A Method for the Determination of the Optical Constants of Semitransparent Films PDF Download
Are you looking for read ebook online? Search for your book and save it on your Kindle device, PC, phones or tablets. Download A Method for the Determination of the Optical Constants of Semitransparent Films PDF full book. Access full book title A Method for the Determination of the Optical Constants of Semitransparent Films by Max Spencer Oldham. Download full books in PDF and EPUB format.
Author: Max Spencer Oldham
Publisher:
ISBN:
Category :
Languages : en
Pages : 158
Get Book Here
Book Description
This report describes a method for the determination of the optical constants of semitransparent films. A table expressing the optical constants in terms of reflectance, transmittance, and film thickness is presented. The report has been submitted to the Graduate Faculty of the Iowa State College of Agriculture and Mechanic Arts as a dissertation in partial fulfillment of the requirements for a degree of Doctor of Philosophy. Since the research work described was performed at the Naval Ordnance Laboratory, the dissertation is reproduced with minor changes as an official Laboratory report. (Author).
Author: Max Spencer Oldham
Publisher:
ISBN:
Category :
Languages : en
Pages : 158
Get Book Here
Book Description
This report describes a method for the determination of the optical constants of semitransparent films. A table expressing the optical constants in terms of reflectance, transmittance, and film thickness is presented. The report has been submitted to the Graduate Faculty of the Iowa State College of Agriculture and Mechanic Arts as a dissertation in partial fulfillment of the requirements for a degree of Doctor of Philosophy. Since the research work described was performed at the Naval Ordnance Laboratory, the dissertation is reproduced with minor changes as an official Laboratory report. (Author).
Author:
Publisher:
ISBN:
Category : Science
Languages : en
Pages : 466
Get Book Here
Book Description
Author:
Publisher:
ISBN:
Category : Imaging systems
Languages : en
Pages : 896
Get Book Here
Book Description
Author: Michael Quinten
Publisher: John Wiley & Sons
ISBN: 3527664351
Category : Science
Languages : en
Pages : 212
Get Book Here
Book Description
A one-stop, concise guide on determining and measuring thin film thickness by optical methods. This practical book covers the laws of electromagnetic radiation and interaction of light with matter, as well as the theory and practice of thickness measurement, and modern applications. In so doing, it shows the capabilities and opportunities of optical thickness determination and discusses the strengths and weaknesses of measurement devices along with their evaluation methods. Following an introduction to the topic, Chapter 2 presents the basics of the propagation of light and other electromagnetic radiation in space and matter. The main topic of this book, the determination of the thickness of a layer in a layer stack by measuring the spectral reflectance or transmittance, is treated in the following three chapters. The color of thin layers is discussed in chapter 6. Finally, in chapter 7, the author discusses several industrial applications of the layer thickness measurement, including high-reflection and anti-reflection coatings, photolithographic structuring of semiconductors, silicon on insulator, transparent conductive films, oxides and polymers, thin film photovoltaics, and heavily doped silicon. Aimed at industrial and academic researchers, engineers, developers and manufacturers involved in all areas of optical layer and thin optical film measurement and metrology, process control, real-time monitoring, and applications.
Author: Nicole Damany
Publisher: Elsevier
ISBN: 1483159108
Category : Science
Languages : en
Pages : 343
Get Book Here
Book Description
Some Aspects of Vacuum Ultraviolet Radiation Physics presents some data on the state of research in vacuum ultraviolet radiation in association with areas of physics. Organized into four parts, this book begins by elucidating the optical properties of solids in the vacuum ultraviolet region (v.u.v.), particularly the specific methods of determination of optical constants in v.u.v., the properties of metals, and those of ionic insulators. Part II deals with molecular spectroscopy, with emphasis on the spectra of diatomic and simple polyatomic molecules, paraffins, and condensed phases. Part III focuses on some aspects of emission spectroscopy in the v.u.v. in relation to laboratory plasmas. The last part describes the image formation by concave gratings, spectrophotometry, and diffusion by surfaces. This book will be very valuable to physicist and graduate students inclined to this field of interest.
Author: Leslie Ward
Publisher: CRC Press
ISBN:
Category : Art
Languages : en
Pages : 268
Get Book Here
Book Description
Very Good,No Highlights or Markup,all pages are intact.
Author: Optical Society of America
Publisher:
ISBN:
Category : Optical instruments
Languages : en
Pages :
Get Book Here
Book Description
Separately paged supplements accompany a few issues.
Author: Edward D. Palik
Publisher: Academic Press
ISBN: 0080556302
Category : Science
Languages : en
Pages : 1121
Get Book Here
Book Description
This handbook--a sequel to the widely used Handbook of Optical Constants of Solids--contains critical reviews and tabulated values of indexes of refraction (n) and extinction coefficients (k) for almost 50 materials that were not covered in the original handbook. For each material, the best known n and k values have been carefully tabulated, from the x-ray to millimeter-wave region of the spectrum by expert optical scientists. In addition, the handbook features thirteen introductory chapters that discuss the determination of n and k by various techniques.* Contributors have decided the best values for n and k* References in each critique allow the reader to go back to the original data to examine and understand where the values have come from* Allows the reader to determine if any data in a spectral region needs to be filled in* Gives a wide and detailed view of experimental techniques for measuring the optical constants n and k* Incorporates and describes crystal structure, space-group symmetry, unit-cell dimensions, number of optic and acoustic modes, frequencies of optic modes, the irreducible representation, band gap, plasma frequency, and static dielectric constant
Author:
Publisher:
ISBN:
Category : Electrical engineering
Languages : en
Pages : 1902
Get Book Here
Book Description
Author: Harland G. Tompkins
Publisher: Momentum Press
ISBN: 1606507281
Category : Technology & Engineering
Languages : en
Pages : 138
Get Book Here
Book Description
Ellipsometry is an experimental technique for determining the thickness and optical properties of thin films. It is ideally suited for films ranging in thickness from sub-nanometer to several microns. Spectroscopic measurements have greatly expanded the capabilities of this technique and introduced its use into all areas where thin films are found: semiconductor devices, flat panel and mobile displays, optical coating stacks, biological and medical coatings, protective layers, and more. While several scholarly books exist on the topic, this book provides a good introduction to the basic theory of the technique and its common applications. The target audience is not the ellipsometry scholar, but process engineers and students of materials science who are experts in their own fields and wish to use ellipsometry to measure thin film properties without becoming an expert in ellipsometry itself.
