Advanced Laser Diode Reliability PDF Download
Are you looking for read ebook online? Search for your book and save it on your Kindle device, PC, phones or tablets. Download Advanced Laser Diode Reliability PDF full book. Access full book title Advanced Laser Diode Reliability by Massimo Vanzi. Download full books in PDF and EPUB format.
Author: Massimo Vanzi
Publisher: Elsevier
ISBN: 0081010893
Category : Technology & Engineering
Languages : en
Pages : 270
Get Book Here
Book Description
Advanced Laser Diode Reliability focuses on causes and effects of degradations of state-of-the-art semiconductor laser diodes. It aims to provide a tool for linking practical measurements to physical diagnostics. To this purpose, it reviews the current technologies, addressing their peculiar details that can promote specific failure mechanisms. Two sections will support this kernel: a) Failure Analysis techniques, procedures and examples; b) Device-oriented laser modelling and parameter extraction. - Talk about Natural continuity with the most widespread existing textbooks, published by Mitsuo Fukuda - Present the extension to new failure mechanisms, new technologies, new application fields, new environments - Introduce a specific self-consistent model for the physical description of a laser diode, expressed in terms of practically measurable quantities
Author: Massimo Vanzi
Publisher: Elsevier
ISBN: 0081010893
Category : Technology & Engineering
Languages : en
Pages : 270
Get Book Here
Book Description
Advanced Laser Diode Reliability focuses on causes and effects of degradations of state-of-the-art semiconductor laser diodes. It aims to provide a tool for linking practical measurements to physical diagnostics. To this purpose, it reviews the current technologies, addressing their peculiar details that can promote specific failure mechanisms. Two sections will support this kernel: a) Failure Analysis techniques, procedures and examples; b) Device-oriented laser modelling and parameter extraction. - Talk about Natural continuity with the most widespread existing textbooks, published by Mitsuo Fukuda - Present the extension to new failure mechanisms, new technologies, new application fields, new environments - Introduce a specific self-consistent model for the physical description of a laser diode, expressed in terms of practically measurable quantities
Author: Peter W. Epperlein
Publisher: John Wiley & Sons
ISBN: 1118481860
Category : Technology & Engineering
Languages : en
Pages : 522
Get Book Here
Book Description
This reference book provides a fully integrated novel approach to the development of high-power, single-transverse mode, edge-emitting diode lasers by addressing the complementary topics of device engineering, reliability engineering and device diagnostics in the same book, and thus closes the gap in the current book literature. Diode laser fundamentals are discussed, followed by an elaborate discussion of problem-oriented design guidelines and techniques, and by a systematic treatment of the origins of laser degradation and a thorough exploration of the engineering means to enhance the optical strength of the laser. Stability criteria of critical laser characteristics and key laser robustness factors are discussed along with clear design considerations in the context of reliability engineering approaches and models, and typical programs for reliability tests and laser product qualifications. Novel, advanced diagnostic methods are reviewed to discuss, for the first time in detail in book literature, performance- and reliability-impacting factors such as temperature, stress and material instabilities. Further key features include: practical design guidelines that consider also reliability related effects, key laser robustness factors, basic laser fabrication and packaging issues; detailed discussion of diagnostic investigations of diode lasers, the fundamentals of the applied approaches and techniques, many of them pioneered by the author to be fit-for-purpose and novel in the application; systematic insight into laser degradation modes such as catastrophic optical damage, and a wide range of technologies to increase the optical strength of diode lasers; coverage of basic concepts and techniques of laser reliability engineering with details on a standard commercial high power laser reliability test program. Semiconductor Laser Engineering, Reliability and Diagnostics reflects the extensive expertise of the author in the diode laser field both as a top scientific researcher as well as a key developer of high-power highly reliable devices. With invaluable practical advice, this new reference book is suited to practising researchers in diode laser technologies, and to postgraduate engineering students.
