Author: Alvin Lun-Knep Jee
Publisher:
ISBN:
Category : Integrated circuits
Languages : en
Pages : 144

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Author:
Publisher: Institute of Electrical & Electronics Engineers(IEEE)
ISBN: 9780769511221
Category : Computers
Languages : en
Pages : 458

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Book Description
Collects 58 papers from the April/May 2001 symposium that explore new approaches in the testing of electronic circuits and systems. Key areas in testing are discussed, such as BIST, analog measurement, fault tolerance, diagnosis methods, scan chain design, memory test and diagnosis, and test data compression and compaction. Also on the program are sessions on emerging areas that are gaining prominence, including low power testing, testing high speed circuits on low cost testers, processor based self test techniques, and core- based system-on-chip testing. Some of the topics are robust and low cost BIST architectures for sequential fault testing in datapath multipliers, a method for measuring the cycle-to-cycle period jitter of high-frequency clock signals, fault equivalence identification using redundancy information and static and dynamic extraction, and test scheduling for minimal energy consumption under power constraints. No subject index. c. Book News Inc.

Author:
Publisher:
ISBN:
Category : Application-specific integrated circuits
Languages : en
Pages : 464

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Author:
Publisher:
ISBN:
Category : Application-specific integrated circuits
Languages : en
Pages : 528

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Book Description

Author: Gaynor E. Taylor
Publisher: IET
ISBN: 9780863412677
Category : Computers
Languages : en
Pages : 298

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Book Description
Samples the present state-of-the-art in CAD for VLSI, covering both newly developed algorithms and applications of techniques from the artificial intelligence community. The material is based on a tutorial course run in conjunction with the 1991 European Conference on Circuit Theory and Design, and should interest engineers involved in the design and testing of integrated circuits and systems. Annotation copyrighted by Book News, Inc., Portland, OR

Author:
Publisher: Institute of Electrical & Electronics Engineers(IEEE)
ISBN: 9780769501468
Category : Computers
Languages : en
Pages : 534

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Book Description
The theme of the April 1999 symposium Scaling deeper to submicron: test technology challenges reflects the issues being created by the move toward nanometer technologies. Many creative and novel ideas and approaches to the current and future electronic circuit testing-related problems are explored

Author: Satyendra Chandra Tripathi
Publisher: Frontiers Media SA
ISBN: 2889665232
Category : Science
Languages : en
Pages : 336

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Book Description

Author: Wayne M. Needham
Publisher: Springer Science & Business Media
ISBN: 9780442002213
Category : Computers
Languages : en
Pages : 336

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Book Description
While making up a larger percentage of the total number of designs produced each year, ASICs present special problems for system designers in the area of testing because each design is complex and unique. This book shows readers how to apply basic test techniques to ASIC design, details the impact of ASIC testability on total system cost and performance, and reviews the commercial test systems that are currently available. Annotation copyrighted by Book News, Inc., Portland, OR

Author: Mark Buchanan
Publisher: Cambridge University Press
ISBN: 0521882737
Category : Science
Languages : en
Pages : 282

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Book Description
Key introductory text for graduate students and researchers in physics, biology and biochemistry.

Author:
Publisher:
ISBN:
Category : Integrated circuits
Languages : en
Pages : 482

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Book Description