Author: John Patrick Hayes
Publisher:
ISBN:
Category : Electric networks
Languages : en
Pages : 272
Book Description
A network model, is introduced for the study of fault diagnosis in digital logic networks. It is shown that every network can be transformed into an equivalent normal NAND network from which all the information pertaining to the diagnosis of the original network can be obtained. The use of this model greatly simplifies fault analysis and test generation. The structure of the classes of indistinguishable faults in normal NAND networks is studied. It is shown that for certain types of networks, the indistinguishability classes can be characterized in a very simple manner. The conditions under which masking can occur are examined. These conditions lead to efficient methods for generating multiple-fault detection test sets. Some general bounds for the number of tests required by a network are examined. It is proven that for a n-input fanout-free network, the cardinality of any minimal detection or location test set lies between 2(square root of n) and 2n. It is argued that a 2-level realization of a random n-variable function requires, on the average, 2 to the (n-1) power tests to detect all faults. It is shown that for certain classes of functions there exists multi-level realizations which require relatively few tests, and for which complete detection test sets can easily be generated. (Author).
A Study of Digital Network Structure and Its Relation to Fault Diagnosis
Author: John Patrick Hayes
Publisher:
ISBN:
Category : Electric networks
Languages : en
Pages : 272
Book Description
A network model, is introduced for the study of fault diagnosis in digital logic networks. It is shown that every network can be transformed into an equivalent normal NAND network from which all the information pertaining to the diagnosis of the original network can be obtained. The use of this model greatly simplifies fault analysis and test generation. The structure of the classes of indistinguishable faults in normal NAND networks is studied. It is shown that for certain types of networks, the indistinguishability classes can be characterized in a very simple manner. The conditions under which masking can occur are examined. These conditions lead to efficient methods for generating multiple-fault detection test sets. Some general bounds for the number of tests required by a network are examined. It is proven that for a n-input fanout-free network, the cardinality of any minimal detection or location test set lies between 2(square root of n) and 2n. It is argued that a 2-level realization of a random n-variable function requires, on the average, 2 to the (n-1) power tests to detect all faults. It is shown that for certain classes of functions there exists multi-level realizations which require relatively few tests, and for which complete detection test sets can easily be generated. (Author).
Publisher:
ISBN:
Category : Electric networks
Languages : en
Pages : 272
Book Description
A network model, is introduced for the study of fault diagnosis in digital logic networks. It is shown that every network can be transformed into an equivalent normal NAND network from which all the information pertaining to the diagnosis of the original network can be obtained. The use of this model greatly simplifies fault analysis and test generation. The structure of the classes of indistinguishable faults in normal NAND networks is studied. It is shown that for certain types of networks, the indistinguishability classes can be characterized in a very simple manner. The conditions under which masking can occur are examined. These conditions lead to efficient methods for generating multiple-fault detection test sets. Some general bounds for the number of tests required by a network are examined. It is proven that for a n-input fanout-free network, the cardinality of any minimal detection or location test set lies between 2(square root of n) and 2n. It is argued that a 2-level realization of a random n-variable function requires, on the average, 2 to the (n-1) power tests to detect all faults. It is shown that for certain classes of functions there exists multi-level realizations which require relatively few tests, and for which complete detection test sets can easily be generated. (Author).
Scientific and Technical Aerospace Reports
Author:
Publisher:
ISBN:
Category : Aeronautics
Languages : en
Pages : 892
Book Description
Publisher:
ISBN:
Category : Aeronautics
Languages : en
Pages : 892
Book Description
Proceedings
Author:
Publisher:
ISBN:
Category : Computer engineering
Languages : en
Pages : 1096
Book Description
Publisher:
ISBN:
Category : Computer engineering
Languages : en
Pages : 1096
Book Description
Digest of Papers
Author:
Publisher:
ISBN:
Category : Electronic digital computers
Languages : en
Pages : 192
Book Description
Publisher:
ISBN:
Category : Electronic digital computers
Languages : en
Pages : 192
Book Description
American Doctoral Dissertations
Author:
Publisher:
ISBN:
Category : Dissertation abstracts
Languages : en
Pages : 464
Book Description
Publisher:
ISBN:
Category : Dissertation abstracts
Languages : en
Pages : 464
Book Description
Internal Report
Author: University of Illinois (Urbana-Champaign campus). Department of Computer Science
Publisher:
ISBN:
Category : Computers
Languages : en
Pages : 174
Book Description
Publisher:
ISBN:
Category : Computers
Languages : en
Pages : 174
Book Description
Report
Author: Arthur Simons
Publisher:
ISBN:
Category : Algorithms
Languages : en
Pages : 582
Book Description
Publisher:
ISBN:
Category : Algorithms
Languages : en
Pages : 582
Book Description
Proceedings of the TEPEN International Workshop on Fault Diagnostic and Prognostic
Author: Tongtong Liu
Publisher: Springer Nature
ISBN: 303169483X
Category :
Languages : en
Pages : 608
Book Description
Publisher: Springer Nature
ISBN: 303169483X
Category :
Languages : en
Pages : 608
Book Description
Second International Conference on Combinatorial Mathematics
Author: Allan Gewirtz
Publisher:
ISBN:
Category : Mathematics
Languages : en
Pages : 622
Book Description
Publisher:
ISBN:
Category : Mathematics
Languages : en
Pages : 622
Book Description
FTCS-6
Author:
Publisher:
ISBN:
Category : Electronic digital computers
Languages : en
Pages : 232
Book Description
Publisher:
ISBN:
Category : Electronic digital computers
Languages : en
Pages : 232
Book Description