Author: D. Sands
Publisher: CRC Press
ISBN: 9781420056990
Category : Science
Languages : en
Pages : 468
Get Book Here
Book Description
The compact size, reliability, and low cost of diode lasers lead to applications throughout modern technology-most importantly in modern optical telecommunication systems. This book presents a comprehensive introduction to the principles and operation of diode lasers. It begins with a review of semiconductor physics and laser fundamentals, before describing the most basic homojunction laser. Later chapters describe more advanced laser types and their applications, including the most recently developed and exotic laser designs. The author's intuitive style, coupled with an extensive set of worked examples and sample problems, make this an outstanding introduction to the subject.
Author: Allan H Johnston
Publisher: World Scientific
ISBN: 9814467650
Category : Technology & Engineering
Languages : en
Pages : 376
Get Book Here
Book Description
This book focuses on reliability and radiation effects in compound semiconductors, which have evolved rapidly during the last 15 years. It starts with first principles, and shows how advances in device design and manufacturing have suppressed many of the older reliability mechanisms.It is the first book that comprehensively covers reliability and radiation effects in optoelectronic as well as microelectronic devices. It contrasts reliability mechanisms of compound semiconductors with those of silicon-based devices, and shows that the reliability of many compound semiconductors has improved to the level where they can be used for ten years or more with low failure rates.
Author: Roland Diehl
Publisher: Springer Science & Business Media
ISBN: 3540478523
Category : Science
Languages : en
Pages : 420
Get Book Here
Book Description
Starting from the basics of semiconductor lasers with emphasis on the generation of high optical output power the reader is introduced in a tutorial way to all key technologies required to fabricate high-power diode-laser sources. Various applications are exemplified.
Author: Josef Sikula
Publisher: Springer Science & Business Media
ISBN: 1402021704
Category : Technology & Engineering
Languages : en
Pages : 371
Get Book Here
Book Description
A discussion of recently developed experimental methods for noise research in nanoscale electronic devices, conducted by specialists in transport and stochastic phenomena in nanoscale physics. The approach described is to create methods for experimental observations of noise sources, their localization and their frequency spectrum, voltage-current and thermal dependences. Our current knowledge of measurement methods for mesoscopic devices is summarized to identify directions for future research, related to downscaling effects. The directions for future research into fluctuation phenomena in quantum dot and quantum wire devices are specified. Nanoscale electronic devices will be the basic components for electronics of the 21st century. From this point of view the signal-to-noise ratio is a very important parameter for the device application. Since the noise is also a quality and reliability indicator, experimental methods will have a wide application in the future.
Author: Cunyun Ye
Publisher: World Scientific
ISBN: 9814481483
Category : Science
Languages : en
Pages : 273
Get Book Here
Book Description
This is the first book on tunable external cavity semiconductor diode lasers, providing an up-to-date survey on the physics, technology, and performance of widely applicable coherent radiation sources of tunable external cavity diode lasers. The purpose is to provide a thorough account of the state-of-the-art of tunable external cavity diode lasers which is achieved by combining this account with basic concepts of semiconductor diode lasers and its tunability with monolithic structures. The practical and accessible information in this volume will enable the reader to study external cavity diode laser, to build up the systems of external cavity diode laser as well as to develop advanced systems for their particular applications. This book will appeal to undergraduate and graduate students, scientists and engineers alike.
Author: Friedrich Bachmann
Publisher: Springer
ISBN: 0387347291
Category : Science
Languages : en
Pages : 553
Get Book Here
Book Description
This book summarizes a five year research project, as well as subsequent results regarding high power diode laser systems and their application in materials processing. The text explores the entire chain of technology, from the semiconductor technology, through cooling mounting and assembly, beam shaping and system technology, to applications in the processing of such materials as metals and polymers. Includes theoretical models, a range of important parameters and practical tips.
Author: Xingsheng Liu
Publisher: Springer
ISBN: 1461492637
Category : Technology & Engineering
Languages : en
Pages : 415
Get Book Here
Book Description
This book introduces high power semiconductor laser packaging design. The challenges of the design and various packaging and testing techniques are detailed by the authors. New technologies and current applications are described in detail.
Author:
Publisher:
ISBN:
Category : Aeronautics
Languages : en
Pages : 652
Get Book Here
Book Description
Lists citations with abstracts for aerospace related reports obtained from world wide sources and announces documents that have recently been entered into the NASA Scientific and Technical Information Database.
