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Author: Chun-Hung Chen
Publisher:
ISBN:
Category : Integrated circuits
Languages : en
Pages : 188
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Book Description
Author: Chun-Hung Chen
Publisher:
ISBN:
Category : Integrated circuits
Languages : en
Pages : 188
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Book Description
Author:
Publisher:
ISBN:
Category : Dissertations, Academic
Languages : en
Pages : 1006
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Book Description
Author: Heinrich Theodor Vierhaus
Publisher:
ISBN:
Category :
Languages : de
Pages : 19
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Book Description
Author: N. K. Jha
Publisher: Cambridge University Press
ISBN: 9781139437431
Category : Computers
Languages : en
Pages : 1022
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Book Description
Device testing represents the single largest manufacturing expense in the semiconductor industry, costing over $40 billion a year. The most comprehensive and wide ranging book of its kind, Testing of Digital Systems covers everything you need to know about this vitally important subject. Starting right from the basics, the authors take the reader through automatic test pattern generation, design for testability and built-in self-test of digital circuits before moving on to more advanced topics such as IDDQ testing, functional testing, delay fault testing, memory testing, and fault diagnosis. The book includes detailed treatment of the latest techniques including test generation for various fault models, discussion of testing techniques at different levels of integrated circuit hierarchy and a chapter on system-on-a-chip test synthesis. Written for students and engineers, it is both an excellent senior/graduate level textbook and a valuable reference.
Author: Hans-Joachim Wunderlich
Publisher: IEEE Computer Society Press
ISBN: 9780769503905
Category : Computers
Languages : en
Pages : 194
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Book Description
Annotation This proceedings contains extended version of a selected subset of the contributions presented at the May 1999 IEEE workshop. The 27 papers share research and development (RandD) results in electronic testing. Topics include calculating efficient LFSR seeds for built-in self test, functional and structural testing of switched-current circuits, compaction of IDDQ test sequence using reassignment method, debug facilities in the TriMedia CPU64 architecture, deterministic BIST with partial scan, and using the BS register for capturing and storing n-bit sequences in real-time. Other papers address MEMs, switched capacitors, ATPG and fault modeling, fault simulation and fault coverage of analog circuits, FPGAs and regular arrays, and low power BIST. No subject index. Annotation copyrighted by Book News, Inc., Portland, OR.
Author: Taavi Viilukas
Publisher:
ISBN: 9789949233847
Category :
Languages : en
Pages : 150
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Book Description
Author: Matteo Sonza Reorda
Publisher: Springer Science & Business Media
ISBN: 1846281458
Category : Technology & Engineering
Languages : en
Pages : 187
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Book Description
New manufacturing technologies have made possible the integration of entire systems on a single chip. This new design paradigm, termed system-on-chip (SOC), together with its associated manufacturing problems, represents a real challenge for designers. SOC is also reshaping approaches to test and validation activities. These are beginning to migrate from the traditional register-transfer or gate levels of abstraction to the system level. Until now, test and validation have not been supported by system-level design tools so designers have lacked the infrastructure to exploit all the benefits stemming from the adoption of the system level of abstraction. Research efforts are already addressing this issue. This monograph provides a state-of-the-art overview of the current validation and test techniques by covering all aspects of the subject including: modeling of bugs and defects; stimulus generation for validation and test purposes (including timing errors; design for testability.
Author: Raghuram Srinivasa Tupuri
Publisher:
ISBN:
Category : Integrated circuits
Languages : en
Pages : 238
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Book Description
Author: Brian Thomas Murray
Publisher:
ISBN:
Category : Application-specific integrated circuits
Languages : en
Pages : 466
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Book Description
Author: Michel Renovell
Publisher: Institute of Electrical & Electronics Engineers(IEEE)
ISBN: 9780769514536
Category : Computers
Languages : en
Pages : 540
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Book Description
Annotation A collection of the 78 oral presentations and 24 poster papers from the January 2002 international workshop which brought together specialists from a broad area of electronic design, manufacturing, test, and advanced system applications in the hope that the conference would integrate design, test, and application as "cross- dependent" disciplines. The contributions are organized into sessions focusing on analog test, communications, digital signal processing and architectures, low to high level fault simulation and identification, high level design, memory, power issues in design and test, sensor and analog design, electrical engineering education, electromagnetics and control, fault-tolerant digital systems, image processing, robotics, submicron technology, test generation and compaction, and test techniques and methodologies. Annotation copyrighted by Book News Inc., Portland, OR.
