franco Pavese
Publisher: World Scientific
ISBN: 9812839526
Category : Technology & Engineering
Languages : en
Pages : 419
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Book Description
The main theme of the AMCTM 2008 conference, reinforced by the establishment of IMEKO TC21, was to provide a central opportunity for the metrology and testing community worldwide to engage with applied mathematicians, statisticians and software engineers working in the relevant fields. This review volume consists of reviewed papers prepared on the basis of the oral and poster presentations of the Conference participants. It covers all the general matters of advanced statistical modeling (e.g. uncertainty evaluation, experimental design, optimization, data analysis and applications, multiple measurands, correlation, etc.), metrology software (e.g. engineering aspects, requirements or specification, risk assessment, software development, software examination, software tools for data analysis, visualization, experiment control, best practice, standards, etc.), numerical methods (e.g. numerical data analysis, numerical simulations, inverse problems, uncertainty evaluation of numerical algorithms, applications, etc.), and data fusion techniques and design and analysis of inter-laboratory comparisons.
Author: P. Ciarlini
Publisher: World Scientific
ISBN: 9810242166
Category : Science
Languages : en
Pages : 334
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Book Description
Advances in metrology depend on improvements in scientific and technical knowledge and in instrumentation quality, as well as better use of advanced mathematical tools and development of new ones. In this volume, scientists from both the mathematical and the metrological fields exchange their experiences. Industrial sectors, such as instrumentation and software, are likely to benefit from this exchange, since metrology has a high impact on the overall quality of industrial products, and applied mathematics is becoming more and more important in industrial processes.This book is of interest to people in universities, research centers and industries who are involved in measurements and need advanced mathematical tools to solve their problems, and to those developing such mathematical tools.
Author: P. Ciarlini
Publisher: World Scientific
ISBN: 9812566740
Category : Computers
Languages : en
Pages : 386
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Book Description
This volume collects the refereed contributions based on the presentations made at the Seventh Workshop on Advanced Mathematical and Computational Tools in Metrology, a forum for metrologists, mathematicians and software engineers that will encourage a more effective synthesis of skills, capabilities and resources. The volume contains articles by world renowned metrologists and mathematicians involved in measurement science and, together with the six previous volumes in this series, constitutes an authoritative source of the mathematical, statistical and software tools necessary in modern metrology. Contents: Modeling Measurement Processes in Complex Systems with Partial Differential Equations: From Heat Conduction to the Heart (M Baer et al.); Mereotipological Approach for Measurement Software (E Benoit & R Dapoigny); Data Evaluation of Key Comparisons Involving Several Artefacts (M G Cox et al.); Box-Cox Transformations Versus Robust Control Charts in Statistical Process Control (M I Gomes & F O Figueiredo); Decision Making Using Sensor's Data Fusion and Kohonen Self Organizing Maps (P S Girao et al.); Generic System Design for Measurement Databases Applied to Calibrations in Vacuum Metrology, Bio-Signals and a Template System (H Gro et al.); Repeated Measurements: Evaluation of Their Uncertainty from the Viewpoints of Classical and Bayesian Statistics (I Lira & W Woger); Detection of Outliers in Interlaboratory Testing and Some Thoughts About Multivariate Precision (C Perruchet); On Appropriate Methods for the Validation of Metrological Software (D Richter et al.); Data Analysis-A Dialogue (D S Sivia); Validation of a Virtual Sensor for Monitoring Ambient Parameters (P Ciarlini et al.); Evaluation of Standard Uncertainties in Nested Structures (E Filipe); Linking GUM and ISO 5725 (A B Forbes); Monte Carlo Study on Logical and Statistical Correlation (B Siebert et al.); Some Problems Concerning the Estimate of the Uncertainty of the Degree of Equivalence in MRA Key Comparisons (F Pavese); Preparing for a European Research Area Network in Metrology: Where are We Now? (M Kuhne et al.); and other papers. Readership: Researchers, graduate students, academics and professionals in metrology.
Author: P. Ciarlini
Publisher: World Scientific
ISBN: 9812389040
Category : Computers
Languages : en
Pages : 367
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Book Description
This volume collects refereed contributions based on the presentations made at the Sixth Workshop on Advanced Mathematical and Computational Tools in Metrology, held at the Istituto di Metrologia “G. Colonnetti” (IMGC), Torino, Italy, in September 2003. It provides a forum for metrologists, mathematicians and software engineers that will encourage a more effective synthesis of skills, capabilities and resources, and promotes collaboration in the context of EU programmes, EUROMET and EA projects, and MRA requirements. It contains articles by an important, worldwide group of metrologists and mathematicians involved in measurement science and, together with the five previous volumes in this series, constitutes an authoritative source for the mathematical, statistical and software tools necessary to modern metrology.The proceedings have been selected for coverage in: Index to Scientific & Technical Proceedings® (ISTP® / ISI Proceedings)Index to Scientific & Technical Proceedings (ISTP CDROM version / ISI Proceedings)CC Proceedings — Engineering & Physical Science
Author: Franco Pavese
Publisher:
ISBN: 9789811242380
Category : Electronic books
Languages : en
Pages : 546
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Book Description
